Frequency difference determination
View Patent ↗A receiver having a test signal generator configured to generate a test signal that free of a requirement to be frequency locked, and to measure a frequency of the test signal; and a local oscillator signal source configured to tune a local oscillator signal to a difference frequency with respect to the measured test signal frequency, wherein the difference frequency falls within a passband of a passband filter of the receiver.
1. A receiver, comprising:
a test signal generator configured to generate a test signal that is free of a requirement to be frequency locked, and to measure a frequency of the test signal; and
a local oscillator signal source configured to tune a local oscillator signal to a difference frequency with respect to the measured test signal frequency,
wherein the difference frequency falls within a passband of a passband filter of the receiver.
2. The receiver of claim 1 , wherein the test signal generator comprises a frequency source configured to generate the test signal, and is on-board.
3. The receiver of claim 2 , wherein the frequency source comprises a plurality of frequency sources having respective frequency ranges.
4. The receiver of claim 2 , wherein the test signal generator further comprises:
a voltage regulator configured to tune a supply voltage of the frequency source.
5. The receiver of claim 2 , wherein the frequency source comprises one or more ring oscillators.
6. The receiver of claim 1 , wherein the test signal generator comprises:
a frequency counter configured to measure the frequency of the test signal.
7. The receiver of claim 1 , further comprising:
a quadrature demodulator configured to demodulate the test signal with the local oscillator signal and output a baseband In-phase Quadrature (I/Q) output signal.
8. The receiver of claim 7 , further comprising:
a memory configured to store data samples of the baseband I/Q output signal for at least one baseband signal cycle.
9. The receiver of claim 8 , wherein the memory comprises a plurality of memories.
10. The receiver of claim 8 , wherein the memory is further configured to store the baseband I/Q output signal data samples asynchronously or nonconsecutively, with I/Q data sample doublets remaining linked.
11. The receiver of claim 1 , wherein the test signal generator comprises:
a frequency divider configured to divide the frequency of the test signal by a division factor.
12. The receiver of claim 11 , further comprising:
a Phase Locked Loop (PLL) configured to generate the local oscillator signal based on an output of the frequency divider.
13. A Built-In Self-Test (BIST) method for tuning a local oscillator signal in a receiver, the method comprising:
generating, by a test signal generator, a test signal that is free of a requirement to be frequency locked;
measuring, by the test signal generator, a frequency of the test signal; and
tuning, by a local oscillator signal source, a local oscillator signal to a difference frequency with respect to the measured test signal frequency,
wherein the difference frequency falls within a passband of a passband filter of the receiver.
14. The BIST method of claim 13 , wherein the generating the test signal comprises generating the test signal by a frequency source.
15. The BIST method of claim 14 , wherein the generating the test signal comprises generating the test signal by a plurality of frequency sources having respective frequency ranges.
16. The BIST method of claim 14 , further comprising:
tuning, by a voltage regulator, a supply voltage of the frequency source.
17. The BIST method of claim 14 , wherein the generating the test signal comprises generating the test signal by one or more ring oscillators.
18. The BIST method of claim 13 , further comprising:
demodulating, by a quadrature demodulator, the test signal with the local oscillator signal, and outputting a baseband In-phase Quadrature (I/Q) output signal; and
storing, in a memory, samples of the baseband I/Q output signal for at least one baseband signal cycle.
19. The BIST method of claim 18 , wherein the tuning comprises:
converting the baseband I/Q output signal data samples into polar coordinates; and
subtracting an average radius of data sample polar coordinates of a second angle from an average radius of data sample polar coordinates of a first angle, wherein the second angle differs from the first angle by 90 degrees, and the subtraction result is an I/Q phase imbalance of the I/Q receiver.
20. The BIST method of claim 18 , wherein the storing comprises storing the baseband I/Q output signal data samples in a plurality of memories.
21. The BIST method of claim 18 , wherein the storing comprises storing the baseband I/Q output signal data samples asynchronously or nonconsecutively, with I/Q data sample doublets remaining linked.
22. The BIST method of claim 13 , further comprising:
dividing, by a frequency divider, the frequency of the test signal by a division factor.
23. The BIST method of claim 22 , further comprising:
generating, by a Phase Locked Loop (PLL), the local oscillator signal based on an output of the frequency divider.
24. The BIST method of claim 13 , wherein the method is performed in the field.
25. The BIST method of claim 13 , further comprising:
determining I/Q imbalances based on the difference frequency.