Apparatus for touch sensor test

1. An apparatus for testing a touch sensor including a first electrode and a second electrode, the apparatus comprising:

a test power supplier having an adjustable resistance coupled to the first electrode of the touch sensor, wherein the test power supplier is configured to supply a first reference voltage (Vref1) into the adjustable resistance; and

a comparison unit configured to compare a test voltage (Vtest) with a second reference voltage and output a comparison result,

the apparatus configured to detect a voltage at the second electrode (Vref3) and a resistance between the first electrode and the second electrode (R_short)

wherein the adjustable resistance has a resistance value (R_ref) that is based upon to an allowable threshold about resistance between the first and second electrodes of the touch sensor according to the equation Vtest=(Vref1−Vref3)×R_short/(R_ref+R_short).

2. The apparatus according to claim 1 ,

wherein the comparison unit is configured to determine that the touch sensor is a defective sensor when the test voltage is lower than the second reference voltage.

3. The apparatus according to claim 2 wherein the resistance value of the adjustable resistance is substantially equal to the allowable threshold, and the second reference voltage is one half of the first reference voltage.

4. The apparatus according to claim 2 , wherein the test power supplier further comprises a buffer for buffering the first reference voltage, and wherein an output of the buffer is coupled to the adjustable resistance.

5. The apparatus according to claim 2 , wherein the test power supplier further comprises a power source for providing an amount of current corresponding to the allowable threshold.

6. The apparatus according to claim 2 , wherein the comparison unit configured to determine that the touch sensor is a faultless sensor when the test voltage is higher than the second reference voltage.

7. The apparatus according to claim 2 wherein the resistance value of adjustable resistance is n times as large as the allowable threshold, the second reference voltage is 1/(n+1) times as large as the first reference voltage, where n is an integer.

8. The apparatus according to claim 2 , wherein the resistance value of adjustable resistance is 1/n times as large as the allowable threshold, the second reference voltage is n/(n+1) times as large as the first reference voltage, where n is an integer.

9. The apparatus according to claim 1 , further comprising:

a switching device configured to selectively couple the touch sensor to the test power supplier and the comparison unit.