Buried electrical debug access port
Embodiments are generally directed to a buried electrical debug access port. An embodiment of an apparatus includes a substrate or printed circuit board; one or more electronic components coupled with the substrate or printed circuit board; one or more electrical access ports coupled with the substrate or printed circuit board, each electrical access port including electrically conductive material; and an encapsulant material, the encapsulant material encapsulating the one or more access ports, wherein the one or more access ports are electrically connected to one or more circuits of the apparatus to provide debugging access to the apparatus.
1. An apparatus comprising:
a substrate or printed circuit board;
one or more electronic components coupled with the substrate or printed circuit board;
an electrical access port coupled with the substrate or printed circuit board, the electrical access port including electrically conductive material; and
an encapsulant material, wherein the encapsulant material encapsulates the one or electrical access port, the encapsulant material having a top surface, a bottom surface, and side surfaces between the top surface and the bottom surface, wherein the bottom surface is on the substrate or printed circuit board, and wherein the encapsulant material has an opening in one of the side surfaces, the opening extending through the encapsulant material and exposing at least one of the electrical access port, wherein the electrical access port has a surface proximate the one of the side surfaces of the encapsulant material, and the opening exposes a portion of but not all of the surface of the electrical access port;
wherein the electrical access port is electrically connected to one or more circuits of the apparatus.
2. The apparatus of claim 1 , wherein each of the electrical access port is insulated from electrical contact by the encapsulant material.
3. The apparatus of claim 1 , wherein the apparatus is a system in package (SiP).
4. The apparatus of claim 1 , wherein the electrical access port is adjacent to an edge of the encapsulant material.
5. The apparatus of claim 1 , wherein the electrical access port is a closest element of the apparatus to an edge of the encapsulant material.
6. The apparatus of claim 1 , wherein the electrical access port is a closest element of the apparatus to a top surface of the encapsulant material.
7. The apparatus of claim 1 , wherein the electrical access port is accessible by breaking through the encapsulate material.
8. The apparatus of claim 7 , wherein breaking through the encapsulate material includes drilling through or piercing through the encapsulate material.
9. The apparatus of claim 1 , wherein the electrical access port is accessible by electromagnetic coupling with at least one access port.
10. The system of claim 1 , wherein the electrical access port is a closest element of the apparatus to an edge of the encapsulant material.
11. A system comprising:
a processor;
an electronic package; and a motherboard, the electronic package being installed in the motherboard;
wherein the electronic package includes: a substrate or printed circuit board, a plurality of electronic components including a solid state drive (SSD) coupled with the substrate or printed circuit board, an electrical access port coupled with the substrate or printed circuit board, the electrical access port including electrically conductive material, and an encapsulant material, wherein the encapsulant material encapsulates the electrical access port, the encapsulant material having a top surface, a bottom surface, and side surfaces between the top surface and the bottom surface, wherein the bottom surface is on the substrate or printed circuit board, and wherein the encapsulant material has an opening in one of the side surfaces, the opening extending through the encapsulant material and exposing at least one of the electrical access port, wherein the electrical access port has a surface proximate the one of the side surfaces of the encapsulant material, and the opening exposes a portion of but not all of the surface of the electrical access port;
wherein the electrical access port is electrically connected to one or more circuits of the electronic package to provide debugging access to the electronic package.
12. The system of claim 11 , wherein each of the electrical access port is insulated from electrical contact by the encapsulant material.
13. The system of claim 11 , wherein the electrical access port is adjacent to an edge of the encapsulant material.
14. The system of claim 11 , wherein the electrical access port is a closest element of the electronic package to an edge of the encapsulant material, to a top surface of the encapsulant material, or both.
15. The system of claim 11 , wherein the electrical access port is accessible by breaking through the encapsulate material.
16. The system of claim 11 , wherein access to the electrical access port provides debug access to the electronic package without removing the electronic package from the motherboard.
17. The system of claim 11 , wherein the electrical access port is accessible by electromagnetic coupling with at least one access port.