METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
A sample semiconductor device is manufactured and the curvature of the sample is measured. An area is set to be removed from an encapsulation resin layer on the basis of the measurement value. After forming the encapsulation resin layer during the process of manufacturing the semiconductor device, the removal area is removed.
1 . A method for manufacturing a semiconductor device, comprising:
manufacturing a sample semiconductor device;
taking a measurement value relating to curvature of the sample;
determining a removal region having a region for removal from a sealing resin layer covering one surface of the semiconductor device positioned on the opposite side of a substrate when the semiconductor device is mounted on said substrate in accordance with the measurement value;
forming the sealing resin layer; and
removing the removal region.