IP Library Patent Application 15263812
Patent Application
App. No. 15/263,812

Methods to Reduce Case Height for Capacitors

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Patent No.
US None
App. No.
15/263,812
Abstract

A method for forming a high aspect ratio sintered powder anode with low warpage, an anode made thereby and a cathode comprising the anode are provided. The method comprises placing a multiplicity of anode precursors on a forming substrate in a common plane wherein no more than 10% of the anode precursors are out of the common plane. A second substrate is then placed over the forming substrate with the anode precursors between the forming substrate and the second substrate thereby forming a sandwiched assembly. The sandwiched assembly is heated to a sintering temperature of the anode precursors thereby forming the sintered powder anodes. The and sintered powder anodes are removed from between the forming substrate and the second substrate.

Claims (58)

1 . A method for forming a high aspect ratio sintered powder anodes with low warpage comprising:

placing a multiplicity of anode precursors on a forming substrate in a common plane wherein no more than 10% of said anode precursors are out of said common plane;

placing a second substrate over said forming substrate with said anode precursors between said forming substrate and said second substrate thereby forming a sandwiched assembly;

heating said sandwiched assembly to a sintering temperature of said anode precursors thereby forming said sintered powder anodes; and

removing said sintered powder anodes from between said forming substrate and said second substrate.

2 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein said sandwiched assembly is selected from an engaged sandwich and a separated sandwich.

3 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein said sintered powder anodes have an aspect ratio of at least 10.

4 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 3 wherein said sintered powder anodes have an aspect ratio of at least 20.

5 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein said sintered powder anodes have a warpage of no more than 20% relative to the sintered powder anodes thickness.

6 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 5 wherein said sintered powder anodes have a warpage of no more than 10% relative to the sintered powder anodes thickness. The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 further comprising placing an anode wire in at least one anode precursor of said anode precursors prior to said heating.

8 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 7 wherein said anode wire comprises voids.

9 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 further comprising electrically attaching an anode wire to said sintered powder anodes after at least some said heating.

10 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein at least one of said forming substrate or said second substrate comprises voids.

11 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein said forming substrate or said second substrate comprises at least one anode cavity.

12 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 11 wherein said forming substrate or said second substrate comprises at least one anode wire cavity.

13 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein said anode precursors comprise a material selected from the group consisting of Al, W, Ta, Nb, Ti, Zr, Hf and conductive oxides thereof.

14 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 13 wherein said anode precursors comprise a material selected from the group consisting of Al, Nb, Ta and NbO.

15 . The method for forming a high aspect ratio sintered powder anode with low warpage of claim 1 wherein said sintering is at a temperature of 1,000° C. to less than 1,500° C.

16 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein at least one of said second substrate or said forming substrate comprises a material selected from the group consisting of MgO, Al 2 O 3 , Ta, TaN, Ta 2 O 5 and TaO.

17 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 further comprising dicing at least one sintered powder anode.

18 . The method for forming a high aspect ratio sintered powder anodes with low warpage of claim 1 wherein said sintering temperature is 1,000° C. to less than 1,500° C.

19 . A method for forming a capacitor comprising:

forming a high aspect ratio sintered powder anode with low warpage by:

placing a multiplicity of anode precursors on a forming substrate;

placing a second substrate over said forming substrate with said anode precursors between said forming substrate and said weighted substrate thereby forming a sandwiched assembly;

heating said sandwiched assembly to a sintering temperature of said anode precursors thereby forming at least one said sintered powder anode; and

removing said sintered powder anode from between said forming substrate and said second substrate;

forming a dielectric on said sintered powder anode; and

forming a cathode on said dielectric.

20 . The method for forming a capacitor of claim 19 wherein said sintered powder anode has an aspect ratio of at least 10.

21 . The method for forming a capacitor of claim 20 wherein said sintered powder anode has an aspect ratio of at least 20.

