IP Library Granted Patent US 9,658,128
Granted Patent B2
US 9,658,128 · App. 15/010,536 · Granted May 23, 2017

Defect inspection method

Inventors: Akira Tanaka (Tokyo, JP); Masaya Hirashima (Tokyo, JP); Satoru Yasui (Tokyo, JP); Mayumi Naito (Kawasaki Kanagawa, JP)
Assignee: Kabushiki Kaisha Toshiba
G01M3/20G01N23/05
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Quick Facts
Patent No.
US 9,658,128
App. No.
15/010,536
Granted
May 23, 2017
Kind
B2
Abstract

A defect inspection method according to an embodiment has: exposing a target object to a tracer having higher absorptance for a neutron ray than the target object; radiating the neutron ray to the target object exposed to the tracer; generating at least one neutron image based on the neutron ray having penetrated the target object exposed to the tracer; and detecting a defect of the target object based on the generated at least one neutron image.

Claims (28)

1. A defect inspection method comprising:

exposing a target object to a tracer having higher absorptance for a neutron ray than the target object;

radiating the neutron ray to the target object exposed to the tracer;

generating at least one neutron image based on the neutron ray having penetrated the target object exposed to the tracer; and

detecting a defect of the target object based on the generated at least one neutron image.

2. The defect inspection method of claim 1 ,

wherein the detecting the defect comprises judging that the defect occurs at a position when detecting the position where the tracer permeates in the target object based on the generated at least one neutron image.

3. The defect inspection method of claim 1 ,

wherein, in the exposing, water is used as the tracer.

4. The defect inspection method of claim 1 ,

wherein, in the detecting, a crack in a soldered portion is detected as the defect.

5. The defect inspection method of claim 1 , further comprising

drying the tracer after exposing the target object thereto,

wherein the at least one neutron image comprises a plurality of neutron images;

wherein, in the radiating, the neutron ray is radiated to the target object during a period of drying the tracer;

wherein, in the generating, the plurality of neutron images are generated until the tracer is dried; and

wherein, in the detecting, the defect of the target object is detected based on the generated plurality of neutron images.

6. The defect inspection method of claim 5 ,

wherein the exposing comprising:

housing the target object in a hermetic space; and

evaporating the tracer to supply to the hermetic space, and

wherein the drying comprising:

supplying dry gas into the hermetic space; and

discharging the gas in the hermetic space.

7. The defect inspection method of claim 1 ,

wherein the exposing comprising:

housing the target object in a hermetic space; and

evaporating the tracer to supply to the hermetic space.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA CLIENT SOLUTIONS CO., LTD.
Reel/Frame 048720/0635 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 29, 2016
From: TANAKA, AKIRA; HIRASHIMA, MASAYA; YASUI, SATORU; NAITO, MAYUMI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 037624/0027 →
Priority Claims (1)
JP 2015-200437 · Oct 8, 2015 · national
Continuity (1)
Related Publication 20170102285A1 · Apr 13, 2017