Systems and methods for using interleaving window widths in tandem mass spectrometry
Systems and methods are provided for analyzing a sample using overlapping measured mass selection window widths. A mass range of a sample is divided into two or more target mass selection window widths using a processor. The two or more target widths can have the same width or variable widths. A tandem mass spectrometer is instructed to perform two or more fragmentation scans across the mass range using the processor. Each fragmentation scan of the two or more fragmentation scans includes a measured mass selection window width. The two or more measured widths of the two or more fragmentation scans can have the same width or variable widths. At least two of the two or more measured mass selection window widths overlap. The overlap in measured mass selection window widths corresponds to at least one target mass selection window width.
1. A system for analyzing a sample using overlapping measured mass selection window widths, comprising:
a tandem mass spectrometer that includes a mass analyzer that allows overlapping measured mass selection window widths; and
a controller in communication with the tandem mass spectrometer that is
configured to divide a mass range of a sample into two or more target mass selection window widths, and
configured to instruct the tandem mass spectrometer to perform two or more fragmentation scans across the mass range, wherein each region of the mass range is fragmented at least twice using at least two overlapping measured mass selection window widths.
2. The system of claim 1 , wherein the two or more target mass selection window widths have the same width.
3. The system of claim 1 , wherein the two or more target mass selection window widths have variable widths.
4. The system of claim 1 , wherein two or more measured mass selection window widths of the at least two overlapping measured mass selection window widths of the two or more fragmentation scans have the same width.
5. The system of claim 1 , wherein two or more measured mass selection window widths of the at least two overlapping mass selection window widths of the two or more fragmentation scans have variable widths.
6. The system of claim 1 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include the same number of measured mass selection window widths.
7. The system of claim 1 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include a variable number of measured mass selection window widths.
8. The system of claim 1 , wherein the processor further comprising
extracting information about the at least one target mass selection window width by combining information from the measured mass selection window widths of at least two fragmentation scans.
9. A system for analyzing a sample using overlapping measured mass selection window widths, comprising:
a tandem mass spectrometer that includes a mass analyzer that allows overlapping measured mass selection window widths; and
a processor in communication with the tandem mass spectrometer, the processor being coupled to a storage medium encoded to perform steps comprising:
dividing a mass range of a sample into two or more target mass selection window widths, and
instructing the tandem mass spectrometer to perform two or more fragmentation scans across the mass range, wherein each region of the mass range is fragmented at least twice using at least two overlapping measured mass selection window widths.
10. The system of claim 9 , wherein the two or more target mass selection window widths have the same width.
11. The system of claim 9 , wherein the two or more target mass selection window widths have variable widths.
12. The system of claim 9 , wherein measured mass selection window widths of the at least two overlapping measured mass selection window widths of the two or more fragmentation scans have the same width.
13. The system of claim 9 , wherein measured mass selection window widths of the at least two overlapping measured mass selection window widths of the two or more fragmentation scans have variable widths.
14. The system of claim 9 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include the same number of measured mass selection window widths.
15. The system of claim 9 , wherein each target mass selection window width of the two or more target mass selection window widths corresponds to overlapped measured mass selection window widths that include a variable number of measured mass selection window widths.
16. The system of claim 9 , wherein the processor further comprising
extracting information about the at least one target mass selection window width by combining information from the measured mass selection window widths of the at least two fragmentation scans.
17. The method of claim 11 , wherein the two or more target mass selection window widths have the same width.
18. The method of claim 11 , wherein the two or more target mass selection window widths have variable widths.
19. The method of claim 11 , wherein two or more measured mass selection window widths of the at least two overlapping measured mass selection window widths of the two or more fragmentation scans have the same width.
20. A method for analyzing a sample using overlapping measured mass selection window widths, comprising:
dividing a mass range of a sample into two or more target mass selection window widths using a processor, and
instructing a tandem mass spectrometer to perform two or more fragmentation scans across the mass range using the processor, wherein each region of the mass range is fragmented at least twice using at least two overlapping measured mass selection window widths.