Imaging using metamaterials
A system for imaging an object is provided. The system includes a light source configured to emit light having a predetermined wavelength towards the object. The system further includes a metalens including a metallic film having a plurality of slits defined therethrough, the plurality of slits having a width a and a periodicity d that are both less than the predetermined wavelength, wherein the object is positioned between the light source and the metalens. The system further includes a detector configured to acquire measurements indicative of light transmitted through the metalens, and a computing device communicatively coupled to the detector and configured to reconstruct an image of the object based on the acquired measurements.
1. A system for imaging an object, said system comprising:
a light source configured to emit light having a predetermined wavelength towards the object;
a metalens comprising a metallic film having a plurality of slits defined therethrough, the plurality of slits having a width a and a periodicity d that are both less than the predetermined wavelength, wherein the object is positioned between said light source and said metalens;
a detector configured to acquire measurements indicative of light transmitted through said metalens; and
a computing device communicatively coupled to said detector and configured to reconstruct an image of the object based on the acquired measurements.
2. A system in accordance with claim 1 , wherein said metalens further comprises a plurality of dielectric elements positioned within said plurality of slits.
3. A system in accordance with claim 2 , wherein said plurality of dielectric elements are substantially optically transparent.
4. A system in accordance with claim 1 , wherein said plurality of slits are unfilled.
5. A system in accordance with claim 1 , wherein said computing device is configured to reconstruct an image having a resolution at least a factor of two smaller than the predetermined wavelength.
6. A system in accordance with claim 1 , wherein said detector is positioned proximate a detection slit of said plurality of slits.
7. A system in accordance with claim 1 , further comprising a waveguide positioned between said metalens and said detector.
8. A system in accordance with claim 1 , wherein the object is positioned such that at least a portion of the object lies within evanescent bulges formed at ends of the plurality of slits.
9. A system in accordance with claim 1 , wherein the detector is a photodetector.
10. A system in accordance with claim 1 , wherein the detector further comprises one or more optical fibers to collect light passing through the metalens.
11. A system in accordance with claim 1 , wherein said detector comprises a plurality of detectors.