Lithography mask production method and lithography mask production system

1. A lithography mask production method comprising:

(a) forming, in a reflection layer of a blank substrate, a reference pattern used as a reference in reflectivity measurement and a reflection pattern used for lithography;

(b) measuring a reflectivity Rref of the reflection layer at the reference pattern and a reflectivity RLS of the reflection layer at the reflection pattern; and

(c) determining an effective width of the reflection layer at the reflection pattern based on the reflectivity Rref and the reflectivity RLS.

2. The method according to claim 1 , further comprising:

(d) forming a side wall protection film at least on side walls of the reflection layer at the reflection pattern between the (a) forming and the (b) measuring,

wherein the effective width of the reflection layer obtained in the (b) measuring and the (c) determining does not include a width of the side wall protection film.

3. The method according to claim 2 ,

wherein the reference pattern and the reflection pattern are formed in the reflection layer based on pattern data prepared in advance,

wherein a width Wml of the reflection layer at the reflection pattern is obtained based on the following equation,

Wml =( RLS/R ref)× Pls   (2)

where Pls is a pitch of the pattern data, and

wherein in the measuring (b), a width Wlp of the reflection layer including the side wall protection film is measured and a width Wsc of the side wall protection film is obtained based on of the following relationship,

Wsc =( Wlp−Wml )/2.

4. The method according to claim 1 ,

wherein the reference pattern and the reflection pattern are formed on the reflection layer based on pattern data prepared in advance, and

wherein a width Wml of the reflection layer at the reflection pattern is obtained based on the following equation,

Wml =( RLS/R ref)× Pls   (2)

where Pls is a pitch of the pattern data.

5. The method according to claim 1 , further comprising:

(d) determining, after the measuring (b), whether the effective width of the reflection layer obtained in the measuring (b) falls within an allowable range,

wherein the determination result in (d) is used for feedforward control in production of subsequent lithography masks.

6. The method according to claim 1 ,

wherein the reflectivity Rref is measured at first measurement spot on the reference pattern,

wherein the reflectivity RLS is measured at a second measurement spot on the reflection pattern, and

wherein a plane size of the first measurement spot and a plane size of the second measurement spot are smaller than a plane size of the reference pattern and a plane size of the reflection pattern, respectively.

7. The method according to claim 6 ,

wherein a size of the first measurement spot is equal to a size of the second measurement spot.

8. A lithography mask production method comprising:

(a) forming, in a reflection layer of a blank substrate, a reference pattern used as a reference in reflectivity measurement and a reflection pattern used for lithography; and

(b) measuring a reflectivity Rref of the reflection layer included in the reference pattern and a reflectivity RLS of the reflection layer included in the reflection pattern;

(c) determining an effective width of the reflection layer included in the reflection pattern based on the reflectivity Rref and the reflectivity RLS;

(d) determining whether the effective width falls within an allowable range; and

(e) adjusting a processing condition in forming the reference pattern and the reflection pattern according to whether or not the effective width falls outside the allowable range.

9. The method according to claim 8 , further comprising:

(f) forming a side wall protection film at least on side walls of the reflection layer at the reflection pattern between the (a) forming and the (b) measuring,

wherein the effective width of the reflection layer obtained in the (b) measuring and the (c) determining does not include a width of the side wall protection film.

10. The method according to claim 8 , wherein

the reflectivity Rref is measured at first measurement spot on the reference pattern,

wherein the reflectivity RLS is measured at a second measurement spot on the reflection pattern, and

wherein a plane size of the first measurement spot and a plane size of the second measurement spot are smaller than a plane size of the reference pattern and a plane size of the reflection pattern, respectively.

11. The method according to claim 10 , wherein a size of the first measurement spot is equal to a size of the second measurement spot.