IP Library Granted Patent US 10,367,118
Granted Patent B2
US 10,367,118 · App. 15/266,249 · Granted Jul 30, 2019

Light-emitting diode

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Quick Facts
Patent No.
US 10,367,118
App. No.
15/266,249
Granted
Jul 30, 2019
Kind
B2
Abstract

A light-emitting diode, comprises an active layer for emitting a light ray; an upper semiconductor stack on the active layer, wherein the upper semiconductor stack comprises a window layer; a reflector; and a lower semiconductor stack between the active layer and the reflector; wherein the thickness of the window layer is small than or equal to 3 μm, and the thickness of the lower semiconductor stack is small than or equal to 1 μm.

Claims (24)

1. A light-emitting diode, comprising:

an active layer;

an upper semiconductor stack on the active layer and comprising a window layer; and

a lower semiconductor stack below the active layer and comprising multiple semiconductor layers which combined have a thickness smaller than or equal to 1 μm,

wherein the multiple semiconductor layers comprise a confining layer below the active layer, a cladding layer below the confining layer, a buffer layer below the cladding layer and a lower contact layer below the cladding layer.

2. The light-emitting diode according to claim 1 , wherein the active layer emits a light ray having a peak wavelength and one of the multiple semiconductor layers has a thickness larger than one seventh of the peak wavelength λ in air.

3. The light-emitting diode according to claim 1 , wherein the window layer is thicker than the lower semiconductor stack.

4. The light-emitting diode according to claim 1 , wherein the lower contact layer comprises GaP.

5. The light-emitting diode according to claim 1 , wherein the active layer emits a light ray having a peak wavelength and the lower contact layer has a thickness smaller than one seventh of the peak wavelength.

6. The light-emitting diode according to claim 1 , wherein each of the multiple semiconductor layers has a refractive index between 2.9 and 3.5.

7. The light-emitting diode according to claim 1 , wherein the window layer comprises (Al B Ga 1-g ) 0.5 As 0.5 , 0.25<g<0.35 or (Al d Ga 1-d ) 0.5 In 0.5 P, 0.65<d<0.75.

8. The light-emitting diode according to claim 1 , further comprising a reflector below the lower semiconductor stack and comprising an insulating layer contacting the lower semiconductor stack, wherein the insulating layer has a refractive index lower than 1.5.

9. The light-emitting diode according to claim 8 , wherein the insulating layer comprises SiNx, SiO 2 , MgF 2 , or combination thereof.

10. The light-emitting diode according to claim 8 , wherein the reflector further comprises a transparent conductive layer contacting the lower semiconductor.

11. The light-emitting diode according to claim 8 , wherein a distance between the reflector and the active layer is between 200 nm and 1 μm.

12. The light-emitting diode according to claim 8 , further comprising a substrate and bonding layer adhering the substrate and the reflector.

13. The light-emitting diode according to claim 1 , wherein the active layer emits a light ray having a peak wavelength between 720 nm and 940 nm.

14. The light-emitting diode according to claim 1 , wherein the widow layer has a thickness between 2 μm and 3 μm.

15. The light-emitting diode according to claim 1 , wherein the window layer comprises a roughened surface.

16. The light-emitting diode according to claim 1 , wherein the thickness of the lower semiconductor stack is between 200 nm and 1 μm.

17. The light-emitting diode according to claim 1 , wherein the active layer comprises well layers and barrier layers laminated alternately, and a thickness of the well layer is between 20Å and 100Å.

18. The light-emitting diode according to claim 1 , wherein the thickness of the confining layer is between 80 nm and 300 nm.

19. The light-emitting diode according to claim 1 , wherein the thickness of the cladding layer is between 80 nm and 500 nm.

20. The light-emitting diode according to claim 1 , wherein the thickness of the lower contact layer is between 20 nm and 80 nm.

Assignments (1)
CHANGE OF NAME Recorded Apr 22, 2026
From: EPISTAR CORPORATION
To: ENNOSTAR CORPORATION
Reel/Frame 075513/0783 →