Semiconductor memory device that determines a deterioration level of memory cells and an operation method thereof

1. A semiconductor memory device, comprising:

a memory cell unit including a plurality of blocks, each of the blocks including a plurality of pages; and

a circuit configured to

count a number of activated or non-activated memory cells in one or more pages when a first voltage is applied to gates of memory cells of said one or more pages to read data therefrom,

count a number of activated or non-activated memory cells in said one or more pages when a second voltage different from the first voltage is applied to the gates of the memory cells of said one or more pages to read data therefrom,

compare the counted numbers, and

store, in a register, data about deterioration of the memory cells of said one or more pages depending on a comparison result.

2. The semiconductor memory device according to claim 1 , wherein

when a difference between the counted number is smaller than a predetermined value, data indicating no deterioration of the memory cells of said one or more pages is stored in the register, and

when the difference is greater than the predetermined value, data indicating deterioration of the memory cells of said one or more pages are stored in the register.

3. The semiconductor memory device according to claim 2 , further comprising:

a row decoder configured to select a page to be accessed, wherein

a flag is set, in the row decoder, for a block including said one or more pages when the difference is greater than the predetermined value.

4. The semiconductor memory device according to claim 3 , wherein

the setting of the flag prevents the row decoder from selecting pages of the block for which the flag has been set.

5. The semiconductor memory device according to claim 3 , further comprising:

a sequencer configured to move data stored in the block for which the flag is set, to another block.

6. The semiconductor memory device according to claim 3 , wherein

when the difference is greater than the predetermined value, data indicating that the block including said or more pages is defective are stored in one of the blocks.

7. The semiconductor memory device according to claim 2 , wherein

when the difference is greater than the predetermined value and smaller than a second predetermined value, data indicating that the memory cells of said one or more pages are in a first deterioration level are stored in the register, and

when the difference is greater than the second predetermined value, data indicating that the memory cells of said one or more pages are in a second deterioration level that is worse than the first deterioration level are stored in the register.

8. The semiconductor memory device according to claim 1 , wherein

the circuit is further configured to select said one or more pages for which the numbers of activated or non-activated memory cells are counted, based on a command received from a controller connected to the semiconductor memory device.

9. The semiconductor memory device according to claim 1 , wherein

the circuit is further configured to select, on its own determination, said one or more pages for which the numbers of activated or non-activated memory cells are counted.

10. The semiconductor memory device according to claim 9 , wherein

the circuit selects said one or more pages based on a number of data write times or data read times with respect to each of the pages of the blocks of the memory cell unit.

11. An operation method of a semiconductor memory device including a memory cell unit including a plurality of blocks, each of the blocks including a plurality of pages, the method comprising:

counting a number of activated or non-activated memory cells in one or more pages when a first voltage is applied to gates of memory cells of said one or more pages to read data therefrom;

counting a number of activated or non-activated memory cells in said one or more pages when a second voltage different from the first voltage is applied to the gates of the memory cells of said one or more pages to read data therefrom;

comparing the counted numbers; and

storing, in a register, data about deterioration of the memory cells of said one or more pages depending on a comparison result.

12. The operation method according to claim 11 , further comprising:

when a difference between the counted number is smaller than a predetermined value, storing data indicating no deterioration of the memory cells of said one or more pages, in the register; and

when the difference is greater than the predetermined value, storing data indicating deterioration of the memory cells of said one or more pages, in the register.

13. The operation method according to claim 11 , further comprising:

when the difference is greater than the predetermined value, setting, in a row decoder of the semiconductor memory device, a flag for a block including said one or more pages.

14. The operation method according to claim 13 , wherein the setting of the flag prevents the row decoder from selecting pages of the block for which the flag has been set.

15. The operation method according to claim 13 , further comprising:

moving data stored in the block for which the flag is set, to another block.

16. The operation method according to claim 13 , further comprising:

when the difference is greater than the predetermined value, storing data indicating that the block including said or more pages is defective, in one of the blocks.

17. The operation method according to claim 12 , wherein

when the difference is greater than the predetermined value and smaller than a second predetermined value, data indicating that the memory cells of said one or more pages are in a first deterioration level are stored in the register, and

when the difference is greater than the second predetermined value, data indicating that the memory cells of said one or more pages are in a second deterioration level that is worse than the first deterioration level are stored in the register.

18. The operation method according to claim 11 , further comprising:

selecting said one or more pages for which the numbers of activated or non-activated memory cells are counted, based on a command received from a controller connected to the semiconductor memory device.

19. The operation method according to claim 11 , further comprising:

selecting, on its own determination, said one or more pages for which the numbers of activated or non-activated memory cells are counted.

20. The operation method according to claim 19 , wherein

said one or more pages are selected based on a number of data write times or data read times with respect to each of the pages of the blocks of the memory cell unit.