Method to test the quality factor of a MEMS gyroscope at chip probe
A method for a MEMS device comprises determining in a computer system, a first driving signal for the MEMS device in response to a first time delay and to a base driving signal, applying the first driving signal to the MEMS device to induce the MEMS device to operate at a first frequency, determining a second driving signal for the MEMS device in response to a second time delay and to the base driving signal, applying the second driving signal to the MEMS device to induce the MEMS device to operate at a second frequency, determining a first quality factor associated with the MEMS device in response to the first frequency and the second frequency, determining a quality factor associated with the MEMS device in response to the first quality factor, and determining whether the quality factor associated with the MEMS device, exceeds a threshold quality factor.
1. A method for a MEMS device comprises:
receiving in a variable digital delay portion of a drive loop block of the MEMS device, a first time delay;
determining with the drive loop block of the MEMS device, a first driving signal in response to the first time delay;
driving with the drive loop block of the MEMS device, drive resonators of the MEMS device in response to the first driving signal;
thereafter
sensing with a frequency measurement portion of the drive loop block of the MEMS device, a first frequency in response to the first driving signal;
receiving in the variable digital delay portion of the drive loop block of the MEMS device, a second time delay;
determining with the drive loop block of the MEMS device, a second driving signal in response to the second time delay;
driving with the drive loop block of the MEMS device, the drive resonators of the MEMS device in response to the second driving signal;
thereafter
sensing with the frequency measurement portion of the drive loop block of the MEMS device, a second frequency in response to the second driving signal;
wherein a quality factor associated with the MEMS device is determined in response to the first frequency and the second frequency.
2. The method of claim 1
wherein a first phase shift is associated with the first time delay; and
wherein a second phase shift is associated with the second time delay.
3. The method of claim 2
wherein the first phase shift is approximately equal to 90 degrees; and
wherein the first frequency comprises a resonant frequency associated with the MEMS device.
4. The method of claim 3 wherein the quality factor associated with the MEMS device is determined in response to the resonant frequency associated with the MEMS device, the second frequency, and the second phase shift.
5. The method of claim 2 wherein the first phase shift and the second phase shift are approximately 45 degrees apart.
6. The method of claim 2 further comprising:
receiving in the variable digital delay portion of the drive loop block of the MEMS device, a third time delay;
determining with the drive loop block of the MEMS device, a third driving signal in response to the third time delay;
driving with the drive loop block of the MEMS device, the drive resonators of the MEMS device in response to the third driving signal;
sensing with the frequency measurement portion of the drive loop block of the MEMS device, a third frequency in response to the third driving signal;
wherein another quality factor associated with the MEMS device is determined in response to the first frequency, the second frequency, and the third frequency.
7. The method of claim 6
wherein the first phase shift is approximately equal to 45 degrees; and
wherein the second phase shift is approximately equal to 135 degrees.
8. The method of claim 2 further comprising:
receiving in the variable digital delay portion of the drive loop block of the MEMS device, a third time delay, wherein the third time delay is associated with a third phase shift;
determining with the drive loop block of the MEMS device, a third driving signal in response to the third time delay;
driving with the drive loop block of the MEMS device, the drive resonators of the MEMS device in response to the third driving signal;
sensing with the frequency measurement portion of the drive loop block of the MEMS device, a third frequency in response to the third driving signal;
wherein another quality factor associated with the MEMS device is determined in response to the first frequency, the second frequency, the third frequency and the third phase shift.
9. The method of claim 1 further comprising:
marking the MEMS device when the quality factor associated with the MEMS device exceeds a threshold quality factor.
10. The method of claim 9 wherein the threshold quality factor is within a range of about 1 to about 10000.
11. A method for a MEMS device comprises:
receiving in a variable digital delay portion of a drive loop block of the MEMS device a plurality of time delays, wherein the plurality of time delays is associated with a plurality of respective phases;
determining with the drive loop block of the MEMS device, a plurality of respective driving signals in response to the plurality of time delays;
separately driving with the drive loop block of the MEMS device, drive resonators of the MEMS device in response to the plurality of respective driving signals;
separately sensing with a frequency measurement portion of the drive loop block of the MEMS device a plurality of respective frequencies in response to the plurality of driving signals, wherein each time delay from the plurality of time delays is associated with a frequency from the plurality of respective frequencies;
wherein a quality factor associated with the MEMS device is associated with the plurality of respective phases and the plurality of respective frequencies.
12. The method of claim 11 further comprising:
wherein a first phase from the plurality of respective phases is approximately equal to 90 degrees; and
wherein a first frequency from the plurality of respective frequencies is associated with the first phase; and
wherein the first frequency comprises a resonant frequency associated with the MEMS device.
13. The method of claim 12 further comprising:
wherein a second phase from the plurality of respective phases is approximately equal to 45 degrees; and
wherein a second frequency from the plurality of respective frequencies is associated with the second phase;
wherein a third phase from the plurality of respective phases is approximately equal to 135 degrees; and
wherein a third frequency from the plurality of respective frequencies is associated with the third phase.
14. The method of claim 11 further comprising receiving on the MEMS device, a visual mark when the quality factor associated with the MEMS device exceeds a threshold quality factor.
15. The method of claim 11 further comprising:
receiving on the MEMS device, a first visual mark, when the quality factor associated with the MEMS device is within a predetermined range of quality factors; and
wherein the first visual mark comprises a first bin indicator.
16. The method of claim 15 wherein the predetermined range of quality factors is from about 1 to about 10,000.
17. The method of claim 15 further comprising:
receiving on the MEMS device, a second visual mark when the quality factor associated with the MEMS is not within the predetermined range of quality factors; and
wherein the second visual mark comprises a second bin indicator.
18. The method of claim 11 wherein the receiving in the variable digital delay portion of the drive loop block of the MEMS device, the plurality of time delays, comprises receiving in the variable digital delay portion of the drive loop block of the MEMS device, a plurality of counts.
19. The method of claim 11 wherein the plurality of respective phases are approximately 2 degrees apart.
20. The method of claim 11 wherein the MEMS device is selected from a group consisting of: an accelerometer, a pressure sensor, and a gyroscope.