IP Library Granted Patent US 9,761,284
Granted Patent B1
US 9,761,284 · App. 15/199,578 · Granted Sep 12, 2017

Current starved voltage comparator and selector

Inventors: Marian Hulub (Unterhaching, DE); Roland Heymann (Sauerlach, DE)
Assignee: Intel Corporation
G11C7/062G11C7/1006H03F3/45475H03K5/24H03K17/687H03F2203/45288
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Quick Facts
Patent No.
US 9,761,284
App. No.
15/199,578
Granted
Sep 12, 2017
Kind
B1
Abstract

An apparatus is provided which comprises: a bi-directional switch; and a comparator coupled to the bi-directional switch, the comparator having: a first input coupled to a first terminal of the bi-directional switch; a second input coupled to a second terminal of the bi-directional switch; and an output coupled to a body or substrate of the bi-directional switch.

Claims (47)

1. An apparatus comprising:

a body or substrate of a p-type transistor, the p-type transistor having a source terminal and a drain terminal which are to receive a source voltage and a drain voltage, respectively; and

a sensor coupled to the source and drain terminals of the p-type transistor, wherein the sensor is to determine whether the source voltage and the drain voltage are different, and to provide a body voltage to the body or substrate of the p-type transistor according to a larger of the source or drain voltages.

2. The apparatus of claim 1 , wherein the sensor has a bandwidth which is proportional to a difference between the source and drain voltages.

3. The apparatus of claim 1 , wherein the sensor comprises:

a first switch coupled to the source terminal of the p-type transistor; and

a second switch coupled in series with the first switch via a common node, wherein the second switch is coupled to the drain terminal of the p-type transistor, wherein the common node is coupled to the body or substrate of the p-type transistor.

4. The apparatus of claim 3 , wherein the sensor comprises a first device coupled to the common node and a gate terminal of the second switch, and wherein the first device has a gate terminal coupled to a gate terminal of the first switch.

5. The apparatus of claim 4 , wherein the sensor comprises a second device coupled to the common node and a gate terminal of the first switch, and wherein the second device has a gate terminal coupled to a gate terminal of the second switch.

6. The apparatus of claim 3 , wherein the sensor comprises a first operational transconductance amplifier (OTA) coupled to the source terminal of the p-type transistor.

7. The apparatus of claim 6 , wherein the sensor comprises a second OTA coupled to the drain terminal of the drain terminal of the p-type transistor.

8. The apparatus of claim 1 , wherein the p-type transistor is a bi-directional switch.

9. An apparatus comprising:

a bi-directional switch; and

a comparator coupled to the bi-directional switch, the comparator having:

a first input coupled to a first terminal of the bi-directional switch;

a second input coupled to a second terminal of the bi-directional switch; and

an output coupled to a body or substrate of the bi-directional switch.

10. The apparatus of claim 9 , wherein the comparator has a bandwidth which is proportional to a difference between a voltage on the first input and a voltage on the second input.

11. The apparatus of claim 9 , wherein the bi-directional switch is a p-type transistor.

12. The apparatus of claim 9 , wherein the comparator is to determine whether a first voltage on the first input and a second voltage on the second input are different, and to provide a body voltage to the body or substrate of the bi-directional switch according to a larger of the first or second voltages.

13. The apparatus of claim 9 , wherein the comparator comprises:

a first switch coupled to the first terminal of the bi-directional switch; and

a second switch coupled in series with the first switch via a common node, wherein the second switch is coupled to the second terminal of the bi-directional switch, wherein the common node is coupled to the body or substrate of the bi-directional switch.

14. The apparatus of claim 13 , wherein the comparator comprises a first device coupled to the common node and a gate terminal of the second switch, and wherein the first device has a gate terminal coupled to a gate terminal of the first switch.

15. The apparatus of claim 14 , wherein the comparator comprises a second device coupled to the common node and a gate terminal of the first switch, and wherein the second device has a gate terminal coupled to a gate terminal of the second switch.

16. The apparatus of claim 15 , wherein the comparator comprises a first operational transconductance amplifier (OTA) coupled to the source terminal of the p-type transistor.

17. The apparatus of claim 16 , wherein the comparator comprises a second OTA coupled to the drain terminal of the drain terminal of the p-type transistor.

18. A system comprising:

a memory;

a processor coupled to the memory, the processor comprising:

a bi-directional switch; and

a comparator coupled to the bi-directional switch, the comparator having:

a first input coupled to a first terminal of the bi-directional switch;

a second input coupled to a second terminal of the bi-directional switch; and

an output coupled to a body or substrate of the bi-directional switch, wherein the comparator has a bandwidth which is proportional to a difference between a voltage on the first input and a voltage on the second input; and

a wireless interface for allowing the processor to communicate with another device.

19. The system of claim 17 , wherein the comparator is to determine whether a first voltage on the first input and a second voltage on the second input are different, and to provide a body voltage to the body or substrate of the bi-directional switch according to a larger of the first or second voltages.

20. The system of claim 17 , wherein the comparator comprises:

a first switch coupled to the first terminal of the bi-directional switch; and

a second switch coupled in series with the first switch via a common node, wherein the second switch is coupled to the second terminal of the -directional switch, and wherein the common node is coupled to the body or substrate of the -directional switch.

21. The system of claim 20 , wherein the comparator comprises:

a first device coupled to the common node and a gate terminal of the second switch, and wherein the first device has a gate terminal coupled to a gate terminal of the first switch; and

a second device coupled to the common node and a gate terminal of the first switch, and wherein the second device has a gate terminal coupled to a gate terminal of the second switch.

22. The system of claim 21 , wherein the comparator comprises:

a first operational transconductance amplifier (OTA) coupled to the source terminal of the p-type transistor; and

a second OTA coupled to the drain terminal of the drain terminal of the p-type transistor.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2021
From: INTEL IP CORPORATION
To: INTEL CORPORATION
Reel/Frame 057061/0588 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2021
From: INTEL IP CORPORATION
To: INTEL CORPORATION
Reel/Frame 057254/0415 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 29, 2016
From: HULUB, MARIAN; HEYMANN, ROLAND
To: INTEL IP CORPORATION
Reel/Frame 040182/0624 →