22 . The method for forming a capacitor of claim 19 wherein said sintered powder anode has an warpage of no more than 20% relative to the sintered powder anode thickness.

23 . The method for forming a capacitor of claim 22 wherein said sintered powder anode has an warpage of no more than 10% relative to the sintered powder anode thickness.

24 . The method for forming a capacitor of claim 19 further comprising placing an anode wire in said anode precursor prior to said heating.

25 . The method for forming a capacitor of claim 24 wherein said anode wire comprises voids.

26 . The method for forming a capacitor of claim 19 further comprising electrically attaching an anode wire to said sintered powder anode after at least some said heating.

27 . The method for forming a capacitor of claim 19 wherein at least one of said forming substrate or said second substrate comprises voids.

28 . The method for forming a capacitor of claim 19 wherein said forming substrate or said second substrate comprises at least one anode cavity.

29 . The method for forming a capacitor of claim 19 wherein said forming substrate or said second substrate comprises at least one anode wire cavity.

30 . The method for forming a capacitor of claim 19 wherein said anode precursors comprise a material selected from the group consisting of Al, W, Ta, Nb, Ti, Zr, Hf and conductive oxides thereof.

31 . The method for forming a capacitor of claim 30 wherein said anode precursors comprise a material selected from the group consisting of Al, Nb, Ta and NbO.

32 . The method for forming a capacitor of claim 19 wherein said sintering is at a temperature of 1,000° C. to less than 1,500 ° C.

33 . The method for forming a capacitor of claim 19 wherein at least one of said second substrate or said forming substrate comprises a material selected from the group consisting of MgO, Al 2 O 3 , Ta, TaN, Ta 2 O 5 and TaO.

34 . The method for forming a capacitor of claim 19 wherein said cathode comprises a material selected from manganese dioxide and a conductive polymer.

35 . The method for forming a capacitor of claim 34 wherein said conductive polymer comprises a thiophene.

36 . The method for forming a capacitor of claim 35 wherein said thiophene is polymerized 3,4-polyethylene dioxythiophene.

37 . The method for forming a capacitor of claim 19 wherein said sintering temperature is 1,000° C. to less than 1,500° C.

38 . The method for forming a capacitor of claim 19 further comprising dicing at least one said sintered powder anode.

39 . A capacitor comprising:

a sintered powder anode having an aspect ratio of at least 10 and a warpage of no more than 20%;

an anode wire in electrical contact with said sintered powder anode;

a dielectric on said sintered powder anode; and

a cathode on said dielectric.

40 . The capacitor of claim 39 wherein said aspect ratio is at least 20.

41 . The capacitor of claim 39 wherein said sintered powder anode has an warpage of no more than 20% relative to the anode thickness.

42 . The capacitor of claim 39 wherein said anode wire comprises voids.

43 . The capacitor of claim 39 wherein said sintered powder anode comprises a material selected from the group consisting of Al, W, Ta, Nb, Ti, Zr, Hf and conductive oxides thereof.

44 . The capacitor of claim 43 wherein said sintered powder anode comprises a material selected from the group consisting of Al, Nb, Ta and NbO.

Assignments (3)
RELEASE OF SECURITY INTEREST Recorded Nov 8, 2018
From: BANK OF AMERICA, N.A.
To: KEMET CORPORATION,; KEMET ELECTRONICS CORPORATION; KEMET BLUE POWDER CORPORATION
Reel/Frame 047450/0926 →
SECURITY AGREEMENT Recorded May 22, 2017
From: KEMET CORPORATION; KEMET ELECTRONICS CORPORATION; KEMET BLUE POWDER CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 042523/0639 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 13, 2016
From: MOORE, KEITH LEE; LESSNER, PHILIP M.; STOLARSKI, CHRIS; FIFE, JAMES ALLEN; NING, LIANCAI; WU, LIE; GU, PEIHONG; REDDY, SIVA JYOTH
To: KEMET ELECTRONICS CORPORATION
Reel/Frame 039718/0730 →