Non-volatile semiconductor storage device
According to one embodiment, there is provided a non-volatile semiconductor storage device including a non-volatile memory, a monitoring section, a determining section, and a notification processing section. The non-volatile memory includes a plurality of memory cells driven by word lines and a voltage generating section that generates a read voltage to be applied to the word lines. The monitoring section monitors a change in a threshold distribution of the plurality of memory cells upon performing a read processing to read data from the plurality of memory cells by applying the read voltage to the word lines. The determining section determines a degree of deterioration of the non-volatile memory in accordance with a monitoring result by the monitoring section. The notification processing section notifies a life of the non-volatile memory in accordance with a determining result by the determining section.
1. A memory system communicating with a host apparatus, the memory system comprising:
a nonvolatile semiconductor memory; and
a controller circuit being configured to receive a read request from the host apparatus,
wherein the controller circuit is configured, in response to the read request, to:
perform a first read operation from the nonvolatile semiconductor memory;
determine whether a first error in first data read by the first read operation is uncorrectable;
if the first error is uncorrectable, perform a second read operation to read from an address of the nonvolatile semiconductor memory from which the first data has been read; and
count the second read operation in a number of retry read operations; and
the controller circuit is configured to send, to the host apparatus, information obtained in accordance with a result of the counting the second read operation in the number of the retry read operations.
2. The memory system according to claim 1 , wherein
the controller circuit is further configured, in response to the read request, to:
determine whether a second error in second data read by the second read operation is uncorrectable;
if the second error is uncorrectable, perform a third read operation to read from the address of the nonvolatile semiconductor memory from which the first data has been read; and
count the third read operation in the number of the retry read operations.
3. The memory system according to claim 1 , wherein
the information relates to degree of deterioration of the memory system.
4. The memory system according to claim 1 , wherein
the controller circuit compares the number of the retry read operations with a predetermined value, and
the information indicates a result of the comparison.
5. The memory system according to claim 1 , wherein
the nonvolatile semiconductor memory includes:
a word line; and
a plurality of memory cells connected to the word line,
in a case that the controller circuit performs the first read operation from the nonvolatile semiconductor memory, a first voltage is applied to the word line, and
in a case that the controller circuit performs the second read operation from the nonvolatile semiconductor memory, a second voltage is applied to the word line, the second voltage being different from the first voltage.
6. The memory system according to claim 1 , wherein
the nonvolatile semiconductor memory includes a plurality of memory cells, and
each of the plurality of memory cells is able to store two or more than two bits of data.
7. The memory system according to claim 1 , wherein
the nonvolatile semiconductor memory is a NAND type flash memory.
8. The memory system according to claim 1 , wherein
the nonvolatile semiconductor memory includes:
a word line; and
a plurality of memory cells connected to the word line,
in a case that the controller circuit performs the first read operation from the nonvolatile semiconductor memory, a first voltage is applied to the word line, and
in a case that the controller circuit performs the second read operation from the nonvolatile semiconductor memory, a second voltage is applied to the word line, the second voltage being substantially equal to the first voltage.
9. The memory system according to claim 2 , wherein
the nonvolatile semiconductor memory includes:
a word line; and
a plurality of memory cells connected to the word line,
in a case that the controller circuit performs the first read operation from the nonvolatile semiconductor memory, a first voltage is applied to the word line, and
in a case that the controller circuit performs the second read operation from the nonvolatile semiconductor memory, a second voltage is applied to the word line, the second voltage being different from the first voltage, and
in a case that the controller circuit performs the third read operation from the nonvolatile semiconductor memory, a third voltage is applied to the word line, the third voltage being different from the first voltage, the third voltage being different from the second voltage.
10. The memory system according to claim 4 , wherein
the controller circuit compares the number of the retry read operations with a reading number threshold and determines the degree of deterioration of the memory system in accordance with a result of the comparison.
11. The memory system according to claim 10 , wherein
the controller circuit identifies a distribution of the number of the retry read operations, compares a frequency of the number of the retry read operations with a frequency threshold, and determines the degree of deterioration of the memory system in accordance with a result of the comparison.