IP Library Granted Patent US 9,431,393
Granted Patent B2
US 9,431,393 · App. 14/949,393 · Granted Aug 30, 2016

Semiconductor device

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Quick Facts
Patent No.
US 9,431,393
App. No.
14/949,393
Granted
Aug 30, 2016
Kind
B2
Abstract

A semiconductor device includes: a first well provided in a semiconductor substrate; a second well provided in the semiconductor substrate, so as to be isolated from the first well; a Schottky barrier diode formed in the first well; and a PN junction diode formed in the second well, with an impurity concentration of the PN junction thereof set higher than an impurity concentration of the Schottky junction of the Schottky barrier diode, and being connected antiparallel with the Schottky barrier diode.

Claims (16)

1. A semiconductor device comprising:

a first well provided in a semiconductor substrate;

a second well provided in the semiconductor substrate, so as to be isolated from the first well;

a Schottky barrier diode provided in the first well;

a transistor formed in the second well;

a first signal line connected to one terminal of the Schottky barrier diode, and through which a source voltage or a reference voltage is applied; and

a second signal line connected to the other terminal of the Schottky barrier diode and the second well, through which a voltage different from the source voltage and from the reference voltage is applied.

2. The semiconductor device of claim 1 , further comprising;

a third well provided in the semiconductor substrate, so as to be isolated from the first well and the second well; and

a PN junction diode formed in the third well, with an impurity concentration of the PN junction thereof set higher than an impurity concentration of the Schottky junction of the Schottky barrier diode, and being connected antiparallel with the Schottky barrier diode.

3. The semiconductor device of claim 1 ,

wherein the semiconductor substrate has in the surficial portion thereof an epitaxially-grown semiconductor layer, and

the second well is located deeper than the epitaxially-grown semiconductor layer.

4. The semiconductor device of claim 1 ,

wherein the semiconductor substrate has in the surficial portion thereof an epitaxially-grown semiconductor layer, and

the first well extends from the surface of the epitaxially-grown semiconductor layer.

Assignments (1)
CHANGE OF ADDRESS Recorded Jul 28, 2017
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 043364/0390 →