Distance measuring device and solid-state image sensor

1. A distance measuring device which utilizes a time of flight (TOF) technique, the device comprising:

a light source configured to emit light in accordance with an emission timing signal;

a drive controller configured to generate, in accordance with a predetermined measurement condition, the emission timing signal and an exposure timing signal corresponding to the emission timing signal;

a solid-state image sensor having a group of pixels arranged in a matrix pattern, the group being divided into a plurality of regions on a line-by-line basis, the solid-state image sensor performing an exposure process on a selected one of the regions in response to the exposure timing signal, and outputting, as a signal, charges stored in the group of the pixels; and

an imaging signal processor configured to obtain distance information by performing an arithmetic operation on the signal output from the solid-state image sensor, wherein

the drive controller generates the emission timing signal and the exposure timing signal for each of the plurality of regions of the solid-state image sensor in accordance with respective different measurement conditions, and uses, as the different measurement conditions, conditions that each specify a different parameter in terms of at least one selected from the group consisting of the number of times of exposure, an emission pulse width of the irradiating light and a phase of the exposure timing signal with respect to the emission timing signal, and

a distance is respectively calculated using at least one of the different measurement conditions.

2. The device of claim 1 , wherein:

the group of the pixels of the solid-state image sensor is divided into a first region comprised of even-numbered lines and a second region comprised of odd-numbered lines,

the different measurement conditions includes a first condition and a second condition, and

the drive controller generates the emission timing signal and the exposure timing signal for the first region in accordance with the first condition, and also generates the emission timing signal and the exposure timing signal for the second region in accordance with the second condition which is different from the first condition.

3. The device of claim 2 , wherein

in the solid-state image sensor, the pixels on the even-numbered lines are shifted from the pixels on the odd-numbered lines by half a pixel in a line direction.

4. The device of claim 1 , wherein

the device performs distance measurements under a plurality of measurement conditions on a single region of the solid-state image sensor, wherein

the imaging signal processor corrects the distance information based on a result of the arithmetic operation performed under the plurality of the measurement conditions.

5. The device of claim 1 , wherein

the device carries out a background light exposure process to capture an image without emitting light from the light source in common to distance measurements under a plurality of measurement conditions.

6. A distance measuring device which utilizes a time of flight (TOF) technique, the device comprising:

a light source configured to emit light in accordance with an emission timing signal;

a drive controller configured to generate, in accordance with a predetermined measurement condition, the emission timing signal and an exposure timing signal corresponding to the emission timing signal;

a solid-state image sensor having a group of pixels arranged in a matrix pattern, the group being divided into a plurality of regions on a line-by-line basis, the solid-state image sensor performing an exposure process on a selected one of the regions in response to the exposure timing signal, and outputting, as a signal, charges stored in the group of the pixels; and

an imaging signal processor configured to obtain distance information by performing an arithmetic operation on the signal output from the solid-state image sensor, wherein

the drive controller generates the emission timing signal and the exposure timing signal for each of the plurality of regions of the solid-state image sensor in accordance with respective different measurement conditions, and

the imaging signal processor instructs the drive controller to adjust the measurement conditions based on a result of the arithmetic operation.

7. The device of claim 6 , wherein

the imaging signal processor instructs the drive controller to narrow an emission pulse width of the irradiating light if the distance information obtained based on the result of the arithmetic operation is shorter than a first predetermined distance and to broaden the emission pulse width of the irradiating light if the distance information obtained based on the result of the arithmetic operation is longer than a second predetermined distance.

8. The device of claim 6 , wherein

the imaging signal processor monitors the output of the solid-state image sensor for a presence or absence of saturation or an area of a saturated region, and, based on a result of this monitoring, instructs the drive controller to adjust the number of times of exposure.

9. A solid-state image sensor to be used for a distance measuring device which utilizes a TOF (time of flight) technique,

the distance measuring device including:

a light source configured to emit light in sync with an emission timing signal;

a drive controller configured to generate, in accordance with a predeteiniined measurement condition, the emission timing signal and an exposure timing signal corresponding to the emission timing signal; and

an imaging signal processor configured to perform an arithmetic operation on the signal output from the solid-state image sensor, and obtain distance information,

the drive controller generating the emission timing signal and the exposure timing signal for each of the plurality of regions of the solid-state image sensor in accordance with respective different measurement conditions, and using, as the different measurement conditions, conditions that each specify a different parameter in terms of at least one selected from the group consisting of the number of times of exposure, an emission pulse width of the irradiating light and a phase of the exposure timing signal with respect to the emission timing signal,

a distance being respectively calculated using at least one of the different measurement conditions, and

the solid-state image sensor comprising

a group of pixels arranged in a matrix pattern, the group being divided into a plurality of regions on a line-by-line basis, the solid-state image sensor performing an exposure process on a selected one of the regions in response to the exposure timing signal, and outputting, as a signal, charges stored in the group of the pixels.

10. The sensor of claim 9 , wherein

the group of the pixels is divided into a first region comprised of even-numbered lines and a second region comprised of odd-numbered lines.

11. The sensor of claim 10 , wherein

in the solid-state image sensor, the pixels on the even-numbered lines are shifted from the pixels on the odd-numbered lines by half a pixel in a line direction.

12. The sensor of claim 9 , wherein

the sensor performs distance measurements under a plurality of measurement conditions on a single region of the sensor.