IP Library Granted Patent US 10,199,203
Granted Patent B2
US 10,199,203 · App. 15/154,683 · Granted Feb 5, 2019

Cobalt, iron, boron, and/or nickel alloy-containing articles and methods for making same

Inventors: Xingbo Yang (Phoenix, AZ); Dejan Stojakovic (Danbury, CT); Matthew J. Komertz (New Fairfield, CT); Arthur V. Testanero (New Fairfield, CT)
Assignee: MATERION CORPORATION
H01J37/3426C23C14/3414C22C19/07H01J2237/3322
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Quick Facts
Patent No.
US 10,199,203
App. No.
15/154,683
Granted
Feb 5, 2019
Kind
B2
Abstract

Methods for making a high purity (>99.99%) and low oxygen (<40 ppm) sputtering target containing Co, CoFe, CoNi, CoMn, CoFeX (X═B, C, Al), Fe, FeNi, or Ni alloys with a column microstructure framed by boron intermetallics are disclosed. The sputtering target is made by directional casting a molten mixture of the metal alloy, annealing to remove residual stresses, slicing, and optional annealing and finishing to obtain the sputtering target.

Claims (29)

1. A method for making a sputtering target,

comprising:

forming a molten alloy mixture, wherein the molten alloy mixture comprises (i) a composition including at least one of Co, Fe, or B, as a primary constituent, or (ii) a composition including Co and at least one of Fe, and Ni, or (iii) a composition of the formula CoFeX, wherein X is one of B, C, or Al;

pouring the molten mixture into a mold to form a directional casting ingot;

annealing the casting ingot; and

slicing the casting ingot to form the sputtering target,

wherein the sputtering target has a purity of greater than 99.99% and a low oxygen content of 40 ppm or less, and has a column microstructure framed by borides.

2. The method of claim 1 , wherein the molten alloy mixture

comprises a composition including 15% or more of boron (B).

3. The method of claim 1 , further comprising (i) shaping the casting ingot prior to slicing the casting ingot, or (ii) annealing the sputtering target after slicing the casting ingot, or (iii) finishing the sputtering target after slicing the casting ingot.

4. The method of claim 3 , wherein the finishing comprises grinding at least one surface of the sputtering target.

5. The method of claim 1 , wherein the annealing is performed at a temperature of less than 700° C. for a minimum of about 8 hours.

6. The method of claim 1 , further comprising pouring the molten mixture into a funnel above the mold, wherein the funnel comprises a conical top portion and a cylindrical bottom portion.

7. The method of claim 1 , wherein the sputtering target comprises an alloy of the formula Co x Fe y B (1-x-y) .

8. The method of claim 1 , wherein the sputtering target comprises an alloy of the formula (CoFe) 1-x B x , wherein 0.2≤x≤0.4.

9. The method of claim 1 , wherein the sputtering target has a diameter of up to 250 mm.

10. The method of claim 1 , wherein the sputtering target has a pass through flux of at least 30% at a thickness of 3 mm.

11. The method of claim 1 , wherein the sputtering target has a purity of 99.99%.

12. The method of claim 1 , wherein the sputtering target has an oxygen content less than 40 ppm.

13. The method of claim 1 , wherein the sputtering target has a B content of greater than 15%.

14. The method of claim 1 , wherein the annealing is performed under vacuum or under gas protection using an inert gas.

15. The method of claim 1 , wherein the sputtering target has a uniform microstructure.

16. A sputtering target for production of a magnetoresistive RAM (MRAM) prepared by a process comprising the steps of:

forming a molten alloy mixture comprising Co, Fe, B, or Ni and at least one of Ni, Mn, B, C, and/or Al;

pouring the molten mixture into a funnel located above a mold to form a directional casting ingot;

annealing the casting ingot; and

EDM slicing the casting ingot to form the sputtering target,

wherein the sputtering target has a purity of greater than 99.99%, and has a column microstructure framed by borides.

17. The sputtering target formed by the process of claim 16 , wherein the sputtering target has a B content of greater than 15%.

Assignments (2)
SECURITY INTEREST Recorded Sep 25, 2019
From: MATERION CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050493/0809 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 26, 2017
From: YANG, XINGBO; STOJAKOVIC, DEJAN; KOMERTZ, MATTHEW J.; TESTANERO, ARTHUR V.
To: MATERION CORPORATION
Reel/Frame 041091/0713 →
Continuity (3)
Provisional Application 62161424 · May 14, 2015
Provisional Application 62321622 · Apr 12, 2016
Related Publication 20160336155A1 · Nov 17, 2016
Cited By (1)
US 12,564,880