Devices and methods for improving yield of scalable periphery amplifiers
Device and methods for improving consistency of operation and therefore yield of scalable periphery amplifiers is described. Amplifier size of the scalable periphery architecture can be adjusted to obtain part-to-part consistency of operating performance as per a defined/desired set of criteria. Amplifier segments of the scalable periphery architecture can be rotated to distribute wear. Further, extra amplifier segments can be implemented on amplifier dies to extend the overall lifetime of amplifiers.
1. An amplifier assembly comprising:
a plurality of amplifier segments;
a memory storage location storing therein, for each operating parameter value of the amplifier assembly of a plurality of operating parameter values of the amplifier assembly, a number of amplifier segments to be turned on in correspondence of the each operating parameter value; and
a controller configured to read from the memory storage location a number of amplifier segments to be turned on responsive to an operating parameter value of the amplifier assembly of the plurality of operating parameter values and accordingly enable and/or disable one or more amplifier segments of the plurality of amplifier segments to obtain said number of turned on amplifier segments,
wherein the operating parameter value is associated to a given operating performance of the amplifier assembly.
2. The assembly of claim 1 , wherein the controller is further configured to enable and/or disable the one or more amplifier segments of the plurality of amplifier segments according to an operating parameter value associated to a set task, the set task determining a number of amplifier segments required to be enabled in a given time period.
3. The assembly of claim 1 or claim 2 , wherein the controller is further configured to enable and/or disable the one or more amplifier segments of the plurality of amplifier segments based on a set sequence at set time intervals.
4. The assembly of claim 3 , wherein the number of enabled amplifier segments and the number of disabled amplifier segments is constant through different time intervals.
5. The assembly of claim 3 , wherein the set sequence is a timewise rotation sequence rotating through the amplifier segments.
6. The assembly of claim 1 , wherein the controller is located on a same die as the amplifier segments.
7. The assembly of claim 1 , wherein the memory storage location comprises a lookup table used to store a mapping between the each operating parameter value of the amplifier assembly and the number of amplifier segments to be turned on in correspondence of the each operating parameter value of the amplifier assembly.
8. The assembly of claim 7 , wherein the lookup table is implemented using one of: a) a programmable read-only memory, b) an erasable programmable read-only memory, c) a nonvolatile memory, and d) any kind of memory.
9. The assembly of claim 7 , wherein the lookup table comprises data obtained via a calibration procedure of the amplifier assembly.
10. The assembly of claim 1 , wherein the operating performance is based on a value of one of: a) gain, b) output power, c) output current, d) efficiency, e) output distortion, and f) a combination of any one of a)-e) of the amplifier assembly during operation.
11. The assembly according to claim 3 , wherein the assembly further comprises:
one or more additional amplifier segments in a disabled condition, wherein one or more enabled amplifier segments of the plurality of amplifier segments are adapted to be replaceable, upon failure, with the one or more additional amplifier segments in the disabled condition upon enabling the disabled additional one or more amplifier segments; and
a failure detector adapted to detect failure of each one of the amplifier segments, wherein
the controller is further configured to disable the one or more enabled amplifier segments, and configured to enable the one or more additional amplifier segments in the disabled condition upon indication of failure by the failure detector, of the one or more amplifier segments in the enabled condition.
12. The assembly according to claim 11 , wherein a fraction of a total number of the plurality of amplifier segments are amplifier segments in an enabled condition and a remainder of the total number of the plurality of amplifier segments are amplifier segments in a disabled condition.
13. The assembly according to claim 12 , wherein the fraction is one half of the total number of the plurality of amplifier segments.
14. The assembly according to claim 11 , wherein the failure detector and the controller are located on a same die.
15. The assembly according to claim 11 , wherein the failure detector and the controller are located on different dies.
16. The assembly according to claim 11 , wherein the failure detector is a quiescent current detector.
17. An amplifier assembly comprising:
a plurality of amplifier segments;
one or more additional amplifier segments in a disabled condition, wherein one or more enabled amplifier segments of the plurality of amplifier segments are adapted to be replaceable, upon failure, with the one or more additional amplifier segments in the disabled condition upon enabling the disabled additional one or more amplifier segments;
a failure detector adapted to detect failure of each one of the amplifier segments;
a controller configured to:
enable and/or disable one or more amplifier segments of the plurality of amplifier segments according to a set profile, the set profile determining a number of amplifier segments required to be enabled for a given operating performance of the amplifier assembly; and
disable the one or more enabled amplifier segments, and enable the one or more additional amplifier segments in the disabled condition upon indication of failure by the failure detector, of the one or more amplifier segments in the enabled condition.