IP Library Granted Patent US 10,176,075
Granted Patent B1
US 10,176,075 · App. 15/348,242 · Granted Jan 8, 2019

Methods, systems, and computer readable mediums for generating key performance indicator metric test data

Inventor: Jared D. Juniel (Sachse, TX)
Assignee: VCE IP HOLDING COMPANY LLC
G06F11/3616G06F11/3664G06F11/3684
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Quick Facts
Patent No.
US 10,176,075
App. No.
15/348,242
Granted
Jan 8, 2019
Kind
B1
Abstract

Methods, systems, and computer readable mediums for generating key performance indicator (KPI) metric test data are disclosed. According to one method, the method includes receiving KPI parameter data associated with a KPI metric corresponding to a system element hosted by a computing system, generating KPI metric test data values for the KPI metric in accordance to a defined time period and a collection frequency interval specified by the KPI parameter data, and utilizing the KPI metric test data values to subject at least one of an interface layer or service logic of the computing system to a validation assessment.

Claims (26)

1. A method comprising:

receiving key performance indicator (KPI) parameter data associated with a KPI metric corresponding to a system element hosted by a computing system;

generating KPI metric test data values for the KPI metric in accordance to a defined time period and a collection frequency interval specified by the KPI parameter data, wherein generating KPI metric test data values includes receiving a KPI seed file including model KPI metric test data values, generating a KPI formula based on the model KPI metric test data values, and executing the KPI formula to produce the KPI metric test data values; and

utilizing the KPI metric test data values to subject at least one of an interface layer or service logic of the computing system to a validation assessment, wherein the validation assessment is conducted without collecting actual KPI metric data from system components of the computing system.

2. The method of claim 1 wherein the interface layer includes either an application programming interface (API) and a graphical user interface (GUI) of the computing system.

3. The method of claim 1 wherein the service logic includes aggregation logic.

4. The method of claim 1 wherein the KPI parameter data further includes information including at least one of a starting time of the defined time period, an ending time of the defined time period, a minimum KPI metric test data value, and a maximum KPI metric test data value.

5. The method of claim 1 wherein the system element includes either a component device or a virtual machine hosted by the computing system.

6. The method of claim 1 wherein the KPI metric test data values are generated utilizing a predefined KPI formula.

7. A system comprising:

a processor; and

a system manager including a KPI generation engine that when executed by the processor is configured for receiving, from a KPI generation manager, key performance indicator (KPI) parameter data associated with a KPI metric corresponding to a system element hosted by a computing system and for generating KPI metric test data values for the KPI metric in accordance to a defined time period and a collection frequency interval specified by the KPI parameter data, wherein generating KPI metric test data values includes receiving a KPI seed file including model KPI metric test data values, generating a KPI formula based on the model KPI metric test data values, and executing the KPI formula to produce the KPI metric test data values, wherein the system manager is configured for utilizing the KPI metric test data values to subject at least one of an interface layer or service logic of the computing system to a validation assessment, wherein the validation assessment is conducted without collecting actual KPI metric data from system components of the computing system.

8. The system of claim 7 wherein the interface layer includes either an application programming interface (API) and a graphical user interface (GUI) of the computing system.

9. The system of claim 7 wherein the service logic includes aggregation logic.

10. The system of claim 7 wherein the KPI parameter data further includes information including at least one of a starting time of the defined time period, an ending time of the defined time period, a minimum KPI metric test data value, and a maximum KPI metric test data value.

11. The system of claim 7 wherein the system element includes either a component device or a virtual machine hosted by the computing system.

12. The system of claim 7 wherein the KPI metric test data values are generated utilizing a predefined KPI formula.

13. A non-transitory computer readable medium having stored thereon executable instructions that when executed by a processor of a computer control the computer to perform steps comprising:

receiving key performance indicator (KPI) parameter data associated with a KPI metric corresponding to a system element hosted by a computing system;

generating KPI metric test data values for the KPI metric in accordance to a defined time period and a collection frequency interval specified by the KPI parameter data, wherein generating KPI metric test data values includes receiving a KPI seed file including model KPI metric test data values, generating a KPI formula based on the model KPI metric test data values, and executing the KPI formula to produce the KPI metric test data values; and

utilizing the KPI metric test data values to subject at least one of an interface layer or service logic of the computing system to a validation assessment, wherein the validation assessment is conducted without collecting actual KPI metric data from system components of the computing system.

14. The non-transitory computer readable medium of claim 13 wherein the interface layer includes either an application programming interface (API) and a graphical user interface (GUI) of the computing system.

15. The non-transitory computer readable medium of claim 13 wherein the service logic includes aggregation logic.

16. The non-transitory computer readable medium of claim 13 wherein the KPI parameter data further includes information including at least one of a starting time of the defined time period, an ending time of the defined time period, a minimum KPI metric test data value, and a maximum KPI metric test data value.

17. The non-transitory computer readable medium of claim 13 wherein the system element includes either a component device or a virtual machine hosted by the computing system.

18. The non-transitory computer readable medium of claim 13 wherein the KPI metric test data values are generated utilizing a predefined KPI formula or KPI formula generated by a KPI seed file.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (053546/0001) Recorded Jun 23, 2022
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
To: DELL MARKETING L.P. (ON BEHALF OF ITSELF AND AS SUCCESSOR-IN-INTEREST TO CREDANT TECHNOLOGIES, INC.); DELL INTERNATIONAL L.L.C.; DELL PRODUCTS L.P.; DELL USA L.P.; EMC CORPORATION; DELL MARKETING CORPORATION (SUCCESSOR-IN-INTEREST TO FORCE10 NETWORKS, INC. AND WYSE TECHNOLOGY L.L.C.); EMC IP HOLDING COMPANY LLC
Reel/Frame 071642/0001 →
SECURITY AGREEMENT Recorded Apr 22, 2020
From: CREDANT TECHNOLOGIES INC.; DELL INTERNATIONAL L.L.C.; DELL MARKETING L.P.; DELL PRODUCTS L.P.; DELL USA L.P.; EMC CORPORATION; FORCE10 NETWORKS, INC.; WYSE TECHNOLOGY L.L.C.; EMC IP HOLDING COMPANY LLC
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A.
Reel/Frame 053546/0001 →
MERGER Recorded Mar 26, 2020
From: VCE IP HOLDING COMPANY LLC
To: EMC IP HOLDING COMPANY LLC
Reel/Frame 052236/0497 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2016
From: JUNIEL, JARED D.
To: VCE IP HOLDING COMPANY LLC
Reel/Frame 040305/0268 →
Cited By (2)
US 12,271,712 US 12,547,526