Sample holders and methods of using them
Certain embodiments described herein are directed to sample holders that can be used to retain a sample support effective for use in direct sample analysis. In some embodiments, the sample support can include a first and a second plate with apertures to permit a sample to be analyzed using direct sample analysis.
1. A method of loading a sample for direct sample analysis, the method comprising providing a sample holder comprising a first plate configured to permit a sample on a sample support to be contacted by fluid for direct sample analysis, the first plate comprising a retaining device and a plurality of apertures, and a second plate rotatably coupled to the first plate and comprising a same number of apertures as the plurality of apertures of the first plate, the second plate configured to rotate about a longitudinal axis of the second plate to engage the first plate and retain the sample support between the first plate and the second plate, in which the retaining device of the first plate engages the second plate in a first position to retain the sample support between the first plate and the second plate and disengages the second plate in a second position to permit removal of the sample support from the sample holder, in which the apertures of the first plate and the second plate comprise a same size and geometry, and wherein when the first plate is engaged to the second plate in the first position the apertures of the first plate align with the apertures of the second plate.
2. The method of claim 1 , further comprising providing instructions for loading the sample on the sample support.
3. The method of claim 1 , further comprising providing instructions for inserting the sample support into the sample holder.
4. The method of claim 1 , further comprising providing a sample support.
5. The method of claim 1 , further comprising providing instructions for analyzing the sample on the sample support using direct sample analysis.
6. A method of loading a sample for direct sample analysis, the method comprising providing a sample holder configured to retain a sample support for direct sample analysis of a sample on the sample support, the sample holder comprising a first plate attached to a second plate through at least one joint, wherein the second plate is configured to rotate about a longitudinal axis of the second plate, the first plate comprising a sliding device configured to hold the second plate towards the first plate in a first position and to permit rotation of the second plate away from the first plate in the second position, in which the holding of the second plate towards the first plate retains the sample support between the first plate and the second plate, in which the first plate comprises a plurality of apertures and the second plate comprises a same number of apertures as the plurality of apertures of the first plate, wherein the apertures of the first plate and the second plate comprise a same size and geometry, and wherein when the first plate is held towards the second plate in the first position the apertures of the first plate align with the apertures of the second plate.
7. The method of claim 6 , further comprising providing instructions for loading the sample on the sample support.
8. The method of claim 6 , further comprising providing instructions for inserting the sample support into the sample holder.
9. The method of claim 6 , further comprising providing a sample support.
10. The method of claim 6 , further comprising providing instructions for analyzing the sample on the sample support using direct sample analysis.
11. A method of loading a sample for direct sample analysis, the method comprising providing a sample holder comprising a first plate comprising a plurality of apertures each configured to permit a sample on a sample support to be contacted by fluid for direct sample analysis, the first plate comprising a retaining device, and a second plate comprising an integral sample support and configured to removably couple to the first plate, wherein the second plate comprises a same number of apertures as the plurality of apertures of the first plate, the second plate further configured to rotate about a longitudinal axis of the second plate to engage the first plate, in which the retaining device of the first plate is configured to engage the second plate to the first plate in a first position and to disengage the second plate from the first plate in a second position, and wherein the apertures of the first plate and the second plate comprise a same size and geometry, and wherein when the first plate is engaged to the second plate in the first position the apertures of the first plate align with the apertures of the second plate.
12. The method of claim 11 , further comprising providing instructions for loading the sample on the sample support.
13. The method of claim 11 , further comprising providing instructions for inserting the sample support into the sample holder.
14. The method of claim 11 , further comprising providing a sample support.
15. The method of claim 11 , further comprising providing instructions for analyzing the sample on the sample support using direct sample analysis.