IP Library Granted Patent US 9,964,579
Granted Patent B2
US 9,964,579 · App. 15/312,085 · Granted May 8, 2018

Voltage detection apparatus

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Quick Facts
Patent No.
US 9,964,579
App. No.
15/312,085
Granted
May 8, 2018
Kind
B2
Abstract

An object of the present invention is to diagnose a state of a voltage divider while performing a normal measurement to improve reliability. A voltage detection apparatus according to the present invention includes: a first resistor for dividing voltage of a detection unit into a first divided voltage value; and a test pattern insertion circuit unit including a second resistor for dividing the first divided voltage value into a second divided voltage value and a switching device, wherein the test pattern insertion circuit unit is connected to an equipotential connection point to the first divided voltage value, and wherein a state of the first resistor is detected based on the second divided voltage value when the switching device is conductive.

Claims (43)

1. A voltage detection apparatus comprising:

a first resistor for dividing voltage of a detection unit into a first divided voltage value; and

a test pattern insertion circuit unit including a second resistor for dividing the first divided voltage value into a second divided voltage value and a switching device, wherein

the test pattern insertion circuit unit is connected to an equipotential connection point to the first divided voltage value, and

a state of the first resistor is detected based on the second divided voltage value when the switching device is conductive,

the test pattern circuit unit includes a first test pattern circuit unit connected to a positive side of the detection unit and a second test pattern circuit unit connected to a negative side of the detection unit,

a first terminal of the first test pattern circuit unit is connected to an equipotential connection point to the first divided voltage value, and a second terminal of the first test pattern circuit unit is grounded,

a first terminal of the second test pattern circuit unit is connected to an equipotential connection point to the first divided voltage value, and a second terminal of the second test pattern circuit unit is grounded, and

the second test pattern circuit unit outputs a pulse having different polarity from that of a pulse of the first test pattern circuit unit.

2. The voltage detection apparatus according to claim 1 , wherein the second resistor is electrically connected in series with the switching device.

3. The voltage detection apparatus according to claim 1 , further comprising:

a buffer circuit unit for converting a detection signal including information about the state of the first resistor detected by the test pattern circuit unit; and

a calculation circuit unit for performing calculation based on a signal from the buffer circuit unit,

wherein the test pattern circuit unit is electrically connected on a side closer to the detection unit than the buffer circuit unit.

4. The voltage detection apparatus according to claim 3 , further comprising:

a first filter circuit and a second filter circuit connecting the buffer circuit unit to the calculation circuit unit,

wherein the first filter circuit is provided to restrict the signal from the test pattern circuit unit, and

wherein the second filter circuit is configured to transmit the signal from the test pattern circuit unit to the calculation circuit unit.

5. The voltage detection apparatus according to claim 1 , wherein the detection unit includes an overvoltage detection circuit unit for detecting overvoltage,

wherein a first terminal of the test pattern circuit unit is connected to an equipotential connection point to the first divided voltage value, and a second terminal of the test pattern circuit unit is connected to a power supply circuit unit, and

wherein the overvoltage detection circuit unit detects overvoltage based on a voltage value of the detection unit increased by the test pattern circuit unit.

6. The voltage detection apparatus according to claim 1 , wherein the first test pattern circuit unit and the second test pattern circuit unit are operated so that a negative-side pulse may contain a positive-side pulse.

7. A voltage detection apparatus comprising:

a first resistor for dividing voltage of a detection unit into a first divided voltage value; and

a test pattern insertion circuit unit including a second resistor for dividing the first divided voltage value into a second divided voltage value and a switching device, wherein

the test pattern insertion circuit unit is connected between the first resistor and reference electric potential, and

a state of the first resistor is detected based on the second divided voltage value when the switching device is non-conductive,

the test pattern circuit unit includes a first test pattern circuit unit connected to a positive side of the detection unit and a second test pattern circuit unit connected to a negative side of the detection unit,

a first terminal of the first test pattern circuit unit is connected to an equipotential connection point to the first divided voltage value, and a second terminal of the first test pattern circuit unit is grounded,

a first terminal of the second test pattern circuit unit is connected to an equipotential connection point to the first divided voltage value, and a second terminal of the second test pattern circuit unit is grounded, and

the second test pattern circuit unit outputs a pulse having different polarity from that of a pulse of the first test pattern circuit unit.

8. The voltage detection apparatus according to claim 7 , wherein the second resistor is electrically connected in parallel with the switching device.

9. A voltage detection apparatus comprising:

a first resistor for dividing voltage of a detection unit into a first divided voltage value; and

a test pattern insertion circuit unit including a second resistor for dividing the first divided voltage value into a second divided voltage value and a switching device,

a buffer circuit unit for converting a detection signal including information about the state of the first resistor detected by the test pattern circuit unit; and

a calculation circuit unit for performing calculation based on a signal from the buffer circuit unit,

a first filter circuit and a second filter circuit connecting the buffer circuit unit to the calculation circuit unit, wherein

the test pattern insertion circuit unit is connected to an equipotential connection point to the first divided voltage value, and

a state of the first resistor is detected based on the second divided voltage value when the switching device is conductive,

the test pattern circuit unit is electrically connected on a side closer to the detection unit than the buffer circuit unit,

the first filter circuit is provided to restrict the signal from the test pattern circuit unit, and

the second filter circuit is configured to transmit the signal from the test pattern circuit unit to the calculation circuit unit.

Assignments (2)
CHANGE OF NAME Recorded Mar 25, 2021
From: HITACHI AUTOMOTIVE SYSTEMS, LTD.
To: HITACHI ASTEMO, LTD.
Reel/Frame 056299/0447 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2016
From: IGARASHI, HIROAKI; KASHIHARA, MASAYOSHI; HATAKEYAMA, TATSUYA; YAHATA, KOICHI; SAKAMOTO, HIDEYUKI
To: HITACHI AUTOMOTIVE SYSTEMS, LTD.
Reel/Frame 040362/0101 →