IP Library Granted Patent US 9,535,004
Granted Patent B2
US 9,535,004 · App. 15/031,825 · Granted Jan 3, 2017

Surface plasmon resonance fluorescence analysis method and surface plasmon resonance fluorescence analysis device

Inventors: Tetsuya Noda (Tokyo, JP); Masataka Matsuo (Tokyo, JP); Yoshimasa Hamano (Tokyo, JP); Hiroshi Hirayama (Tokyo, JP)
Assignee: Konica Minolta, Inc.
G01N21/553G01N21/13G01N21/648G01N2021/135
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,535,004
App. No.
15/031,825
Granted
Jan 3, 2017
Kind
B2
Abstract

In the present invention, excitation light is irradiated onto an analysis chip that has been placed in a chip holder, reflected light or transmitted light from the analysis chip is detected, and as a result the position information of the analysis chip is obtained. On the basis of this position information, the chip holder is moved by a conveyance stage and thereby moved to a measurement position. Excitation light is irradiated onto the analysis chip that is disposed at the measurement position, and fluorescence emitted from a fluorescent substance that marks the substance to be detected is detected.

Claims (18)

1. A surface plasmon resonance fluorescence analysis method in which fluorescence which is emitted from a fluorescence material labelling a substance to be detected when the fluorescence material is excited by localized light based on surface plasmon resonance is detected to detect presence or an amount of the substance to be detected, the surface plasmon resonance fluorescence analysis method comprising:

installing an analysis chip to a chip holder fixed to a conveyance stage, the analysis chip including a prism having an incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a capturing body fixed on the metal film;

obtaining location information of the analysis chip by irradiating the analysis chip installed to the chip holder with excitation light, and by detecting reflection light or transmission light of the excitation light;

moving the analysis chip to a measurement position by moving the chip holder by the conveyance stage based on the location information; and

irradiating the analysis chip disposed at the measurement position with the excitation light and detecting the fluorescence emitted from the fluorescence material labelling the substance to be detected captured by the capturing body.

2. The surface plasmon resonance fluorescence analysis method according to claim 1 , wherein, in the obtaining of the location information of the analysis chip, two surfaces of the analysis chip adjacent to each other are irradiated with the excitation light.

3. The surface plasmon resonance fluorescence analysis method according to claim 2 , wherein, in the obtaining of the location information of the analysis chip, the incidence surface and a surface adjacent to the incidence surface of the analysis chip are irradiated with the excitation light.

4. The surface plasmon resonance fluorescence analysis method according to claim 2 , wherein, in the obtaining of the location information of the analysis chip, a position of the analysis chip is specified with use of an intermediate value of a light amount of the reflection light or the transmission light of the excitation light.

5. The surface plasmon resonance fluorescence analysis method according to claim 1 , wherein, in the obtaining of the location information of the analysis chip, the excitation light is emitted in a direction which is not parallel to or perpendicular to a direction in which the chip holder is moved by the conveyance stage.

6. The surface plasmon resonance fluorescence analysis method according to claim 1 , wherein, in the obtaining of the location information of the analysis chip, reflection light from the incidence surface is detected.

7. The surface plasmon resonance fluorescence analysis method according to claim 1 , wherein, in the obtaining of the location information of the analysis chip and in the moving of the analysis chip to the measurement position, the chip holder is moved by the conveyance stage only in a direction toward a light source of the excitation light.

8. A surface plasmon resonance fluorescence analysis device in which fluorescence which is emitted from a fluorescence material labelling a substance to be detected when the fluorescence material is excited by localized light based on surface plasmon resonance is detected to detect presence or an amount of the substance to be detected, the surface plasmon resonance fluorescence analysis device comprising:

a chip holder configured to detachably hold an analysis chip, the analysis chip including a prism including an incidence surface and a film formation surface, a metal film disposed on the film formation surface, and a capturing body fixed on the metal film;

a conveyance stage configured to move the chip holder;

a light source configured to irradiate the analysis chip held by the chip holder with excitation light;

an excitation light detection sensor configured to detect the excitation light reflected by the analysis chip or the excitation light transmitted through the analysis chip;

a position adjuster configured to, based on a detection result of the excitation light detection sensor, specify a position of the analysis chip held by the chip holder, and move the chip holder by the conveyance stage to move the analysis chip to a measurement position; and

a fluorescence detection sensor configured to detect the fluorescence emitted from the fluorescence material labelling the substance to be detected captured by the capturing body.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 21, 2022
From: KONICA MINOLTA, INC.
To: OTSUKA PHARMACEUTICAL CO., LTD.
Reel/Frame 059747/0589 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2016
From: NODA, TETSUYA; MATSUO, MASATAKA; HAMANO, YOSHIMASA; HIRAYAMA, HIROSHI
To: KONICA MINOLTA, INC.
Reel/Frame 038366/0855 →
Priority Claims (1)
JP 2013-226667 · Oct 31, 2013 · national
Continuity (1)
Related Publication 20160245746A1 · Aug 25, 2016