IP Library Granted Patent US 9,583,724
Granted Patent B2
US 9,583,724 · App. 15/009,718 · Granted Feb 28, 2017

Systems and methods for scalable perovskite device fabrication

Inventors: Jinsong Huang (Lincoln, NE); Qingfeng Dong (Lincoln, NE); Yuchuan Sao (Lincoln, NE)
Assignee: NUtech Ventures
H01L51/424H01L51/0028H01L51/442H01L51/4213
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Quick Facts
Patent No.
US 9,583,724
App. No.
15/009,718
Granted
Feb 28, 2017
Kind
B2
Abstract

Continuous processes for fabricating a perovskite device are described that include using a doctor blade for continuously forming a perovskite layer and using a conductive tape lamination process to form an anode or a cathode layer on the perovskite device.

Claims (36)

1. A process for fabricating a perovskite device, comprising:

receiving a substrate;

applying a perovskite precursor solution onto the substrate;

linearly swiping the perovskite precursor solution using a doctor blade to form a perovskite device including a perovskite film on the substrate;

heating the perovskite device; and

rolling a conductive tape onto the perovskite device, wherein the conductive tape includes an adhesive material and a conductive material.

2. The process of claim 1 , further comprising:

simultaneously heating the substrate while applying and linearly swiping the perovskite precursor solution.

3. The process of claim 1 , wherein the substrate is moving and the doctor blade is stationary.

4. The process of claim 1 , wherein the substrate is moving at a rate of about 0.75 to about 75 cm/sec relative to the doctor blade.

5. The process of claim 1 , wherein the substrate is stationary and wherein the doctor blade moves relative to the substrate.

6. The process of claim 1 , wherein applying the perovskite precursor solution onto the substrate includes dispensing between about 10 μL and about 20 μL of perovskite precursor solution for every 2.25 mm 2 of substrate.

7. The process of claim 1 , wherein the precursor solution includes a lead halide and at least one of a methylammonium halide or a formamidinium halide dissolved in dimethylformamide (DMF) or Methyl sulfoxide (DMSO).

8. The process of claim 1 , wherein the substrate comprises indium tin oxide (ITO) or other transparent conductive electrode material.

9. The process of claim 1 , wherein heating the perovskite device includes heating the perovskite device to a temperature between about 50° C. and about 175° C.

10. The process of claim 1 , wherein the substrate comprises indium tin oxide (ITO) or other transparent conductive electrode material.

11. The process of claim 2 , wherein heating the substrate includes heating the substrate to a temperature in a range of between about 50° C. and about 180° C.

12. The process of claim 11 , wherein heating the substrate includes heating the substrate to about 125° C.

13. A process for continuously laminating a perovskite device, comprising:

forming a perovskite device by doctor blade coating a perovskite precursor solution onto a substrate;

heating the perovskite device; and

rolling a conductive tape onto the perovskite device, wherein the conductive tape includes an adhesive material and a conductive material.

14. The process of claim 13 , wherein heating the perovskite device includes heating the perovskite device to a temperature between about 50° C. and about 175° C.

15. The process of claim 13 , wherein the conductive material includes at least one of aluminum, copper, nickel, gold, or silver.

16. A process for fabricating perovskite device, comprising:

heating an indium tin oxide (ITO) substrate;

applying a perovskite precursor solution onto the ITO substrate;

linearly swiping the perovskite precursor solution using a doctor blade to form a perovskite film;

simultaneously thermoannealing and solvent annealing the perovskite film;

depositing a charge transport layer on the perovskite film;

thermoannealing the charge transport layer;

depositing a fullerene layer on the charge transport layer; and

applying a conductive layer to the fullerene layer.

17. The process of claim 16 , wherein the ITO substrate includes an ITO layer and a hole transport layer.

18. The process of claim 16 , wherein the precursor solution includes a lead halide (PbI 2 , PbBr 2 or PbCl 2 ) and at least one of methylammonium halide (CH 3 NH 3 I, CH 3 NH 3 Br, CH 3 NH 3 Cl) or formamidinium halide (CH(NH 2 ) 2 I, CH(NH 2 ) 2 Br, CH(NH 2 ) 2 Cl) dissolved in dimethylformamide (DMF) or Methyl sulfoxide (DMSO) or a mixture thereof in any ratio.

19. The process of claim 17 , wherein the hole transport layer includes at least one of PEDOT:PSS, TPD plus TPACA or PTAA, or other hole transport material or materials.

Assignments (4)
CONFIRMATORY LICENSE Recorded Mar 19, 2019
From: UNIVERSITY OF NEBRASKA LINCOLN
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 048633/0525 →
CONFIRMATORY LICENSE Recorded Jan 28, 2019
From: UNIVERSITY OF NEBRASKA LINCOLN
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 049670/0575 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2016
From: THE BOARD OF REGENTS OF THE UNIVERSITY OF NEBRASKA
To: NUTECH VENTURES
Reel/Frame 040703/0453 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 14, 2016
From: HUANG, JINSONG; DONG, QINGFENG; SAO, YUCHUAN
To: THE BOARD OF REGENTS OF THE UNIVERSITY OF NEBRASKA
Reel/Frame 038287/0623 →
Continuity (4)
Continuation In Part 14576878 · Dec 19, 2014
Provisional Application 62108873 · Jan 28, 2015
Provisional Application 61918330 · Dec 19, 2013
Related Publication 20160218307A1 · Jul 28, 2016