Imprinting apparatus, recording medium, and imprinting method

1. An imprinting apparatus, comprising:

a measurement device that measures a plurality of topographies respectively corresponding to a plurality of wafers;

an input device to which the plurality of topographies and set information are input;

a density map modulator that creates a plurality of density maps corresponding to the plurality of topographies;

a drop recipe generation device that creates a plurality of resist drop recipes corresponding to the plurality of topographies on the basis of the plurality of density maps and the set information;

a storage device that stores the plurality of topographies and the plurality of resist drop recipes;

a selector that compares a first topography of a first wafer measured by the measurement device and the plurality of topographies, selects a second topography that is one of the plurality of topographies, and selects a resist drop recipe corresponding to the second topography as a first resist drop recipe;

a dropping device that drops a resist onto the first wafer on the basis of the first resist drop recipe; and

a controller that controls so as to drop the resist to the first wafer on the basis of the first resist drop recipe.

2. The imprinting apparatus according to claim 1 ,

wherein the controller sets the first resist drop recipe per imprinting shot and controls the resist drop position on the first wafer per imprinting shot.

3. The imprinting apparatus according to claim 1 ,

wherein the selector selects the first resist drop recipe per imprinting shot and the controller controls the resist drop position on the first wafer per imprinting shot.

4. The imprinting apparatus according to claim 1 ,

wherein when a peak to valley of a topography is set to a PV value, the selector calculates a difference shape that is a difference between the first topography of the first wafer measured by the measurement device and the plurality of topographies, and a difference PV value that is a difference between a PV value of the first topography and the plurality of topographies, and

selects the second topography where the difference PV value and the difference shape become a minimum from among the plurality of topographies, and selects a resist drop recipe corresponding to the second topography as a first resist drop recipe.

5. The imprinting apparatus according to claim 4 ,

wherein the selector weights the difference PV and the difference shape.

6. The imprinting apparatus according to claim 1 ,

wherein the measurement device measures a third topography of the first wafer after the resist is dropped,

the imprinting apparatus farther comprises a difference calculator that calculates a topography difference that is a difference between the first topography and the third topography, and

the density map modulator re-creates a first density map corresponding to the second topography on the basis of the topography difference.

7. The imprinting apparatus according to claim 1 ,

wherein the measurement device measures a third topography of the first wafer after the resist is dropped,

the imprinting apparatus further comprises a difference calculator that calculates a topography difference that is a difference between the first topography and the third topography, and

the density map modulator corrects a first density map corresponding to the second topography on the basis of the topography difference.

8. The imprinting apparatus according to claim 6 ,

wherein the drop recipe generation device re-creates the first resist drop recipe on the basis of the first density map corresponding to the re-created second topography.

9. The imprinting apparatus according to claim 7 ,

wherein the drop recipe generation device re-creates the first resist drop recipe on the basis of the first density map corresponding to the corrected second topography.