Circuit for detection of failure of movable MEMS mirror
Disclosed herein is a circuit for determining failure of a movable MEMS mirror. The circuit includes a mirror position sensor associated with the movable MEMS mirror and that generates an analog output as a function of angular position of the movable MEMS mirror. An analog to digital converter converts the analog output from the mirror position sensor to a digital mirror sense signal. Failure detection circuitry calculates a difference between the digital mirror sense signal at a first instant in time and the digital mirror sense signal at a second instant in time, determines whether the difference exceeds a threshold, and indicates failure of the movable MEMS mirror as a function of the difference failing to exceed the threshold.
1. A circuit for determining failure of a movable MEMS mirror, comprising:
a mirror position sensor associated with the movable MEMS mirror and configured to generate an analog output as a function of angular position of the movable MEMS mirror;
an analog to digital converter configured to convert the analog output from the mirror position sensor to a digital mirror sense signal; and
failure detection circuitry configured to:
calculate a difference between the digital mirror sense signal at a first instant in time and the digital mirror sense signal at a second instant in time;
determine whether the difference exceeds a threshold; and
indicate failure of the movable MEMS mirror as a function of the difference failing to exceed the threshold;
wherein failure of the mirror occurs when the movable MEMS mirror becomes physically stuck.
2. The circuit of claim 1 , wherein the failure detection circuitry is further configured to determine from the difference a rotational speed of the movable MEMS mirror; wherein determining whether the difference exceeds a threshold comprises determining whether the rotational speed exceeds a threshold; and wherein indicating failure of the movable MEMS mirror comprises indicating failure of the movable MEMS mirror as a function of the rotational speed failing to exceed the threshold.
3. The circuit of claim 1 , wherein the failure detection circuitry is further configured to store values of the digital mirror sense signal; and wherein the failure detection circuit is configured to determine the difference as a function of the stored values.
4. The circuit of claim 1 , wherein the failure detection circuitry is configured to:
determine from the digital mirror sense signal first and second differences, the first difference being between the digital mirror sense signal at a first instant in time and the digital mirror sense signal at a second instant in time, the second difference being between the digital mirror sense signal at the second instant in time and the digital mirror sense signal at a third instant in time;
determine whether at least one of the first and second differences exceeds the threshold; and
indicate failure of the movable MEMS mirror as a function of at least one of the first and second differences failing to exceed the threshold.
5. The circuit of claim 1 , wherein the analog to digital converter has a sampling rate, wherein the threshold is less than a lowest of at least two consecutive values of the digital mirror sense signal converted at the sampling rate, and wherein a second of the two consecutive values is acquired at a peak of the analog output.
6. The circuit of claim 1 , wherein the analog to digital converter has a sampling rate, wherein the threshold is less than a lowest of three consecutive values of the digital mirror sense signal converted at the sampling rate, and wherein a second of the three consecutive values is acquired at a peak of the analog output.
7. The circuit of claim 1 , wherein the failure detection circuitry comprises:
storage circuitry configured to store values of the digital mirror sense signal;
speed determination circuitry configured to determine from the stored values of the digital mirror sense signal one or more speed values that are a function of a rotational speed of the movable MEMS mirror at one or more instants in time;
comparison circuitry configured to determine whether the one or more speed values exceeds the threshold; and
indicator circuitry configured to indicate the failure of the movable MEMS mirror as a function of the one or more speed values at the one or more instants in time failing to exceed the threshold.
8. The circuit of claim 7 , wherein the storage circuitry comprises a plurality of registers configured to store consecutive values of the digital mirror sense signal.
9. The circuit of claim 7 , wherein the speed determination circuitry comprises at least one subtractor configured to determine the one or more speed values as a function of a difference between a given stored value of the digital mirror sense signal and a preceding stored value of the digital mirror sense signal.
10. The circuit of claim 7 , wherein the comparison circuitry comprises a first comparator having inputs receiving the one or more speed values and the threshold, and an output.
11. The circuit of claim 10 , wherein the comparison circuit further comprises:
a second comparator having inputs receiving another of the one or more speed values and the threshold, and an output; and
an AND gate receiving as input the outputs from the first and second comparators, and providing output to the indicator circuit.
12. The circuit of claim 7 , wherein the indicator circuit comprises a flip flop receiving output from the comparison circuitry, and selectively indicating the failure of the movable MEMS mirror as a function thereof.
13. The circuit of claim 1 , wherein failure of the mirror occurs when the movable MEMS mirror becomes physically stuck, as indicated by the difference failing to exceed the threshold for an extended period of time that suggests that the movable MEMS mirror is no longer oscillating.
14. A method, comprising:
operating a movable MEMS mirror;
generating an analog signal that is a function of a position of the movable MEMS mirror in real time as the movable MEMS mirror is in operation;
converting the analog signal to a digital mirror sense signal in real time as the movable MEMS mirror is in operation;
determine a signal that is a function of a rotational speed of the movable MEMS mirror at one or more instants in time in real time as the movable MEMS mirror is in operation; and
determine whether the signal fails to exceed a threshold in real time as the movable MEMS mirror is in operation, thereby indicating whether the rotational speed of the movable MEMS mirror fails to exceed a threshold rotational speed.
15. The method of claim 14 , further comprising stopping operation of the movable MEMS mirror as a function of the signal failing to exceed the threshold.
16. The method of claim 15 , wherein the signal is determined at two instants in time; and wherein operation of the movable MEMS mirror is stopped as a function of the signal at the two instants in time failing to exceed the threshold.
17. The method of claim 16 , further comprising storing first, second, and third consecutive values of the digital mirror sense signal; and wherein the signal is determined at a first instant in time by subtracting the first value of the digital mirror sense signal from the second value of the digital mirror sense signal, and at a second instant in time by subtracting the second value of the digital mirror sense signal from the third value of the digital mirror sense signal.
18. The method of claim 17 , wherein operation of the movable MEMS mirror is stopped as a function of the signal at the first and second instants in time failing to exceed the threshold.
19. The method of claim 14 , further comprising determining that the movable MEMS mirror has failed as a function of the signal failing to exceed the threshold.
20. A circuit for determining failure of a movable MEMS mirror, comprising:
a mirror position sensor associated with the movable MEMS mirror and configured to generate an analog output as a function of angular position of the movable MEMS mirror;
an analog to digital converter configured to convert the analog output from the mirror position sensor to a digital mirror sense signal; and
failure detection circuitry configured to:
calculate a difference between the digital mirror sense signal at a first instant in time and the digital mirror sense signal at a second instant in time;
determine from the difference a rotational speed of the movable MEMS mirror;
determine whether the rotational speed exceeds a threshold; and
indicate failure of the movable MEMS mirror as a function of the rotational speed failing to exceed the threshold.
21. A circuit for determining failure of a movable MEMS mirror, comprising:
a mirror position sensor associated with the movable MEMS mirror and configured to generate an analog output as a function of angular position of the movable MEMS mirror;
an analog to digital converter configured to convert the analog output from the mirror position sensor to a digital mirror sense signal; and
failure detection circuitry configured to:
determine from the digital mirror sense signal first and second differences, the first difference being between the digital mirror sense signal at a first instant in time and the digital mirror sense signal at a second instant in time, the second difference being between the digital mirror sense signal at the second instant in time and the digital mirror sense signal at a third instant in time;
determine whether at least one of the first and second differences exceeds the threshold; and
indicate failure of the movable MEMS mirror as a function of at least one of the first and second differences failing to exceed the threshold.