Systems and methods of suppressing unwanted ions
View Patent ↗Certain embodiments described herein are directed to systems including a cell downstream of a mass analyzer. In some instances, the cell is configured as a reaction cell, a collision cell or a reaction/collision cell. The system can be used to suppress unwanted ions and/or remove interfering ions from a stream comprising a plurality of ions.
1. A mass spectrometry system comprising a single mass analyzer, the system comprising:
an ion source;
ion optics fluidically coupled to the ion source and downstream of the ion source;
a single mass analyzer fluidically coupled to the ion optics and downstream of the ion optics so the ion optics are between the ion source and the single mass analyzer, in which the single mass analyzer is the only mass analyzer present in the system;
a cell fluidically coupled to the single mass analyzer and downstream of the single mass analyzer so the single mass analyzer is between the cell and the ion optics; and
a detector fluidically coupled to the cell and downstream of the cell so the cell is between the single mass analyzer and the detector.
2. The system of claim 1 , in which the cell is configured as a reaction cell, a collision cell or a reaction/collision cell.
3. The system of claim 1 , in which the cell comprises a plurality of electrodes.
4. The system of claim 3 , in which the plurality of electrodes are configured together to provide a quadrupolar field in the cell.
5. The system of claim 1 , further comprising an additional cell upstream of the single mass analyzer, in which the additional cell is between the single mass analyzer and the ion optics.
6. The system of claim 1 , further comprising an interface between the ion source and the ion optics.
7. The system of claim 1 , in which the ion source is selected from the group consisting of an inductively coupled plasma, an arc, a spark, a glow discharge and a flame.
8. The system of claim 1 , in which the ion source is an ion source with a temperature less than a temperature of an inductively coupled plasma.
9. The system of claim 1 , in which the mass analyzer is selected from the group consisting of a scanning mass analyzer, a magnetic sector analyzer, a quadrupole mass analyzer, an ion trap analyzer, and a time-of-flight analyzer.
10. The system of claim 1 , in which the detector is selected from the group consisting of a Faraday cup, an electron multiplier, and a microchannel plate.
11. A method of suppressing interfering species in an ion beam within a mass spectrometer system comprising a mass analyzer, the method comprising providing the ion beam to a cell of the mass spectrometer that is downstream from the mass analyzer to remove the interfering species in the ion beam.
12. The method of claim 11 , in which the mass analyzer is configured to provide an ion of a single target mass to the cell.
13. The method of claim 11 , in which the mass analyzer comprises a quadrupole.
14. The method of claim 11 , in which the mass analyzer is the only mass analyzer in the system.
15. The method of claim 11 , positioning a second cell downstream of the cell.
16. The method of claim 11 , further comprising configuring the cell to remove substantially all polyatomic species in a first ion beam provided from the mass analyzer to the cell before providing a second ion beam from the cell to a downstream detector.
17. The method of claim 11 , further comprising configuring the cell as a reaction cell, a collision cell or a reaction/collision cell.
18. The method of claim 11 , further comprising configuring the system with an additional cell upstream of the mass analyzer.
19. The method of claim 18 , further comprising configuring the upstream, additional cell as a reaction cell, a collision cell or a reaction/collision cell.
20. The method of claim 11 , further comprising configuring the cell to provide a quadrupolar field effective to remove the interfering species in the ion beam.