IP Library Granted Patent US 10,099,346
Granted Patent B1
US 10,099,346 · App. 15/250,363 · Granted Oct 16, 2018

Methods of fabricating a polycrystalline diamond compact

Inventors: Michael A. Vail (Genola, UT); Kenneth E. Bertagnolli (Riverton, UT)
Assignee: US SYNTHETIC CORPORATION
B24D3/04B22F3/16B22F3/24B22F7/06B22F2003/244B22F2005/001B22F2301/15B22F2301/35B22F2302/406B22F2998/10
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Quick Facts
Patent No.
US 10,099,346
App. No.
15/250,363
Granted
Oct 16, 2018
Kind
B1
Abstract

Embodiments relate to PDCs, methods of fabricating PDCs, and applications for such PDCs. In an embodiment, a PDC includes a substrate and a pre-sintered PCD table including an interfacial surface that is bonded to the substrate. The pre-sintered PCD table may be substantially free of leaching by-products in a region at least proximate to the interfacial surface. In an embodiment, a method of fabricating a PDC includes providing an at least partially leached PCD including an interfacial surface. The method includes removing at least some leaching by-products from the at least partially leached PCD table. After removing the at least some leaching by-products, the method includes bonding the interfacial surface of the at least partially leached PCD table to a substrate to form a PDC.

Claims (42)

1. A method, comprising:

providing an at least partially leached polycrystalline diamond body including leaching by-products;

cleaning the at least partially leached polycrystalline diamond body to remove at least some of the leaching by-products from the at least partially leached polycrystalline diamond body;

after cleaning the at least partially leached polycrystalline diamond body,

assembling the least at least partially leached polycrystalline diamond body with an infiltrant to form an assembly;

subjecting the assembly to a high-temperature/high-pressure process, at a temperature of at least about 1000° C. and a pressure of at least about 4 GPa, to infiltrate the at least partially leached polycrystalline diamond body with the infiltrant; and

leaching a portion of the infiltrant from the infiltrated polycrystalline diamond body.

2. The method of claim 1 wherein cleaning the at least partially leached polycrystalline diamond body to remove at least some of the leaching by-products from the at least partially leached polycrystalline diamond body includes subjecting the at least partially leached polycrystalline diamond body to a non-ambient pressure and an elevated temperature effective to remove the at least some of the leaching by-products from the at least partially leached polycrystalline diamond body.

3. The method of claim 2 wherein the non-ambient pressure is a pressure less than ambient pressure.

4. The method of claim 2 wherein the elevated temperature is at least about 600° C.

5. The method of claim 2 wherein subjecting the at least partially leached polycrystalline diamond body to a non-ambient pressure and an elevated temperature effective to remove the at least some of the leaching by-products from the at least partially leached polycrystalline diamond body includes heating the at least partially leached polycrystalline diamond body under partial vacuum conditions.

6. The method of claim 1 wherein the temperature is about 1300° C. to about 1600° C. and the pressure is about 5 GPa to about 8 GPa.

7. The method of claim 1 , further comprising removing at least some leaching by-products generated during the leaching the portion of the infiltrant.

8. The method of claim 1 wherein the infiltrant includes at least one of iron, cobalt, or nickel.

9. A method, comprising:

providing an at least partially leached polycrystalline diamond body including leaching by-products;

cleaning the at least partially leached polycrystalline diamond body to remove at least some of the leaching by-products from the at least partially leached polycrystalline diamond body;

after cleaning the at least partially leached polycrystalline diamond body,

assembling the least at least partially leached polycrystalline diamond body with a substrate including an infiltrant to form an assembly;

subjecting the assembly to a high-temperature/high-pressure process, at a pressure of about 5 GPa or less, to infiltrate the at least partially leached polycrystalline diamond body with the infiltrant and bond the infiltrated polycrystalline diamond body to the substrate; and

leaching a portion of the infiltrant from the infiltrated polycrystalline diamond body to which the substrate is bonded.

10. The method of claim 9 wherein cleaning the at least partially leached polycrystalline diamond body to remove at least some of the leaching by-products from the at least partially leached polycrystalline diamond body includes subjecting the at least partially leached polycrystalline diamond body to a non-ambient pressure and an elevated temperature effective to remove the at least some of the leaching by-products from the at least partially leached polycrystalline diamond body.

