Wavelength locking and multiplexing of high-power semiconductor lasers
The invention relates to wavelength stabilization and wavelength multiplexing of multiple high-power multi-mode semiconductor lasers. The lasers are wavelength-stabilized in free space using multi-peak output reflectors to wavelength-lock their output at different reflection wavelength in dependence on operating conditions, to reduce output reflectivity required for locking and increase output power. Selecting output reflectors having different non-overlapping sets of reflectivity peaks for different lasers or groups of lasers enables combining their output by wavelength multiplexing.
1. A multi-laser light source comprising:
a plurality of multi-mode semiconductor lasers;
beam combining optics for combining multi-mode laser beams emitted by the plurality of multi-mode semiconductor lasers into a combined multi-mode beam; and
a multi-band partial reflector (MBPR) disposed in an optical path of the combined multi-mode beam for transmitting therethrough at least 80% of an optical power of the combined multi-mode beam,
the MBPR having a structure defined by at least two distinct reflectivity peaks centered at at least two distinct reflection wavelengths,
each reflectivity peak characterized by a peak reflectivity, in a range of 1% to 15%, for providing an optical feedback to each of the plurality of multi-mode semiconductor lasers at the at least two distinct reflection wavelengths, and
wherein the at least two distinct reflection wavelengths and corresponding distinct reflectivity peak, of the at least two distinct reflectivity peaks, are selected such that the structure of the MBPR produces the at least two distinct reflectivity peaks:
based on a determination of an operating wavelength range, which is based on a respective wavelength operating range for each of the plurality of multi-mode semiconductor lasers, of the multi-laser light source for a pre-defined range of operating conditions,
based on a selection of reflection wavelengths, within the operating wavelength range of the multi-laser light source, and corresponding peak reflectivity values, of the at least two distinct reflectivity peaks, so that wavelength locking ranges, associated with the at least two distinct reflectivity peaks, cover the operating wavelength range, and
to enable wavelength locking of each of the plurality of multi-mode semiconductor lasers at one of the at least two distinct reflection wavelengths at any operating condition within the pre-defined range of operating conditions.
2. The multi-laser light source of claim 1 , further comprising:
a support base having a stepped laser mounting surface comprising a plurality of steps, wherein
the plurality of multi-mode semiconductor lasers are mounted upon the plurality of steps for producing the multi-mode laser beams,
the multi-mode laser beams are spatially offset from each other in a vertical direction that is perpendicular to the stepped laser mounting surface;
the beam combining optics align the vertically offset multi-mode laser beams in a same vertical plane so as to form a composite light beam; and
the at least two distinct reflection wavelengths and the corresponding distinct reflectivity peak, of the at least two distinct reflectivity peaks, are selected so that each of the plurality of multi-mode semiconductor lasers exhibits an optical gain peak within a wavelength locking range from at least one of the at least two distinct reflection wavelengths over the pre-defined range of operating conditions.
3. The multi-laser light source of claim 1 , wherein
the pre-defined range of operating conditions comprises pre-defined operating ranges of laser temperature and drive current, and
the at least two distinct reflection wavelengths and the corresponding peak reflectivity values are selected so as to enable wavelength locking of each of the plurality of multi-mode semiconductor lasers at one of the at least two distinct reflection wavelengths at any temperature and drive current within the pre-defined operating ranges.
4. The multi-laser light source of claim 1 , wherein each of the plurality of multi-mode semiconductor lasers comprises a laser chip of a substantially same layer structure and nominal material composition.
5. The multi-laser light source of claim 1 , wherein a quantity of multi-mode semiconductor lasers, of the plurality of multi-mode semiconductor lasers, is greater than a quantity of distinct reflectivity peaks of the at least two distinct reflectivity peaks.
6. The multi-laser light source of claim 1 , wherein the MBPR comprises at least two volume Bragg gratings (VBG) for reflecting light at a respective distinct reflection wavelength of the at least two distinct reflection wavelengths.
7. The multi-laser light source of claim 1 , wherein the MBPR comprises a multi-band VBG having a reflection spectrum comprising the at least two distinct reflectivity peaks.
8. The multi-laser light source of claim 1 , wherein each of the at least two distinct reflectivity peaks is characterized by a peak reflectivity between 2% and 15%.
9. The multi-laser light source of claim 1 , wherein the at least two reflection wavelengths are spaced apart by at least 2 nm.
10. A method comprising:
combining multi-mode laser beams emitted by a plurality of multi-mode semiconductor lasers into a combined multi-mode beam;
providing a multi-band partial reflector (MBPR) having at least two distinct reflectivity peaks centered at at least two distinct reflection wavelengths within an operating wavelength range of a multi-laser light source, each reflectivity peak characterized by a peak reflectivity in the range of 1% to 15%; and
disposing the MBPR in an optical path of the combined multi-mode beam for transmitting therethrough at least 80% of an optical power of the combined multi-mode beam, and for providing an optical feedback to each of the plurality of multi-mode semiconductor lasers at the at least two distinct reflection wavelengths;
wherein the at least two distinct reflection wavelengths and corresponding distinct reflectivity peak, of the at least two distinct reflectivity peaks, are selected:
based on a determination of an operating wavelength range, which is based on a respective wavelength operating range for each of the plurality of multi-mode semiconductor lasers, of the multi-laser light source for a pre-defined range of operating conditions,
based on a selection of reflection wavelengths, within the operating wavelength range of the multi-laser light source, and corresponding peak reflectivity values, of the at least two distinct reflectivity peaks, so that wavelength locking ranges, associated with the at least two distinct reflectivity peaks, cover the operating wavelength range, and
to enable wavelength locking of each of the plurality of multi-mode semiconductor lasers at one of the at least two distinct reflection wavelengths at any operating condition within the pre-defined range of operating conditions.
11. The method of claim 10 , further comprising:
determining the operating wavelength range of the multi-laser light source for the pre-defined range of operating conditions in an absence of wavelength stabilization.
12. The method of claim 11 , wherein determining the operating wavelength range of the multi-laser light source includes:
determining operating wavelength ranges for each of the plurality of multi-mode semiconductor lasers; and
determining the operating wavelength range of the multi-laser light source based on the operating wavelength ranges of the plurality of multi-mode semiconductor lasers.
13. The method of claim 11 , wherein determining the operating wavelength range of the multi-laser light source includes:
determining a minimum wavelength as a low-wavelength boundary of the operating wavelength range of a lowest-wavelength multi-mode semiconductor laser of the plurality of multi-mode semiconductor lasers;
determining a maximum wavelength as a high-wavelength boundary of the operating wavelength range of a highest-wavelength multi-mode semiconductor laser of the plurality of multi-mode semiconductor lasers; and
determining the operating wavelength range of the multi-laser light source as spanning from the minimum wavelength to the maximum wavelength.
14. The method of claim 10 , further comprising:
selecting the reflection wavelengths by:
selecting peak reflectivity values for the at least two distinct reflection peaks of the MBPR;
determining a minimum wavelength locking range for the multi-mode semiconductor lasers for the selected peak reflectivity values; and
selecting the reflection wavelengths so that a smallest of the reflection wavelengths exceeds a minimum wavelength by at most half of the minimum wavelength locking range and the largest of the reflection wavelengths is smaller than a maximum wavelength by at most half of the minimum wavelength locking range.
15. The method of claim 10 , wherein the MBPR comprises at least two volume Bragg gratings (VBG) for reflecting light at a respective distinct reflection wavelength of the at least two distinct reflection wavelengths.
16. The method of claim 10 , wherein the MBPR comprises a multi-band VBG having a reflection spectrum comprising the at least two distinct reflectivity peaks.