IP Library Granted Patent US 9,748,075
Granted Patent B2
US 9,748,075 · App. 15/225,491 · Granted Aug 29, 2017

Apparatus for manufacturing template and method for manufacturing template

Inventor: Tetsuo Takemoto (Kanagawa-ken, JP)
Assignee: Toshiba Memory Corporation
H01J37/3211H01J37/32082H01J37/32568H01J37/32715H01J37/32834H01J2237/3341
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Quick Facts
Patent No.
US 9,748,075
App. No.
15/225,491
Granted
Aug 29, 2017
Kind
B2
Abstract

According to one embodiment, an apparatus for manufacturing a template includes a vacuum chamber, an electrode and an adjustor. The vacuum chamber includes an inlet and an exhaust port of a reactive gas. The vacuum chamber is capable of maintaining an atmosphere depressurized below atmospheric pressure. The electrode is provided in an interior of the vacuum chamber. A high frequency voltage is applied to the electrode. A substrate is placed on the electrode. The substrate has a back surface on a side of the electrode. A recess is provided in the back surface. The adjustor is inserted into the recess. The adjustor is insulative.

Claims (34)

1. An apparatus for manufacturing a template, comprising:

a vacuum chamber including an inlet and an exhaust port of a reactive gas, the vacuum chamber being capable of maintaining an atmosphere depressurized below an atmospheric pressure;

an electrode, provided in an interior of the vacuum chamber, for receiving a high frequency voltage to be applied thereto, a substrate to form the template being placed on the electrode, the substrate having a back surface on a side of the electrode, a recess being provided in the back surface;

an adjustor being configured to be inserted into the recess, the adjustor being an insulator; and

a guide plate provided in a peripheral portion of an upper surface of the electrode to guide the substrate, the guide plate being insulative;

wherein

a side surface of the adjustor conforms to an inner surface of the recess.

2. The apparatus according to claim 1 , wherein at least one of the adjustor and the guide plate includes SiO 2 .

3. The apparatus according to claim 1 , wherein at least one of the adjustor and the guide plate includes quartz including TiO 2 .

4. The apparatus according to claim 1 , wherein the guide plate is formed of a same material as the adjustor.

5. The apparatus according to claim 1 , wherein the guide plate has a step-like portion having a difference in levels.

6. The apparatus according to claim 5 , wherein the difference in levels is not less than 0.15 mm and not more than 0.20 mm.

7. The apparatus according to claim 1 , wherein the adjustor is provided in a plurality, and the plurality of adjustors are inserted into the recess.

8. The apparatus according to claim 1 , wherein a configuration of the adjustor when projected onto a plane parallel to an upper surface of the electrode is a dot configuration arranged two-dimensionally in the plane.

9. The apparatus according to claim 1 , further comprising an inductively coupled plasma high frequency coil additionally provided In the vacuum chamber above the electrode.

10. The apparatus according to claim 1 , wherein the reactive gas includes at least one selected from a fluorine-based gas and an oxygen gas.

11. An apparatus for manufacturing a template using a substrate, comprising:

a vacuum chamber including an inlet and an exhaust port of a reactive gas, the vacuum chamber being capable of maintaining an atmosphere depressurized below an atmospheric pressure;

an electrode, provided In an interior of the vacuum chamber, for receiving a high frequency voltage to be applied thereto; and

an adjustor provided on the electrode, the adjustor being an insulator, the adjustor having a constant thickness, the adjustor having an upper surface and a side surface, the upper surface and the side surface being exposed to the interior of the vacuum chamber, the adjustor being configured to be inserted in a recess of the substrate.

12. The apparatus according to claim 11 , wherein the electrode has a first surface contacting the adjustor, and the first surface is wider than the upper surface of the adjustor.

13. The apparatus according to claim 11 , wherein the adjustor has a lower surface, and all region of the lower surface contacts the electrode.

14. The apparatus according to claim 11 , wherein the adjustor is formed of a same material as the substrate.

15. The apparatus according to claim 11 , wherein the adjustor includes SiO 2 .

16. The apparatus according to claim 11 , wherein the adjustor includes quartz including TiO 2 .

17. The apparatus according to claim 11 , further comprising a guide plate provided in a peripheral portion of an upper surface of the electrode to guide the substrate, the guide plate being insulative.

18. The apparatus according to claim 1 , wherein the adjustor is formed of a same material as the substrate.

19. The apparatus according to claim 1 , wherein a configuration of the adjustor has a constant thickness.

20. The apparatus according to claim 1 , wherein the adjustor is directly provided on the electrode.

21. The apparatus according to claim 1 , wherein an upper surface of the adjustor is separated from a bottom surface of the recess.

22. The apparatus according to claim 11 , wherein the adjustor is directly provided on the electrode.

23. The apparatus according to claim 11 , wherein the upper surface of the adjustor is separated from a bottom surface of a substrate placed on the electrode.

24. The apparatus according to claim 1 , wherein the substrate is a single piece.

25. The apparatus according to claim 1 , wherein the adjustor has the same electrical characteristics as the substrate.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE POSTAL CODE PREVIOUSLY RECORDED ON REEL 042910 FRAME 0321. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 1, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043747/0290 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 5, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 042910/0321 →
Priority Claims (1)
JP 2011-221841 · Oct 6, 2011 · national
Continuity (2)
Continuation 13595111 · Aug 27, 2012
Related Publication 20160343543A1 · Nov 24, 2016