Method and magnetic resonance apparatus for determining basic shim settings of the magnetic resonance apparatus

1. A method for determining basic shim settings that shim a basic magnetic field of a magnetic resonance scanner, wherein the basic shim settings comprise a spatial distribution of a number of shim elements, comprising:

in a processor, establishing an optimization function that comprises a plurality of optimization parameters, including a first optimization parameter that designates a homogeneity value of a B0 distribution in the magnetic resonance scanner to be set by the basic shim settings and a second optimization parameter that designates a value of a force acting on the number of shim elements;

in said processor, calculating the spatial distribution of the number of shim elements by minimizing the optimization function dependent on the first optimization parameter and the second optimization parameter;

in said processor, determining the basic shim settings of the magnetic resonance scanner using the calculated spatial distribution of the number of shim elements, and making the basic shim settings available from the processor as an electronic signal; and

placing said number of shim elements at respective locations in said magnetic resonance scanner in the calculated spatial distribution that corresponds to the determined basic shim settings.

2. The method as claimed in claim 1 , wherein the second optimization parameter designates a value of an axial force acting on the number of shim elements, wherein the axial force acts in the direction of the basic magnetic field of the magnetic resonance scanner.

3. The method as claimed in claim 1 , wherein the second optimization parameter designates a minimization of a value of an overall axial force that acts on all shim elements of the magnetic resonance scanner, during the calculation of the spatial distribution of the number of shim elements.

4. The method as claimed in claim 1 comprising at least two of:

minimizing said optimization function dependent on a third optimization parameter that designates a minimization of an overall mass of all shim elements of said magnetic resonance scanner;

minimizing said optimization function dependent on a fourth optimization parameter that designates a value of at least one constant shim current that flows through gradient coils of the magnetic resonance scanner, and determining said basic shim settings using said at least one shim current;

minimizing said optimization function dependent on a fifth optimization parameter that designates a minimization of an overall effect of temperature influences on said plurality of shim elements; and

minimizing said optimization function dependent on a sixth optimization parameter that designates a value of a maximum force acting on the plurality of shim elements, wherein said shim elements are respectively disposed in shim pockets in said magnetic resonance scanner.

5. The method as claimed in claim 1 , comprising:

minimizing said optimization function dependent on a third optimization parameter that designates a minimization of an overall mass of all shim elements of said magnetic resonance scanner.

6. The method as claimed in claim 1 , comprising:

minimizing said optimization function dependent on a fourth optimization parameter that designates a value of at least one constant shim current that flows through gradient coils of the magnetic resonance scanner, and determining said basic shim settings using said at least one shim current.

7. The method as claimed in claim 1 , comprising:

minimizing said optimization function dependent on a fifth optimization parameter that designates a minimization of an overall effect of temperature influences on said plurality of shim elements.

8. The method as claimed in claim 1 , comprising:

minimizing said optimization function dependent on a sixth optimization parameter that designates a value of a maximum force acting on the plurality of shim elements, wherein said shim elements are respectively disposed in shim pockets in said magnetic resonance scanner.

9. A magnetic resonance apparatus comprising:

a magnetic resonance scanner comprising a plurality of shim elements that are distributable in a spatial distribution in said magnetic resonance scanner in order to shim a basic magnetic field generated in said magnetic resonance scanner;

a processor configured to establish an optimization function that comprises a plurality of optimization parameters, including a first optimization parameter that designates a homogeneity value of a B0 distribution in the magnetic resonance scanner to be set by basic shim settings and a second optimization parameter that designates a value of a force acting on the number of shim elements;

said processor being configured to calculate the spatial distribution of the number of shim elements by minimizing the optimization function dependent on the first optimization parameter and the second optimization parameter;

said processor being configured to determine shim settings for the shim elements of the magnetic resonance scanner using the calculated spatial distribution of the number of shim elements, and to make the basic shim settings available from the processor as an electronic signal; and

said plurality of shim elements being placed at respective locations in said magnetic resonance scanner in the calculated spatial distribution that corresponds to the determined basic shim settings.