IP Library Granted Patent US 10,660,528
Granted Patent B2
US 10,660,528 · App. 15/257,885 · Granted May 26, 2020

Method of using an in vivo sensor having differential material properties

Inventors: Steven R. Bailey (San Antonio, TX); Christopher T. Boyle (Flushing, NY); Denes Marton (San Antonio, TX); Christopher E. Banas (Breckenridge, CO)
Assignee: Vactronix Scientific, LLC
A61B5/02035A61B5/01A61B5/0215A61B5/055A61B5/0507A61B5/076A61B5/1473A61B5/4842A61B5/6862A61B5/6876A61B6/12A61B8/0841A61F2/82A61F2/91A61F2/958A61L27/04A61L31/022A61B5/02A61B5/021A61B5/02427A61B5/145A61B5/14503A61B5/14532A61B5/6846A61B2562/0247A61B2562/0276A61B2562/12A61B2562/164A61F2002/4672A61F2210/0014A61F2210/0023A61F2210/0042A61F2210/0076A61F2250/0001A61F2250/0004A61F2250/0014A61F2250/0018A61F2250/0029A61F2250/0035A61F2250/0042A61F2250/0067A61F2250/0068A61F2250/0096A61F2250/0098A61F2310/00023B23K1/19
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Quick Facts
Patent No.
US 10,660,528
App. No.
15/257,885
Granted
May 26, 2020
Kind
B2
Abstract

Implantable in vivo sensors used to monitor physical, chemical or electrical parameters within a body. The in vivo sensors are integral with an implantable medical device and are responsive to externally or internally applied energy. Upon application of energy, the sensors undergo a phase change in at least part of the material of the device which is then detected external to the body by conventional techniques such as radiography, ultrasound imaging, magnetic resonance imaging, radio frequency imaging or the like. The in vivo sensors of the present invention may be employed to provide volumetric measurements, flow rate measurements, pressure measurements, electrical measurements, biochemical measurements, temperature, measurements, or measure the degree and type of deposits within the lumen of an endoluminal implant, such as a stent or other type of endoluminal conduit. The in vivo sensors may also be used therapeutically to modulate mechanical and/or physical properties of the endoluminal implant in response to the sensed or monitored parameter.

Claims (12)

1. A method of using a sensor device, the method comprising the steps of:

inserting the sensor device into a lumen, wherein the sensor device comprises a plurality of sensor structural elements and a plurality of device structural elements, the plurality of sensor structural elements being formed as at least one vacuum deposited layer extending from or integral to at least some of the plurality of device structural elements, at least some of the plurality of sensor structural elements having either a first region with a first region geometry or first region conformation, the first region being composed of a first material, the first material having a first transition temperature and a first transition coefficient, or at least some of the plurality of sensor structural elements having a second region with a second region geometry or second region conformation, the second region being composed of a second material wherein the second material comprises at least one of a shape memory material and a superelastic material, the second material having a second transition temperature higher than the first transition temperature or a second transition coefficient higher than the first transition coefficient;

applying an internal or external thermal force to the sensor device;

increasing the temperature of the second material with the internal or external thermal force to exceed the second transition temperature;

changing the second region geometry or second region conformation and further changing the positioning of the second region relative to the first region geometry or first region conformation; and

detecting a change in the second region geometry or second region conformation with a detection mechanism.

2. The method as defined in claim 1 , further comprising a step of remodeling the sensor device after the step of changing the second region geometry or second region conformation and further changing the positioning of the second region relative to the first region geometry or first region conformation or after the step of detecting a change in the second region geometry or second region conformation with a detection mechanism, wherein the step of remodeling the sensor device comprises re-applying the external thermal force or internal thermal force or applying a second external thermal force or a second internal thermal force to the sensor device to make additional changes to the second region geometry or second region conformation.

3. The method as defined in claim 2 , wherein the step of remodeling the sensor device further comprises altering stress or strain applied to the sensor device through the application of the external thermal force or internal thermal force or the second external thermal force or the second internal thermal force.

4. The method as defined in claim 2 , wherein the step of remodeling the sensor device comprises selecting and applying the second external thermal force wherein the second external thermal force is selected from the following: ultrasound, irradiation, microwave, ultrasound, RF, ultraviolet, infrared, magnetic resonance, x-ray irradiation and gamma irradiation and applying the selected second external force to the sensor device.

5. The method as defined in claim 1 , wherein the step of applying the internal or external thermal force further comprises selecting and applying an external thermal force and the external thermal force causes an excitatory signal that induces molecular vibrations of the sensor device and wherein the step further comprises cooling of the sensor device through dampening the molecular vibrations of the sensor device.

6. The method as defined in claim 5 , wherein dampening the molecular vibrations of the sensor device comprises shifting a frequency of the excitatory signal of the external thermal force by 180 degrees.

7. The method as defined in claim 1 , wherein the first material comprises a shape memory material.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2018
From: VACTRONIX SCIENTIFIC, INC.
To: VACTRONIX SCIENTIFIC, LLC
Reel/Frame 046203/0682 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 3, 2018
From: ADVANCED BIO PROSTHETIC SURFACES, LTD., A WHOLLY OWNED SUBSIDIARY OF PALMAZ SCIENTIFIC, INC.
To: VACTRONIX SCIENTIFIC, INC.
Reel/Frame 045709/0763 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 29, 2018
From: BAILEY, STEVEN R.; BOYLE, CHRISTOPHER T.; MARTON, DENES; BANAS, CHRISTOPHER E.
To: ADVANCED BIO PROSTHETIC SURFACES, LTD.
Reel/Frame 045383/0724 →
Continuity (3)
Continuation 13596923 · Aug 28, 2012
Continuation 09783633 · Feb 14, 2001
Related Publication 20170086683A1 · Mar 30, 2017