METHOD AND SYSTEM FOR PROVIDING DEPTH MAPPING USING PATTERNED LIGHT
A method and system for estimating edge data in patterned light analysis are provided herein. The method may include: obtaining an original depth map of an object generated based on structured light analysis of a pattern comprising stripes; determining portions of the original depth map in which z-axis value is inaccurate given an edge of the object; detecting geometric feature of the object associated with the determined portion, based on neighboring portions of the depth map; and estimating the missing z-axis data along the edge of the object, based on the detecting geometric feature of the object.
1 . A method comprising:
obtaining a depth map of an object generated based on structured light analysis of a pattern comprising stripes;
determining portions of the depth map in which z-axis value is inaccurate or in complete given an edge of the object;
detecting geometric feature of the object associated with the determined portion, based on edges of the depth map; and
estimating the z-axis data along the edge of the object, based on the detected geometric feature of the object.
2 . The method according to claim 1 , further comprising: selecting a template function based on the detected geometric feature; and applying constraints to the selected template based on local geometrical features of the corresponding depth map portion.
3 . The method according to claim 2 , further comprising detecting x-y plane edges of the corresponding portion based on intensity reflected from off-pattern areas.
4 . The method according to claim 3 , further comprising applying curve fitting function based on the selected template with it corresponding constraints and the detected edges.
5 . The method according to claim 4 , further comprising applying z-axis data to the fitted curve, based on extrapolation from the data map portion.
6 . The method according to claim 5 , further comprising completing the depth map based on the derived z-axis data of the edges.