11. The method of claim 9 wherein the non-ambient pressure is a partial vacuum.

12. The method of claim 9 wherein the elevated temperature is at least about 600° C.

13. The method of claim 9 wherein the pressure is about 4 GPa to about 5 GPa.

14. The method of claim 9 wherein the infiltrant includes at least one of iron, cobalt, or nickel.

15. The method of claim 9 , further comprising:

forming a polycrystalline diamond body in a high-pressure/high-temperature sintering process; and

at least partially leaching the polycrystalline diamond body of catalyst to form the at least partially leached polycrystalline diamond body.

16. A method, comprising:

providing an at least partially leached polycrystalline diamond body that is substantially free of leaching by-products generated during leaching of a polycrystalline diamond body from which the at least partially leached polycrystalline diamond body is formed;

assembling the least at least partially leached polycrystalline diamond body with a substrate including an infiltrant to form an assembly; and

subjecting the assembly to a high-temperature/high-pressure process, at a pressure of at least about 4 GPa, to infiltrate the at least partially leached polycrystalline diamond body with the infiltrant and bond the infiltrated polycrystalline diamond body to the substrate.

17. The method of claim 16 , further comprising leaching a portion of the infiltrant from the infiltrated polycrystalline diamond body to which the substrate is bonded.

18. The method of claim 17 wherein leaching a portion of the infiltrant from the infiltrated polycrystalline diamond body to which the substrate is bonded includes leaching the infiltrant to a selected leach depth of about 50 μm to about 500 μm.

19. The method of claim 16 wherein the leaching by-products include at least one of an oxide or a salt.

20. The method of claim 16 wherein the high-temperature/high-pressure process is performed at the pressure of about 5 GPa to about 8 GPa and a temperature of about 1300° C. to about 1600° C.

21. The method of claim 16 wherein the infiltrant includes at least one of iron, cobalt, or nickel.

22. The method of claim 16 , further comprising:

forming a polycrystalline diamond body in a high-pressure/high-temperature sintering process;

at least partially leaching the polycrystalline diamond body of catalyst to form the at least partially leached polycrystalline diamond body including leaching by-products; and

cleaning the at least partially leached polycrystalline diamond body to remove at least some of the leaching by-products from the at least partially leached polycrystalline diamond body.

Assignments (5)
SECURITY INTEREST Recorded Jul 18, 2025
From: US SYNTHETIC CORPORATION
To: KEYBANK NATIONAL ASSOCIATION
Reel/Frame 074973/0089 →
RELEASE OF SECURITY INTEREST IN PATENTS Recorded Jul 17, 2025
From: JPMORGAN CHASE BANK, N.A.
To: CHAMPIONX LLC; APERGY ESP SYSTEMS, LLC; APERGY BMCS ACQUISITION CORP; HARBISON-FISCHER, INC.; NORRIS RODS, INC.,; NORRIS RODS, INC.,; NORRISEAL-WELLMARK, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; US SYNTHETIC CORPORATION
Reel/Frame 072004/0019 →
RELEASE OF SECURITY INTEREST Recorded Jun 7, 2022
From: BANK OF AMERICA, N.A.
To: ACE DOWNHOLE, LLC; HARBISON-FISCHER, INC.; NORRIS RODS, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; SPIRIT GLOBAL ENERGY SOLUTIONS, INC.; THETA OILFIELD SERVICES, INC.; APERGY BMCS ACQUISITION CORP.; NORRISEAL-WELLMARK, INC.; US SYNTHETIC CORPORATION; WINDROCK, INC.
Reel/Frame 060305/0001 →
SECURITY INTEREST Recorded Jun 5, 2020
From: ACE DOWNHOLE, LLC; APERGY BMCS ACQUISITION CORP.; HARBISON-FISCHER, INC.; NORRIS RODS, INC.; NORRISEAL-WELLMARK, INC.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; SPIRIT GLOBAL ENERGY SOLUTIONS, INC.; THETA OILFIELD SERVICES, INC.; US SYNTHETIC CORPORATION; WINDROCK, INC.
To: BANK OF AMERICA, N.A.
Reel/Frame 053790/0001 →
SECURITY AGREEMENT Recorded Nov 6, 2019
From: APERGY ESP SYSTEMS, LLC; APERGY BMCS ACQUISITION CORP.; PCS FERGUSON, INC.; QUARTZDYNE, INC.; THETA OILFIELD SERVICES, INC.; US SYNTHETIC CORPORATION; WINDROCK, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 050941/0695 →
Continuity (3)
Continuation 14332126 · Jul 15, 2014
Continuation 12917150 · Nov 1, 2010
Continuation 12120849 · May 15, 2008