IP Library Granted Patent US 9,818,797
Granted Patent B2
US 9,818,797 · App. 15/068,107 · Granted Nov 14, 2017

Magnetic memory device and method of manufacturing the same

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Quick Facts
Patent No.
US 9,818,797
App. No.
15/068,107
Granted
Nov 14, 2017
Kind
B2
Abstract

According to one embodiment, a magnetic memory device includes a semiconductor substrate, an insulating region provided on the semiconductor substrate, an electrode plug provided in the insulating region, an amorphous conductive portion provided on the electrode plug and including a part provided in the insulating region, and a stacked structure provided on the amorphous conductive portion and including a magnetic layer.

Claims (38)

1. A magnetic memory device comprising:

a semiconductor substrate;

an insulating region provided on the semiconductor substrate;

an electrode plug provided in the insulating region;

an amorphous conductive portion provided on the electrode plug and including a part provided in the insulating region; and

a stacked structure provided on the amorphous conductive portion and including a magnetic layer,

wherein the amorphous conductive portion is formed of an amorphous alloy of a plurality of transition metal elements.

2. The device of claim 1 , wherein at least a lower part of a side surface of the amorphous conductive portion aligns with a side surface of the electrode plug.

3. The device of claim 1 , wherein a bottom surface of the amorphous conductive portion corresponds to an upper surface of the electrode plug.

4. The device of claim 1 , wherein the stacked structure includes a first magnetic layer having a variable magnetization direction, a second magnetic layer having a fixed magnetization direction, and a nonmagnetic layer provided between the first magnetic layer and the second magnetic layer.

5. The device of claim 1 , wherein a pattern of the stacked structure is positioned inside a pattern of the amorphous conductive portion when viewed from a direction parallel to a stacked direction of the stacked structure.

6. The device of claim 1 , wherein the electrode plug is electrically connected to one of a source region or a drain region of a transistor provided in a surface region of the semiconductor substrate.

7. The device of claim 1 , wherein the stacked structure is covered with an insulating film different from an insulating film in which the electrode plug is provided.

8. A magnetic memory device comprising:

a semiconductor substrate;

an insulating region provided on the semiconductor substrate;

an electrode plug provided in the insulating region;

an amorphous conductive portion provided on the electrode plug and including a part provided in the insulating region; and

a stacked structure provided on the amorphous conductive portion and including a magnetic layer,

wherein the amorphous conductive portion is formed of a magnetic material.

9. The device of claim 8 , wherein at least a lower part of a side surface of the amorphous conductive portion aligns with a side surface of the electrode plug.

10. The device of claim 8 , wherein a bottom surface of the amorphous conductive portion corresponds to an upper surface of the electrode plug.

11. The device of claim 8 , wherein the stacked structure includes a first magnetic layer having a variable magnetization direction, a second magnetic layer having a fixed magnetization direction, and a nonmagnetic layer provided between the first magnetic layer and the second magnetic layer.

12. The device of claim 11 , wherein the amorphous conductive portion applies a magnetic field to the first magnetic layer, a direction of the magnetic field being opposite to a direction of a magnetic field applied from the second magnetic layer to the first magnetic layer.

13. The device of claim 8 , wherein a pattern of the stacked structure is positioned inside a pattern of the amorphous conductive portion when viewed from a direction parallel to a stacked direction of the stacked structure.

14. The device of claim 8 , wherein the electrode plug is electrically connected to one of a source region or a drain region of a transistor provided in a surface region of the semiconductor substrate.

15. A magnetic memory device comprising:

a semiconductor substrate;

an insulating region provided on the semiconductor substrate;

an electrode plug provided in the insulating region;

an amorphous conductive portion provided on the electrode plug and including a part provided in the insulating region; and

a stacked structure provided on the amorphous conductive portion and including a magnetic layer,

wherein the amorphous conductive portion includes plural kinds of amorphous conductive layers.

16. The device of claim 15 , wherein at least a lower part of a side surface of the amorphous conductive portion aligns with a side surface of the electrode plug.

17. The device of claim 15 , wherein a bottom surface of the amorphous conductive portion corresponds to an upper surface of the electrode plug.

18. The device of claim 15 , wherein the stacked structure includes a first magnetic layer having a variable magnetization direction, a second magnetic layer having a fixed magnetization direction, and a nonmagnetic layer provided between the first magnetic layer and the second magnetic layer.

19. The device of claim 15 , wherein a pattern of the stacked structure is positioned inside a pattern of the amorphous conductive portion when viewed from a direction parallel to a stacked direction of the stacked structure.

20. The device of claim 15 , wherein the electrode plug is electrically connected to one of a source region or a drain region of a transistor provided in a surface region of the semiconductor substrate.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043194/0563 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 20, 2016
From: KUMURA, YOSHINORI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 038662/0339 →