Maintenance operations in a DRAM
A system includes a memory controller and a memory device having a command interface and a plurality of memory banks, each with a plurality of rows of memory cells. The memory controller transmits an auto-refresh command to the memory device. Responsive to the auto-refresh command, during a first time interval, the memory device performs refresh operations to refresh the memory cells and the command interface of the memory device is placed into a calibration mode for the duration of the first time interval. Concurrently, during at least a portion of the first time interval, the memory controller performs a calibration of the command interface of the memory device. The auto-refresh command may specify an order in which memory banks of the memory device are to be refreshed, such that the memory device sequentially refreshes a respective row in the plurality of memory banks in the specified bank order.
1. A method of operating a memory device, the memory device including a command interface and a plurality of memory banks, each bank including a plurality of rows of memory cells, the method comprising:
receiving, at the command interface, a refresh command from a memory controller, along with a plurality of bits;
responsive to the refresh command, during a first time interval, performing a refresh operation to refresh data stored in at least one bank of the plurality of memory banks, the plurality of bits to identify at least one bank as a first bank of the plurality of banks to be refreshed in a sequence;
receiving an operation code from the memory controller, the operation code specifying a calibration operation of the command interface; and
in response to receiving the operation code, performing the calibration operation of the command interface while performing the refresh operation in the at least one bank identified by the plurality of bits.
2. The method of claim 1 , including, in response to receiving the operation code, configuring the command interface to perform the calibration operation.
3. The method of claim 1 , wherein configuring the command interface to perform the calibration operation includes placing the command interface into a loopback mode.
4. The method of claim 1 , wherein the refresh operation is specified as an auto-refresh operation, wherein a row of memory cells is refreshed in the at least one bank identified by the plurality of bits.
5. The method of claim 1 wherein the plurality of bits includes a plurality of fields indicating the order in which the plurality of banks are to be refreshed in the sequence, the plurality of fields including a first field to specify the first bank in the sequence and a second field to specify a second bank in the sequence.
6. The method of claim 1 , further comprising, while the calibration of the command interface is being performed, concurrently receiving a calibration pattern from the memory controller on a first path and transmitting data to the memory controller on a second path.
7. The method of claim 6 , wherein performing the calibration of the command interface includes performing a timing calibration.
8. The method of claim 7 , wherein performing the timing calibration comprises:
receiving from the memory controller, at the command interface of the memory device, the calibration pattern on the first path; and
transmitting from the memory device to the memory controller the received calibration pattern on the second path.
9. The method of claim 1 , wherein the refresh command specifies a bank order for the plurality of memory banks, and wherein responsive to the refresh command, the memory device sequentially refreshes a respective row in the plurality of memory banks, in the specified bank order, wherein the specified bank order specifies a respective memory bank, of the plurality of memory banks, that is to be refreshed first in response to the self-refresh command.
10. The method of claim 1 , wherein performing the calibration operation of the command interface includes performing an offset voltage calibration including:
determining a value representing a receiver voltage offset for a sampler of the memory device; and
storing the value in the memory device.
11. A memory device comprising:
a plurality of memory banks, each bank including a plurality of rows of memory cells;
a command interface operable to accept commands from a memory controller;
refresh circuitry configured to perform, during a first time interval, a refresh operation to refresh data stored in at least one bank of the plurality of memory banks in response to a refresh command from the memory controller, at least one bank being identified, in response to a plurality of bits received from the memory controller, as a first bank of the plurality of banks to be refreshed in a sequence; and
control logic configured to enable the command interface to perform a calibration operation while performing the refresh operation in the at least one bank identified by the plurality of bits, the calibration operation being specified by an operation code received from the memory controller.
12. The memory device of claim 11 , wherein the refresh circuitry is configured to perform the calibration operation in response to receiving the operation code.
13. The memory device of claim 11 , wherein configuring the command interface to perform the calibration operation includes placing the command interface into a loopback mode.
14. The memory device of claim 11 , wherein the refresh operation is specified as an auto-refresh operation, wherein a row of memory cells is refreshed in the at least one bank identified by the plurality of bits.
15. The memory device of claim 11 , wherein the plurality of bits includes a plurality of fields indicating the order in which the plurality of banks are to be refreshed in the sequence, the plurality of fields including a first field to specify the first bank in the sequence and a second field to specify a second bank in the sequence.
16. The memory device of claim 11 , further comprising a circuit to receive a calibration pattern from the memory controller on a first path and transmit data from the memory device on a second path during the calibration operation.
17. The memory device of claim 16 , further comprising a circuit to perform a timing calibration operation of the command interface.
18. The memory device of claim 17 , further comprising:
a circuit to receive from the memory controller, at the command interface of the memory device, the calibration pattern on the first path; and
a circuit to transmit from the memory device to the memory controller the received calibration pattern on the second path.
19. The memory device of claim 11 , further comprising a circuit perform an offset voltage calibration by determining a value representing a receiver voltage offset for a sampler of the memory device and storing the value in the memory device.
20. A memory device comprising:
a plurality of memory banks, each bank including a plurality of rows of memory cells;
a command interface operable to accept commands from a memory controller;
means for performing, during a first time interval, a refresh operation to refresh data stored in at least one bank of the plurality of memory banks in response to a refresh command from the memory controller, at least one bank being identified, in response to a plurality of bits received from the memory controller, as a first bank of the plurality of banks to be refreshed in a sequence; and
means for enabling the command interface to perform a calibration operation during at least a portion of the first time interval, the calibration operation being specified by an operation code received from the memory controller.