IP Library Granted Patent US 9,437,763
Granted Patent B2
US 9,437,763 · App. 14/945,931 · Granted Sep 6, 2016

Trench process and structure for backside contact solar cells with polysilicon doped regions

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,437,763
App. No.
14/945,931
Granted
Sep 6, 2016
Kind
B2
Abstract

A solar cell includes polysilicon P-type and N-type doped regions on a backside of a substrate, such as a silicon wafer. A trench structure separates the P-type doped region from the N-type doped region. Each of the P-type and N-type doped regions may be formed over a thin dielectric layer. The trench structure may include a textured surface for increased solar radiation collection. Among other advantages, the resulting structure increases efficiency by providing isolation between adjacent P-type and N-type doped regions, thereby preventing recombination in a space charge region where the doped regions would have touched.

Claims (34)

1. A solar cell, comprising:

a solar cell substrate having a front side configured to face the sun during normal operation and a backside opposite the front side;

a P-type doped region and an N-type doped region of the solar cell over the solar cell substrate;

a first dielectric between the solar cell substrate and the P-type and N-type doped regions;

a trench separating the P-type doped region and the N-type doped region and at least partially dividing the first dielectric, wherein a surface of the trench is textured; and

a second dielectric formed over the surface of the trench.

2. The solar cell of claim 1 , further comprising a third dielectric formed in the trench over the second dielectric.

3. The solar cell of claim 2 , wherein the third dielectric comprises silicon nitride.

4. The solar cell of claim 1 , wherein the second dielectric comprises thermal oxide.

5. The solar cell of claim 1 , wherein the P-type and N-type doped regions comprise polysilicon.

6. The solar cell of claim 1 , wherein the solar cell substrate comprises silicon.

7. The solar cell of claim 6 , wherein the silicon is N-type.

8. The solar cell of claim 1 , wherein the first dielectric comprises silicon dioxide.

9. The solar cell of claim 1 , wherein the second dielectric comprises silicon dioxide.

10. The solar cell of claim 1 , further comprising interdigitated metal contact fingers electrically coupled to the P-type and N-type doped regions.

11. A semiconductor device, comprising:

a P-type doped region and an N-type doped region formed on a backside of a solar cell substrate, wherein the P-type and N-type doped regions are formed over a first dielectric;

a trench structure separating the P-type doped region and the N-type doped region and at least partially dividing the first dielectric, wherein a surface of the trench structure is textured; and

a second dielectric formed on the surface of the trench structure.

12. The semiconductor device of claim 11 , further comprising a third dielectric formed on the second dielectric in the trench structure.

13. The semiconductor device of claim 12 , further comprising metal contacts electrically coupled to the P-type and N-type doped regions through the third dielectric.

14. The semiconductor device of claim 11 , wherein the solar cell substrate comprises silicon.

15. The semiconductor device of claim 14 , wherein the silicon is N-type.

16. The semiconductor device of claim 11 , wherein the P-type doped region and the N-type doped region comprise polysilicon.

17. A method of fabricating a solar cell, the method comprising:

forming a first dielectric on a silicon substrate;

forming a P-type doped region and an N-type doped region over the first dielectric;

forming a trench separating the P-type doped region from the N-type doped region and at least partially separating the first dielectric;

texturing a surface of the trench; and

forming a second dielectric over the surface of the trench.

18. The method of claim 17 , further comprising:

forming a third dielectric over the second dielectric in the trench.

19. The method of claim 17 , wherein said forming the trench includes laser trenching to separate the P-type doped region from the N-type doped region.

20. The method of claim 17 , wherein the second dielectric comprises thermal oxide.

Assignments (4)
SECURITY INTEREST Recorded Jun 27, 2024
From: MAXEON SOLAR PTE. LTD.
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 067924/0062 →
SECOND LIEN SECURITY INTEREST AGREEMENT Recorded Jun 26, 2024
From: MAXEON SOLAR PTE. LTD
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 071343/0553 →
SECURITY INTEREST Recorded Jun 5, 2024
From: MAXEON SOLAR PTE. LTD.
To: DB TRUSTEES (HONG KONG) LIMITED
Reel/Frame 067637/0598 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 24, 2023
From: SUNPOWER CORPORATION
To: MAXEON SOLAR PTE. LTD.
Reel/Frame 062490/0742 →