SYSTEMS AND METHODS FOR MULTI-ANALYSIS
Systems and methods are provided for sample processing. A device may be provided, capable of receiving the sample, and performing one or more of a sample preparation, sample assay, and detection step. The device may be capable of performing multiple assays. The device may comprise one or more modules that may be capable of performing one or more of a sample preparation, sample assay, and detection step. The device may be capable of performing the steps using a small volume of sample.
1 - 8 . (canceled)
9 . A sample processing system, comprising:
one or more operational matrices, wherein at least one of said operational matrices comprises one or more operational states of the sample processing system, and further wherein at least one of said operational states comprises two or more sample processing routines to be sequentially performed by the sample processing system;
a sample processing device comprising:
a sample handling system comprising at least one pipette nozzle for engaging with at least one pipette tip;
at least one detector; and
a cartridge receiving location;
and the cartridge comprising:
at least one pipette tip;
at least one assay unit;
at least one reagent unit; and
at least one sample collection unit for receiving a sample.
10 . The system of claim 9 , wherein the at least one sample collection unit is configured to receive a sample of no more than about 500 μl.
11 . A method for restoring an operational state of a sample processing system, comprising:
accessing a sample processing catalog of the sample processing system of claim 9 following a fault condition of the sample processing system; wherein the sample processing catalog comprises a record of operational data of the one or more operational states of the sample processing system;
identifying a last-in-time operational state of the sample processing system from the sample processing catalog;
identifying a last-in-time sample processing routine from the last-in-time operational state; and
performing by the sample processing system a next-in-time processing routine, wherein the next-in-time processing routine is a sample processing routine that follows the last-in-time sample processing routine in the one or more operational matrices.
12 . The method of claim 11 , wherein at least one of the one or more operational states is selected from sample processing, sample assaying, and sample detection.
13 . The method of claim 11 , wherein the fault condition is at least one condition selected from a system crash, power outage, hardware fault, software fault, and operating system fault.
14 . The method of claim 11 , wherein the operational data is recorded a) in real time, b) after the sample processing system performs at least one of the two or more sample processing routines c) before the sample processing system performs at least one of the two or more sample processing routines, or d) prior to, during, and after the sample processing system performs at least one of the two or more sample processing routines.
15 . The method of claim 11 , wherein the sample processing device comprises two or more modules for processing a sample.
16 . The method of claim 15 , wherein the one or more operational matrices comprises one or more operational states for each of the two or more modules for processing a sample.
17 . The method of claim 11 , wherein the sample processing device comprises the sample processing catalog.
18 . The method of claim 11 , wherein the sample processing system comprises a pointer marking either the last-in-time processing routine completed prior to the fault condition or the next-in-time processing routine to be completed.
19 . The method of claim 11 , further comprising tracking a location of one or more components of the sample processing system.
20 . A sample processing system comprising:
a sample processing catalog comprising operational data of one or more operational states of the sample processing system, wherein at least one of said operational states comprises two or more sample processing routines in sequential order to be performed by the sample processing system;
a sample processing device comprising:
a sample handling system comprising at least one pipette nozzle for engaging with at least one pipette tip;
at least one detector; and
a cartridge receiving location;
and the cartridge comprising:
the at least one pipette tip;
at least one assay unit;
at least one reagent unit; and
at least one sample collection unit for receiving a sample.
21 . The system of claim 20 , wherein the at least one sample collection unit is configured to receive a sample of no more than about 500 μl.
22 . A method for processing a sample, comprising:
accessing a sample processing catalog of the sample processing system of claim 20 ;
performing by the sample processing system the two or more sample processing routines in sequential order; and
removing from the sample processing catalog at least one of the one or more sample processing routines (i) before performing said at least one sample processing routine; (ii) while performing said at least one sample processing routine; or (iii) after performing at least one sample processing routine.
23 . A method for restoring an operational state of a sample processing system, comprising:
accessing the sample processing catalog of the sample processing system of claim 20 following a fault condition of the sample processing system;
sequentially replaying the two or more sample processing routines corresponding to the operational data recorded on the sample processing catalog without the sample processing system performing the two or more processing routines;
stopping the replay of the two or more sample processing routines when the sample processing routine being replayed corresponds to an operational state of the sample processing system prior to the fault condition, thereby restoring the sample processing system to the operational state prior to the fault condition.
24 . A sample processing system comprising:
a plan matrix comprising two or more planned routines to be sequentially performed by the sample processing system;
a routine matrix for recording one or more planned routines that have been performed by the system;
a sample processing device comprising:
a sample handling system comprising at least one pipette nozzle for engaging with at least one pipette tip;
at least one detector; and
a cartridge receiving location;
and the cartridge comprising:
at least one pipette tip;
at least one assay unit;
at least one reagent unit; and
at least one sample collection unit for receiving a sample.
25 . The system of claim 24 , wherein the at least one sample collection unit is configured to receive a sample of no more than about 500 μl.
26 . A method for processing a sample, comprising:
performing by the sample processing system of claim 24 the two or more planned routines; and
recording in the routine matrix the two or more planned routines in the order in which the two or more planned routines were performed.
27 . The method of claim 26 , further comprising:
accessing the routine matrix following a fault condition of the sample processing system;
determining the last-in-time planned routine performed; and
performing by the sample processing system the next-in-time planned routine from the plan matrix.
28 . The method of claim 27 , wherein the fault condition is at least one condition selected from a system crash, power outage, hardware fault, software fault, and operating system fault.