IP Library Patent Application 14987420
Patent Application
App. No. 14/987,420

METHOD AND SYSTEM FOR TREATMENT OF DEPOSITION REACTOR

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Quick Facts
Patent No.
US None
App. No.
14/987,420
Abstract

A system and method for treating a deposition reactor are disclosed. The system and method remove or mitigate formation of residue in a gas-phase reactor used to deposit doped metal films, such as aluminum-doped titanium carbide films or aluminum-doped tantalum carbide films. The method includes a step of exposing a reaction chamber to a treatment reactant that mitigates formation of species that lead to residue formation.

Claims (11)

1 . A system for treating as reaction chamber, the system comprising:

a reactor comprising a reaction chamber;

a metal halide source fluidly coupled to the reactor;

a metal CVD source selected from the group consisting of one or more of organometallic compounds and aluminum CVD compounds fluidly coupled to the reactor;

a treatment reactant source coupled to the reactor; and

a vacuum pump coupled to the reactor.

2 . The system of claim 1 , further comprising a plasma source, wherein treatment reactant from the treatment reactant source is exposed to the plasma source to form one or more excited treatment reactant species.

3 . The system of claim 1 , further comprising a thermal excitation source, wherein treatment reactant from the treatment reactant source is exposed to the thermal excitation source to form one or more excited treatment reactant species.

4 . The system of claim 1 , wherein the treatment reactant source comprises one or more compounds selected from the group of compounds comprising one or more hydrogen atoms and compounds comprising a halogen.

5 . The system of claim 1 , wherein the treatment reactant source comprises one or more of ammonia, hydrogen, silane, methane, silicon hydrides, boron hydrides, halosilanes, haloboranes, alkenes, alkynes, and hydrazine and its derivatives.

6 . The system of claim 1 , wherein the treatment reactant source comprises a decomposition product of the CVD source.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2016
From: HAUKKA, SUVI; SHERO, ERIC JAMES; ALOKOZAI, FRED; LI, DONG; WINKLER, JERELD LEE; CHEN, XICHONG
To: ASM IP HOLDING B.V.
Reel/Frame 037403/0245 →