IP Library Granted Patent US 9,972,614
Granted Patent B2
US 9,972,614 · App. 15/013,306 · Granted May 15, 2018

Overheat detection circuit and power supply apparatus

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Quick Facts
Patent No.
US 9,972,614
App. No.
15/013,306
Granted
May 15, 2018
Kind
B2
Abstract

Provided is an overheat detection circuit having a small circuit scale, low cost, and low electric power consumption. The overheat detection circuit implemented in a CMOS semiconductor device includes: a reference voltage circuit connected between a base and an emitter of a parasitic bipolar transistor; and a current detection circuit connected to the emitter of the parasitic bipolar transistor, in which the current detection circuit is configured to detect a flow of a current through the parasitic bipolar transistor to output an overheat detection signal.

Claims (9)

1. An overheat detection circuit implemented in a CMOS semiconductor device, comprising:

a parasitic bipolar transistor;

a reference voltage circuit connected between a base and an emitter of the parasitic bipolar transistor; and

a current detection circuit formed of an impedance element and an output terminal and connected to the emitter of the parasitic bipolar transistor,

wherein the current detection circuit is configured to detect a flow of a collector current through the parasitic bipolar transistor to output an overheat detection signal.

2. An overheat detection circuit according to claim 1 , wherein the reference voltage circuit is configured to apply, between the base and the emitter of the parasitic bipolar transistor, a voltage at which the collector current does not flow through the parasitic bipolar transistor at a predetermined temperature or less.

3. An overheat detection circuit according to claim 1 , wherein the current detection circuit comprises a resistor as the impedance element.

4. An overheat detection circuit according to claim 1 , wherein the current detection circuit comprises a MOS transistor in which a bias voltage is applied to a gate as the impedance element.

5. A power supply apparatus, comprising the overheat detection circuit of claim 1 as an overheat protection circuit.

Assignments (2)
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2016
From: HARADA, NORIYUKI; SAKAGUCHI, KAORU
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037647/0281 →