IP Library Granted Patent US 9,755,172
Granted Patent B2
US 9,755,172 · App. 15/356,563 · Granted Sep 5, 2017

Device including quantum dots

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Quick Facts
Patent No.
US 9,755,172
App. No.
15/356,563
Granted
Sep 5, 2017
Kind
B2
Abstract

A device including an emissive material comprising quantum dots is disclosed. In one embodiment, the device includes a first electrode and a second electrode, a layer comprising quantum dots disposed between the first electrode and the second electrodes, and a first interfacial layer disposed at the interface between a surface of the layer comprising quantum dots and a first layer in the device. In certain embodiments, a second interfacial layer is optionally further disposed on the surface of the layer comprising quantum dots opposite to the first interfacial layer. In certain embodiments, a device comprises a light-emitting device. Other light emitting devices and methods are disclosed.

Claims (25)

1. A method for preparing a light emitting device including a first electrode and a second electrode, an emissive layer comprising quantum dots disposed between the first electrode and the second electrode, a first layer disposed between the first electrode and the layer comprising quantum dots, and a first interfacial layer disposed at the interface between a surface of the layer comprising quantum dots and the first layer, the method comprising:

forming the first electrode on a substrate;

forming the first layer thereover, the first layer comprising a first charge transport material comprising an inorganic material comprising a metal chalcogenide;

applying the first interfacial layer thereover for protecting the quantum dots included in the emissive layer from charge quenching sites in a contiguous device layer, the first interfacial layer being applied as a distinct layer having a thickness in a range from a monolayer thickness to about 5 nm and comprising a material that is non-quenching to quantum dot photoluminescent emission and does not impede charge flow;

applying the emissive layer comprising quantum dots thereover; and

forming the second electrode thereover.

2. A method in accordance with claim 1 further comprising forming a second interfacial layer over the surface of the layer comprising quantum dots opposite the first interfacial layer.

3. A method in accordance with claim 1 wherein the first interfacial layer comprises a surfactant.

4. A method in accordance with claim 1 wherein the first interfacial layer comprises a silicon-containing coupling agent.

5. A method in accordance with claim 1 wherein the first interfacial layer comprises a metal oxide.

6. A method in accordance with claim 1 wherein the first interfacial layer comprises an organic small molecule material.

7. A method in accordance with claim 1 wherein the first interfacial layer comprises a metal oxide including an alkali metal or alkaline earth metal dopant.

8. A method in accordance with claim 1 wherein the first interfacial layer comprises non-light-emitting nanoparticles having a bandgap that is the same or similar to the bandgap of quantum dots included in the emissive layer comprising quantum dots.

9. A method in accordance with claim 2 further comprising forming a second layer between the second interfacial layer and the second electrode.

10. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by phase separation of a mixture including quantum dots and a small molecule material.

11. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by spincasting.

12. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by atomic layer deposition (ALD).

13. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by molecular layer deposition (MLD).

14. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by physical vapor deposition.

15. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by chemical vapor deposition (CVD).

16. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by plasma-enhanced chemical vapor deposition (PECVD).

17. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by contact printing.

18. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by inkjet printing.

19. A method in accordance with claim 2 wherein the first interfacial layer and/or the second interfacial layer is formed by self-assembly.

20. A method in accordance with claim 9 wherein the first layer comprises a material capable injecting and transporting electrons, the second layer comprises a material capable of transporting holes, and wherein the method further includes forming a hole injection layer over the second layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 19, 2017
From: QD VISION, INC.
To: SAMSUNG RESEARCH AMERICA, INC.
Reel/Frame 043629/0027 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2016
From: KAZLAS, PETER T.; ZHOU, ZHAOQUN; NIU, YUHUA; MASHFORD, BENJAMIN S.; KIM, SANG-JIN
To: QD VISION, INC.
Reel/Frame 040382/0147 →