IP Library Granted Patent US 10,514,306
Granted Patent B2
US 10,514,306 · App. 15/346,250 · Granted Dec 24, 2019

Overheat detection circuit, overheat protection circuit, and semiconductor device

Inventor: Takao Nakashimo (Chiba, JP)
Assignee: ABLIC INC.
G01K7/16
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Quick Facts
Patent No.
US 10,514,306
App. No.
15/346,250
Granted
Dec 24, 2019
Kind
B2
Abstract

Provided is an overheat detection circuit capable of easily adjusting a detection temperature of the overheat detection circuit. The overheat detection circuit includes: a first resistor; a second resistor, which has the same temperature characteristics with the first resistor, and has an adjustable resistance value; and a heat sensitive element connected to one end of the second resistor, in which a first current, which is based on a first voltage, is supplied to the first resistor, a current, which is proportional to the first current, is supplied to the second resistor so that a second voltage is generated at another end of the second resistor, and when the first voltage and the second voltage are compared, a result of the comparison is output as an overheat detection signal.

Claims (10)

1. An overheat detection circuit, comprising:

a first resistor connected between a power supply and a ground terminal;

a second resistor connected between the power supply and the ground terminal and having a same temperature characteristic as the first resistor, and having an adjustable resistance value;

a heat sensitive element connected to a first end of the second resistor,

wherein a first current, based on a first voltage, is supplied to the first resistor,

wherein a second current, proportional to the first current, is supplied to the second resistor such that a second voltage is generated at a second end of the second resistor; and

a comparator having a first input receiving a reference voltage and a second input receiving the second voltage,

wherein the comparator compares the reference voltage and the second voltage and outputs an overheat detection signal.

2. An overheat protection circuit, comprising the overheat detection circuit of claim 1 .

3. A semiconductor device, comprising the overheat protection circuit of claim 2 .

Assignments (2)
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2016
From: NAKASHIMO, TAKAO
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 040270/0102 →
Priority Claims (1)
JP 2015-219614 · Nov 9, 2015 · national
Continuity (1)
Related Publication 20170131155A1 · May 11, 2017