Digitally compensating for the impact of input bias current on current measurements
View Patent ↗A source-measure unit (SMU) may be implemented with digital control loops and circuitry to digitally compensate for the impact of input bias current on current measurements. One or more buffers having well-defined characteristics with respect to certain parameters which may affect the current measurements may be used in the output signal path of the SMU where a shunt voltage developed across a current sense element is measured. For example, the buffers may conduct/develop respective input bias currents that change perceptibly and predictably with temperature. By measuring the temperature and adjusting a control voltage—which is used to develop the shunt voltage—according to the temperature measurements, the impact of the input bias current[s] on the current measurement[s] may be reduced to negligible levels and/or may be eliminated. The control voltage may be adjusted by adjusting a voltage feedback value representative of the measured shunt voltage, and/or by adjusting a current setpoint used for generating the control voltage.
1. A method for digitally compensating for an impact of one or more parameters on current measurements, the method comprising:
developing a shunt voltage across a current sense element according to a control voltage;
obtaining a shunt voltage value representative of the shunt voltage, comprising measuring the shunt voltage at least via a signal path that includes one or more components having a well-defined operational characteristic with respect to at least one parameter of the one or more parameters;
obtaining a parameter value representative of an actual state of the at least one parameter at the one or more components during the measuring of the shunt voltage; and
adjusting for a change of state of the one or more components that occurs, during the measuring of the shunt voltage, according to the well-defined operational characteristic, comprising adjusting one or more of the following:
the control voltage at least according to the obtained parameter value and the shunt voltage value; or
the shunt voltage value at least according to the obtained parameter value.
2. The method of claim 1 , further comprising digitally controlling the control voltage at least according to a current setpoint.
3. The method of claim 2 , wherein said adjusting the control voltage at least according to the obtained parameter value and the shunt voltage value comprises adjusting the current setpoint at least according to the obtained parameter value.
4. The method of claim 1 , wherein said obtaining the parameter value comprises obtaining measurements of the actual state of the at least one parameter during the current measurements.
5. The method of claim 4 , further comprising filtering the measurements to reduce noise.
6. The method of claim 1 , further comprising adjusting the obtained parameter value to match associated properties of at least a circuit board on which the one or more buffers are configured.
7. The method of claim 1 , wherein the one or more parameters comprise environmental variables.
8. The method of claim 1 , wherein adjusting the shunt voltage value comprises:
adjusting the shunt voltage value according to a polynomial approximation of a relationship of the well-defined operational characteristic with respect to the at least one parameter.
9. A measurement system for measuring current, the measurement system comprising:
a current sense element;
one or more buffers coupled to the current sense element, forming a signal path that includes the current sense element and the one or more buffers, wherein the one or more buffers are conducting respective one or more input bias currents that change with respect to temperature when the signal path is conducting a current; and
a control circuit coupled to the current sense element and the one or more buffers, wherein the control circuit is configured to:
cause the signal path to conduct the current at least in response to a control voltage, wherein a shunt voltage is developed across the current sense element at least according to the current;
obtain a shunt voltage value representative of the shunt voltage;
obtain a temperature value representative of an operating temperature; and
adjust one or more of the following:
the control voltage at least according to the temperature value and the shunt voltage value; or
the shunt voltage value at least according to the temperature value.
10. The measurement system of claim 9 , wherein the control circuit is further configured to digitally adjust the control voltage at least according to a current setpoint.
11. The measurement system of claim 10 , wherein to adjust the control voltage the control circuit is configured to adjust the current setpoint at least according to the temperature value.
12. The measurement system of claim 9 , wherein the control circuit is further configured to obtain measurements of the operating temperature during current measurements, and obtain the temperature value based at least on the measurements of the operating temperature.
13. The measurement system of claim 12 , further comprising a filter circuit configured to filter the measurements of the operating temperature, wherein the control circuit is further configured to obtain the temperature value based at least on the filtered measurements of the operating temperature.
14. The measurement system of claim 9 , wherein the control circuit is further configured to adjust the temperature value to match thermal properties of at least a circuit board on which the one or more buffers are configured.
15. An apparatus for performing current measurements, the apparatus comprising:
a processing element configured to:
develop a shunt voltage across a sense element according to at least a control voltage;
obtain a shunt voltage value representative of the shunt voltage by measuring the shunt voltage via a signal path that includes one or more buffers conducting respective one or more input bias currents that change with respect to temperature;
obtain a temperature value representative of an operating temperature during the current measurements; and
adjust one or more of the following:
the control voltage at least according to the temperature value and the shunt voltage value; or
the shunt voltage value at least according to the temperature value.
16. The apparatus of claim 15 , wherein the processing element is further configured to digitally adjust the control voltage at least according to a current setpoint.
17. The apparatus of claim 16 , wherein the processing element is further configured to adjust the control voltage by adjusting the current setpoint at least according to the temperature value.
18. The apparatus of claim 15 , wherein the processing element is further configured to obtain the temperature value based at least on measurements of the operating temperature obtained during the current measurements.
19. The apparatus of claim 18 , further comprising a filter configured to filter the measurements of the operating temperature, wherein the processing element is further configured to obtain the temperature value based at least on the filtered measurements of the operating temperature.
20. The apparatus of claim 15 , wherein the processing element is further configured to adjust the temperature value to match thermal properties of at least a circuit board on which the one or more buffers are configured.