IP Library Granted Patent US 9,638,922
Granted Patent B2
US 9,638,922 · App. 15/191,941 · Granted May 2, 2017

High-efficiency line-forming optical systems and methods

Inventor: Serguei Anikitchev (Belmont, CA)
Assignee: Ultratech, Inc.
G02B27/0927B23K26/0006B23K26/0066B23K26/066B23K26/0643B23K26/0648B23K26/0738B23K26/082B23K26/083B23K26/0823B23K26/352B23K26/354G02B17/008G02B17/061G02B27/0983G02B27/0988H01L21/2253H01L21/268H01L21/322H01L21/324H01L21/428H01L21/477B23K2201/40B23K2203/56
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Quick Facts
Patent No.
US 9,638,922
App. No.
15/191,941
Granted
May 2, 2017
Kind
B2
Abstract

A line-forming optical system and method are disclosed that form a line image with high-efficiency. A method includes forming a laser beam having a first intensity profile with a Gaussian distribution in at least a first direction and passing at least 50% of the laser beam in the first direction to form a first transmitted light. The method also includes: focusing the first transmitted light at an intermediate image plane to define a second intensity profile having a central peak and first side peaks immediately adjacent the central peak; then truncating the second intensity profile within each of first side peaks to define a second transmitted light; and then forming the line image at an image plane from the second transmitted light.

Claims (15)

1. A method of forming a line image, comprising:

forming a laser beam having a first intensity profile with a Gaussian distribution in at least a first direction;

passing at least 50% of the laser beam in the first direction to form a first transmitted light;

focusing the first transmitted light at an intermediate image plane to define a second intensity profile having a central peak and first side peaks immediately adjacent the central peak;

truncating the second intensity profile within each of first side peaks to define a second transmitted light; and

forming the line image at an image plane from the second transmitted light.

2. The method of claim 1 , wherein each first side peak is defined by a maximum value MX and first and second minimum values m 1 and m 2 , and wherein said truncating the second intensity profile is performed between the maximum value MX and the second minimum value m 2 in each of the first side peaks.

3. The method of claim 1 , wherein the intermediate image plane is defined by a relay optical system, and wherein the relay optical system has substantially 1× magnification in the first direction.

4. The method of claim 3 , wherein the relay optical system comprises cylindrical mirrors.

5. The method of claim 3 , wherein the relay optical system consists of reflective optical components only.

6. The method of claim 1 , wherein the line image has a length L in the range of 5 mm≦L≦100 mm and has an intensity uniformity of within +/−5% over the length L.

7. The method of claim 1 , wherein truncating the second intensity profile includes passing a central portion of the first transmitted light through a slit aperture defined by a pair of blades.

8. The method of claim 1 , wherein the line image has a length L that is in the range of 5 mm≦L≦100 mm and has a width w in the range of 25 μm≦w≦500 μm.

9. The method of claim 1 , wherein the line image has a long dimension defined by a length L, and further comprising scanning the line image over a surface of a wafer in a scan direction that is perpendicular to the long dimension.

10. The method of claim 9 , wherein the surface of wafer includes device features that include dopants, and wherein scanning the line image over the surface of wafer activates the dopants.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2016
From: ANIKITCHEV, SERGUEI
To: ULTRATECH, INC.
Reel/Frame 039004/0107 →
Continuity (3)
Division 14744207 · Jun 19, 2015
Provisional Application 62030391 · Jul 29, 2014
Related Publication 20160306177A1 · Oct 20, 2016