Automated sample processing instruments, systems, processes, and methods

1. An automated instrument for processing a sample, the instrument comprising:

a movable first rack configured to hold a sample containing receptacle, the first rack defining a first recess;

a movable second rack configured to hold a processing receptacle, the second rack defining a second recess;

a first lock comprising a first locking pin configured to be received in the first recess, the first lock configured to move between a locked configuration and an unlocked configuration, wherein the first lock is configured to be engaged with the first rack in the locked configuration of the first lock to secure the first rack within the automated instrument, and wherein the first lock is disengaged from the first rack in the unlocked configuration of the first lock to allow movement of the first rack within the automated instrument;

a second lock comprising a second locking pin configured to be received in the second recess, the second lock configured to move between a locked configuration and an unlocked configuration, wherein the second lock is configured to be engaged with the second rack in the locked configuration of the second lock to secure the second rack within the automated instrument, and wherein the second lock is configured to be disengaged from the second rack in the unlocked configuration of the second lock to allow movement of the second rack within the automated instrument;

a robotic arm movable within the automated instrument; and

a controller configured to control the robotic arm to:

(i) engage and move the first lock to the locked configuration of the first lock,

(ii) engage and move the first lock to the unlocked configuration of the first lock,

(iii) engage and move the second lock to the locked configuration of the second lock,

(iv) engage and move the second lock to the unlocked configuration of the second lock, and

(v) pick-and-place the sample containing receptacle, the processing receptacle, or both within the automated instrument.

2. The automated instrument of claim 1 , wherein:

the first locking pin has at least one prong configured to be received within the first recess; and

the second locking pin has at least one prong configured to be received within the second recess.

3. The automated instrument of claim 2 , wherein the first recess comprises a through hole.

4. The automated instrument of claim 2 , wherein the first rack comprises a tab extending from a surface of the first rack and defining the first recess.

5. The automated instrument of claim 4 , further comprising:

a first bay configured to movably receive the first rack and having a first panel defining a first opening configured to receive the tab, wherein the first locking pin is movably coupled to the first bay such that the at least one prong of the first locking pin is received within the first recess when the tab is received within the first opening and the first lock is in the locked configuration; and

a second bay configured to movably receive the second rack, wherein the second locking pin is movably coupled to the second bay such that the at least one prong of the second locking pin is received within the second recess when the second lock is in the locked configuration.

6. The automated instrument of claim 2 , wherein the first rack has a tapered surface that defines the first recess.

7. The automated instrument of claim 2 , wherein the second recess is a pocket defined by a surface of the second rack facing the second lock.

8. The automated instrument of claim 7 , wherein the second rack defines a third recess, the third recess being a pocket defined by the surface of the second rack facing the second lock, and wherein the at least one prong of the second locking pin comprises a first prong and a second prong configured to be received within the second recess and the third recess, respectively, when the second lock is in the locked configuration.

9. The automated instrument of claim 1 , wherein the controller is configured to control the robotic arm to pick-and-place the sample containing receptacle within the automated instrument.

10. The automated instrument of claim 1 , wherein the controller is configured to control the robotic arm to pick-and-place the processing receptacle within the automated instrument.

11. The automated instrument of claim 1 , further comprising:

a movable third rack configured to hold a second sample containing receptacle, the third rack defining a third recess;

a third lock comprising a third locking pin configured to be received in the third recess, the third lock configured to move between a locked configuration and an unlocked configuration, wherein the third lock is configured to be engaged with the third rack in the locked configuration of the third lock to secure the third rack within the automated instrument, wherein the third lock is configured to be disengaged from the third rack in the unlocked configuration of the third lock to allow movement of the third rack within the automated instrument, and wherein the controller is configured to control the robotic arm to engage and move the third lock between the locked configuration and the unlocked configuration.

12. The automated instrument of claim 11 , wherein the controller is configured to control the robotic arm to pick-and-place the second sample containing receptacle within the automated instrument.

13. The automated instrument of claim 1 , further comprising:

a movable third rack configured to hold a second processing receptacle, the third rack defining a third recess;

a third lock comprising a third locking pin configured to be received in the third recess, the third lock configured to move between a locked configuration and an unlocked configuration, wherein the third lock is configured to be engaged with the third rack in the locked configuration of the third lock to secure the third rack within the automated instrument, wherein the third lock is configured to be disengaged from the third rack in the unlocked configuration of the third lock to allow movement of the third rack within the automated instrument, and wherein the controller is configured to control the robotic arm to engage and move the third lock between the locked configuration and the unlocked configuration.

14. The automated instrument of claim 13 , wherein the controller is configured to control the robotic arm to pick-and-place the second processing receptacle within the automated instrument.

15. The automated instrument of claim 1 , further comprising:

a movable holding structure configured to hold a sample processing device, the movable holding structure defining a third recess;

a third lock comprising a third locking pin configured to be received in the third recess, the third lock configured to move between a locked configuration and an unlocked configuration, wherein the third lock is configured to be engaged with the holding structure in the locked configuration to secure the holding structure within the automated instrument, wherein the third lock is configured to be disengaged from the holding structure in the unlocked configuration to allow movement of the holding structure within the automated instrument, and wherein the controller is configured to control the robotic arm to engage and move the third lock between the locked configuration and the unlocked configuration.

16. The automated instrument of claim 15 , wherein the holding structure is a drawer.

17. The automated instrument of claim 15 , wherein the sample processing device is a reagent containing receptacle.

18. The automated instrument of claim 15 , wherein the sample processing device is a pipette tip.

19. The automated instrument of claim 17 , wherein the controller is configured to control the robotic arm to pick-and-place the reagent containing receptacle within the automated instrument.

20. The automated instrument of claim 18 , wherein the controller is configured to control the robotic arm to engage and move the pipette tip within the automated instrument.