IP Library Patent Application 15156895
Patent Application
App. No. 15/156,895

Dynamic Dose Reduction in X-Ray Inspection

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Quick Facts
Patent No.
US None
App. No.
15/156,895
Abstract

Methods and an x-ray system for dynamically regulating x-ray dose. An x-ray beam is generated and collimated at a source collimator and detected after the x-ray beam traverses an inspected object. A filter may be dynamically interposed by translation of the filter between a focal spot of the source and the source collimator in such a manner as to maintain the portion of the x-ray beam that traverses the inspected object below a specified limit. Alternatively, an aperture of the source collimator may be varied in size or position relative to the focal spot.

Claims (11)

1 . A method for dynamically regulating x-ray dose at an inspected object, the method comprising:

a. generating an x-ray beam by impinging an electron beam upon an x-ray production target at a focal spot, wherein the x-ray production target is fixed with respect to the inspected object;

b. collimating the x-ray beam at a source collimator; and

c. varying a dimension characterizing the focal spot in such a manner as to maintain the portion of the x-ray beam that traverses the inspected object below a specified limit.

2 . A method in accordance with claim 1 , wherein varying a dimension characterizing the focal spot includes defocusing the focal spot.

3 . A method in accordance with claim 1 , wherein varying a dimension characterizing the focal spot includes changing a position on the target characterizing the focal spot.

4 . An x-ray system for generating an x-ray beam of dynamically regulated dose incident upon an inspected object, the x-ray system comprising:

a. an electron accelerating structure for accelerating a beam of electrons for formation of a focal spot on an x-ray producing target, the x-ray producing target disposed at a fixed distance from the inspected object, and for generating an x-ray beam;

b. a source collimator for collimating the x-ray beam;

c. a detector for receiving a portion of the x-ray beam that traverses the inspected object and for generating a detector signal; and

d. a processor adapted to dynamically drive at least one of steering and defocusing of the beam of electrons by the electron accelerating structure on a basis of the detector signal.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Jul 1, 2025
From: WELLS FARGO BANK, NATIONAL ASSOCIATION
To: AMERICAN SCIENCE AND ENGINEERING, INC.
Reel/Frame 071784/0673 →
SECURITY INTEREST Recorded Oct 11, 2016
From: AMERICAN SCIENCE AND ENGINEERING, INC.
To: WELLS FARGO BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 040305/0233 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 10, 2016
From: DINCA, DAN-CRISTIAN; ROMMEL, MARTIN
To: AMERICAN SCIENCE AND ENGINEERING, INC.
Reel/Frame 038874/0564 →