IP Library Granted Patent US 10,403,668
Granted Patent B2
US 10,403,668 · App. 15/221,719 · Granted Sep 3, 2019

Imaging apparatus and image sensor including the same

Inventors: Amir Arbabi (Pasadena, CA); Seunghoon Han (Suwon-si, KR); Andrei Faraon (Pasadena, CA)
Assignees: SAMSUNG ELECTRONICS CO., LTD.; CALIFORNIA INSTITUTE OF TECHNOLOGY
H01L27/14627H01L27/14605H01L27/14621G03B35/10H04N5/2257
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Quick Facts
Patent No.
US 10,403,668
App. No.
15/221,719
Granted
Sep 3, 2019
Kind
B2
Abstract

An image sensor includes a substrate, thin lenses disposed on a first surface of the substrate and configured to concentrate lights incident on the first surface, and light-sensing cells disposed on a second surface of the substrate, the second surface facing the first surface, and the light-sensing cells being configured to sense lights passing through the thin lenses, and generate electrical signals based on the sensed lights. A first thin lens and second thin lens of the thin lenses are configured to concentrate a first light and a second light, respectively, of the incident lights onto the light-sensing cells, the first light having a different wavelength than the second light.

Claims (32)

1. An image sensor comprising:

a substrate;

thin lenses disposed on a first surface of the substrate and configured to concentrate lights incident on the first surface;

light-sensing cells disposed on a second surface of the substrate, the second surface facing the first surface, and the light-sensing cells being configured to sense lights passing through the thin lenses, and generate electrical signals based on the sensed lights,

wherein a first thin lens and a second thin lens of the thin lenses are configured to concentrate a first light and a second light, respectively, of the incident lights onto the light-sensing cells with different focal lengths, the first light having a different wavelength than the second light, and

wherein each of the thin lenses comprises scatterers, the scatterers including material having a refractive index higher than a refractive index of the substrate; and

a depth map calculator configured to calculate a defocusing degree of an image that is produced on each of the light-sensing cells, and calculate depth map information about an image that is produced by the incident lights, based on the defocusing degree.

2. The image sensor of claim 1 , wherein the substrate comprises sub-substrates, and

the thin lenses and the light-sensing cells are respectively disposed on a first surface and a second surface of each of the sub-substrates.

3. The image sensor of claim 1 , wherein each of the scatterers has a pillar structure.

4. The image sensor of claim 3 , wherein an interval distance between a pair of the scatterers is less than a respective wavelength of light concentrated by a respective one among the thin lenses.

5. The image sensor of claim 3 , wherein a height of the scatterers is less than a respective wavelength of light concentrated by a respective one among the thin lenses.

6. The image sensor of claim 3 , wherein the scatterers comprise at least one from among silicon, gallium phosphide, SiC, SiN, and TiO 2 .

7. The image sensor of claim 3 , wherein shapes of the scatterers and interval distances between respective pairs of the scatterers vary with a respective wavelength of light concentrated by a respective one among the thin lenses.

8. The image sensor of claim 1 further comprising light filters, each of the light filters being configured to filter a respective wavelength of light incident on a respective one among the light-sensing cells.

9. The image sensor of claim 1 further comprising an image synthesizer configured to generate a multi-color image by synthesizing images of different colors,

wherein at least two among the light-sensing cells produce the images of different colors.

10. An image sensor comprising:

a substrate;

thin lenses disposed on a first surface of the substrate and configured to concentrate lights incident on the first surface;

light-sensing cells disposed on a second surface of the substrate, the second surface facing the first surface, and the light-sensing cells being configured to sense lights passing through the thin lenses, and generate electrical signals based on the sensed lights,

wherein a first thin lens and a second thin lens of the thin lenses are configured to concentrate a first light and a second light, respectively, of the incident lights to have different focal lengths, and

wherein each of the thin lenses comprises scatterers, the scatterers including material having a refractive index higher than a refractive index of the substrate; and

a depth map calculator configured to calculate a defocusing degree of an image that is produced on each of the light-sensing cells, and calculate depth map information about an image that is produced by the incident lights, based on the defocusing degree.

11. The image sensor of claim 10 , wherein the substrate comprises sub-substrates, and

the thin lenses and the light-sensing cells are respectively disposed on a first surface and a second surface of each of the sub-substrates.

12. The image sensor of claim 10 , wherein the concentrated lights have predetermined wavelengths.

13. The image sensor of claim 10 , wherein each of the scatterers has a pillar structure.

14. The image sensor of claim 13 , wherein an interval distance between a pair of the scatterers is less than a respective wavelength of light concentrated by a respective one among the thin lenses.

15. The image sensor of claim 13 , wherein a height of the scatterers is less than a respective wavelength of light concentrated by a respective one among the thin lenses.

16. The image sensor of claim 13 , wherein shapes of the scatterers and interval distances between respective pairs of the scatterers vary with a respective wavelength of light concentrated by a respective one among the thin lenses.

17. The image sensor of claim 10 further comprising a light filter layer configured to filter a wavelength of light incident on each of the light-sensing cells.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 28, 2016
From: ARBABI, AMIR; HAN, SEUNGHOON; FARAON, ANDREI
To: SAMSUNG ELECTRONICS CO., LTD.; CALIFORNIA INSTITUTE OF TECHNOLOGY
Reel/Frame 039278/0973 →
Priority Claims (1)
KR 10-2016-0044268 · Apr 11, 2016 · national
Continuity (2)
Provisional Application 62198268 · Jul 29, 2015
Related Publication 20170034500A1 · Feb 2, 2017
Cited By (2)
US 12,394,059 US 12,585,312