IP Library Granted Patent US 9,844,937
Granted Patent B1
US 9,844,937 · App. 15/187,871 · Granted Dec 19, 2017

Method and apparatus for minimizing via compression in a fluid ejection head

Inventor: Steven R Komplin (Lexington, KY)
Assignee: FUNAI ELECTRIC CO., LTD.
B41J2/1408B41J2/14B41J2/1433B41J2/14145B41J2/162B41J2/1623B41J2202/13B41J2202/22
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Quick Facts
Patent No.
US 9,844,937
App. No.
15/187,871
Granted
Dec 19, 2017
Kind
B1
Abstract

A fluid ejection head assembly having improved assembly characteristics and methods of manufacturing a fluid ejection head assembly. The fluid ejection head includes a fluid supply body having at least one fluid supply port in a recessed area therein and a semiconductor chip attached in the recessed area of the fluid supply body adjacent the fluid supply port using a thermal cure adhesive. A compression prevention body having a coefficient of thermal expansion ranging from about 1.0 to less than about 30 microns/meter per ° C. disposed adjacent to the fluid supply port of the fluid supply body and the semiconductor chip.

Claims (22)

1. A fluid ejection head assembly comprising a fluid supply body having at least one fluid supply port in a recessed area therein, a semiconductor chip attached in the recessed area of the fluid supply body adjacent the fluid supply port using a thermal cure adhesive, and a compression prevention body having a coefficient of thermal expansion ranging from about 1.0 to less than about 30 microns/meter per ° C. disposed adjacent to the fluid supply port of the fluid supply body and the semiconductor chip, wherein the compression prevention body has a spherical shape.

2. The fluid ejection head assembly of claim 1 , wherein the compression prevention body comprises a material selected from the group consisting of silicon, glass, alumina, stainless steel, and a low CTE polymeric material.

3. The fluid ejection head assembly of claim 1 , wherein the compression prevention body comprises a material having a coefficient of thermal expansion of ranging from about 1.5 to less than about 25 microns/meter per ° C.

4. The fluid ejection head assembly of claim 1 , wherein the compression prevention body comprises a material having a coefficient of thermal expansion of ranging from about 2 to less than about 18 microns/meter per ° C.

5. The fluid ejection head assembly of claim 1 , wherein the compression prevention body has a coefficient of thermal expansion of less than about half a coefficient of thermal expansion of the fluid supply body.

6. The fluid ejection head assembly of claim 1 , wherein the compression prevention body has a diameter ranging from about 2.0 to about 3.5 millimeters.

7. A method for reducing compressive forces on a semiconductor chip of a fluid ejection head during a thermal cure process for attaching the semiconductor chip to a fluid supply body comprising:

providing a fluid supply port in a recessed area of the fluid supply body;

disposing a compression prevention body adjacent to the fluid supply port of the fluid supply body and the semiconductor chip, wherein the compression prevention body has a coefficient of thermal expansion ranging from about 1.0 to less than about 30 microns/meter per ° C., and wherein the compression prevention body has a spherical shape;

attaching a semiconductor chip in the recessed area of the fluid supply body adjacent to the fluid supply port using a thermal cure adhesive so that the compression prevention body; and

thermally curing the adhesive to fixedly attach the semiconductor chip in the recessed area of the fluid supply body.

8. The method of claim 7 , wherein the compression prevention body comprises a material selected from the group consisting of silicon, glass, alumina, stainless steel, and a low CTE polymeric material.

9. The method of claim 7 , wherein the compression prevention body comprises a material having a coefficient of thermal expansion ranging from about 1.5 to less than about 25 microns/meter per ° C.

10. The method of claim 7 , wherein the compression prevention body comprises a material having a coefficient of thermal expansion of ranging from about 2 to less than about 18 microns/meter per ° C.

11. The method of claim 7 , wherein the compression prevention body has a coefficient of thermal expansion of less than about half a coefficient of thermal expansion of the fluid supply body.

12. The method of claim 7 , wherein the compression prevention body has a diameter ranging from about 2.0 to about 3.5 millimeters.

13. A method for reducing via distortion in a semiconductor chip of a fluid ejection head during a thermal cure process for attaching the semiconductor chip to a fluid supply body comprising:

providing a fluid supply port in a recessed area of the fluid supply body;

disposing a spherical body adjacent to the fluid supply port of the fluid supply body and the semiconductor chip, wherein the spherical body has a coefficient of thermal expansion ranging from about 1.0 to less than about 30 microns/meter per ° C.;

attaching a semiconductor chip in the recessed area of the fluid supply body adjacent the fluid supply port using a thermal cure adhesive; and

thermally curing the adhesive to fixedly attach the semiconductor chip in the recessed area of the fluid supply body.

14. The method of claim 13 , wherein the spherical body is selected from a silicon sphere, a glass sphere, an alumina sphere, a stainless steel sphere, and a low CTE polymeric sphere having a diameter ranging from about 2.0 to about 3.5 millimeters.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2025
From: FUNAI ELECTRIC CO., LTD.
To: BRADY WORLDWIDE, INC.
Reel/Frame 070724/0354 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 21, 2016
From: KOMPLIN, STEVEN R
To: FUNAI ELECTRIC CO., LTD.
Reel/Frame 038967/0457 →