Defect inspection method
A defect inspection method according to an embodiment has: exposing a target object to a tracer having higher absorptance for a neutron ray than the target object; radiating the neutron ray to the target object exposed to the tracer; generating at least one neutron image based on the neutron ray having penetrated the target object exposed to the tracer; and detecting a defect of the target object based on the generated at least one neutron image.
1. A defect inspection method comprising:
exposing a target object to a tracer having higher absorptance for a neutron ray than the target object;
radiating the neutron ray to the target object exposed to the tracer;
generating at least one neutron image based on the neutron ray having penetrated the target object exposed to the tracer; and
detecting a defect of the target object based on the generated at least one neutron image.
2. The defect inspection method of claim 1 ,
wherein the detecting the defect comprises judging that the defect occurs at a position when detecting the position where the tracer permeates in the target object based on the generated at least one neutron image.
3. The defect inspection method of claim 1 ,
wherein, in the exposing, water is used as the tracer.
4. The defect inspection method of claim 1 ,
wherein, in the detecting, a crack in a soldered portion is detected as the defect.
5. The defect inspection method of claim 1 , further comprising
drying the tracer after exposing the target object thereto,
wherein the at least one neutron image comprises a plurality of neutron images;
wherein, in the radiating, the neutron ray is radiated to the target object during a period of drying the tracer;
wherein, in the generating, the plurality of neutron images are generated until the tracer is dried; and
wherein, in the detecting, the defect of the target object is detected based on the generated plurality of neutron images.
6. The defect inspection method of claim 5 ,
wherein the exposing comprising:
housing the target object in a hermetic space; and
evaporating the tracer to supply to the hermetic space, and
wherein the drying comprising:
supplying dry gas into the hermetic space; and
discharging the gas in the hermetic space.
7. The defect inspection method of claim 1 ,
wherein the exposing comprising:
housing the target object in a hermetic space; and
evaporating the tracer to supply to the hermetic space.