Unevenness inspection apparatus and unevenness inspection method

1. An unevenness inspection apparatus comprising:

circuitry configured to:

obtain a pickup image of a test object;

modify a chroma value of a pixel in the pickup image to correct a gain of the pickup image associated with the pixel for generating a color unevenness inspection image;

generate a luminance unevenness inspection image based on the pickup image;

calculate an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and

perform unevenness inspection using the calculated evaluation parameter, wherein

the evaluation parameter is calculated based on unevenness visibility for both color and luminance.

2. The unevenness inspection apparatus according to claim 1 , wherein the circuitry is further configured to:

calculate a color unevenness evaluation parameter using the color unevenness inspection image and calculate a luminance unevenness evaluation parameter using the luminance unevenness inspection image, and

calculate a total evaluation parameter as the evaluation parameter by performing weighting addition of the color unevenness evaluation parameter and the luminance unevenness evaluation parameter.

3. The unevenness inspection apparatus according to claim 2 , wherein, when the color unevenness evaluation parameter is Ec, the luminance unevenness evaluation parameter is El, and weighting coefficients are A and B, the total evaluation parameter E is given by Expression (1) given below, and each of the weighting coefficients A and B is determined in consideration of the unevenness visibility

E=A×Ec+B×El   (1).

4. The unevenness inspection apparatus according to claim 2 , wherein a chroma edge area ratio and a color unevenness area ratio are used as the color unevenness evaluation parameter, the chroma edge area ratio being an area ratio of a chroma edge region to a whole region of the test object, the color unevenness area ratio being an area ratio of a color unevenness region to the whole region of the test object.

5. The unevenness inspection apparatus according to claim 4 , wherein the chroma edge area ratio, the color unevenness area ratio, and maximum chroma in whole of the color unevenness region are used as the color unevenness evaluation parameter.

6. The unevenness inspection apparatus according to claim 5 , wherein the circuitry is further configured to:

calculate each of the chroma edge area ratio, the color unevenness area ratio, and the maximum chroma using the color unevenness inspection image, and

calculate the color unevenness evaluation parameter by performing weighting addition of the chroma edge area ratio, the color unevenness area ratio, and the maximum chroma.

7. The unevenness inspection apparatus according to claim 4 , wherein the chroma edge region is a region in which an amount of change in chroma per unit length in the test object or unit viewing angle is equal to or larger than a predetermined threshold value.

8. The unevenness inspection apparatus of claim 1 , wherein the modified chroma value of the pixel in the pickup image is performed by selectively increasing a* value in International Commission on Illumination 1976L*a*b* color space (CIELAB color space) in each unit region of the pickup image.

9. The unevenness inspection apparatus of claim 1 , wherein the gain correction is performed by processing using Expression (1) given below, and then, calculating a modified chroma C using Expression (2) given below:

a *′=(α× a *)

(For a*> 0: gain α>1; for a*=< 0: gain α=1)  (1)

C ={( a *′) 2 +( b *) 2 } 1/2   (2).

10. An unevenness inspection apparatus comprising:

circuitry configured to:

modify a chroma value of a pixel in a pickup image to correct a gain of the pickup image associated with the pixel for generating a color unevenness inspection image;

generate the color unevenness inspection image and a luminance unevenness inspection image based on the pickup image;

generate a color unevenness evaluation parameter based on the color unevenness inspection image;

generate a luminance unevenness evaluation parameter based on the luminance unevenness inspection image;

calculate weight coefficients for weighted addition in consideration of unevenness visibility for both color and luminance;

calculate an evaluation parameter by performing the weighted addition of the color unevenness evaluation parameter and the luminance unevenness evaluation parameter; and

perform unevenness inspection using the calculated evaluation parameter.

11. An unevenness inspection apparatus comprising:

circuitry configured to:

modify a chroma value of a pixel in a pickup image to adjust a gain of the pickup image based on a color group associated with the pixel for generating a color unevenness inspection image;

generate a luminance unevenness inspection image based on the pickup image;

calculate an evaluation parameter using the color unevenness inspection image and the luminance unevenness inspection image; and

perform unevenness inspection using the calculated evaluation parameter, wherein

the evaluation parameter is calculated based on unevenness visibility of both color and luminance.

12. An unevenness inspection apparatus comprising:

circuitry configured to:

modify a chroma value of a pixel in a pickup image to adjust a gain of the pickup image based on a color group associated with the pixel;

generate a color unevenness inspection image based on the pickup image and the adjusted gain;

generate a luminance unevenness inspection image based on the pickup image;

generate a color unevenness evaluation parameter based on the color unevenness inspection image;

generate a luminance unevenness evaluation parameter based on the luminance unevenness inspection image;

calculate weight coefficients for weighted addition in consideration of unevenness visibility for both color and luminance;

calculate an evaluation parameter by performing the weighted addition of the color unevenness evaluation parameter and the luminance unevenness evaluation parameter; and

perform unevenness inspection using the calculated evaluation parameter.

13. An unevenness inspection apparatus comprising:

circuitry configured to:

generate a color unevenness inspection image and a luminance unevenness inspection image based on a pickup image of a test object;

calculate an evaluation parameter using the color unevenness inspection image and the luminance unevenness inspection image; and

perform unevenness inspection using the calculated evaluation parameter, wherein

the evaluation parameter is calculated based on unevenness visibility of both color and luminance,

the calculation includes calculating a color unevenness evaluation parameter using the color unevenness inspection image and calculating a luminance unevenness evaluation parameter using the luminance unevenness inspection image,

the calculation further includes calculating a total evaluation parameter as the evaluation parameter by performing weighting addition of the color unevenness evaluation parameter and the luminance unevenness evaluation parameter, and

a chroma edge area ratio and a color unevenness area ratio are used as the color unevenness evaluation parameter, the chroma edge area ratio being an area ratio of a chroma edge region to a whole region of the test object, the color unevenness area ratio being an area ratio of a color unevenness region to the whole region of the test object.

14. An unevenness inspection apparatus comprising:

circuitry configured to:

modify a chroma value of a pixel in a pickup image to adjust a gain of the pickup image associated with the pixel for generating a color unevenness inspection image;

generate a luminance unevenness inspection image based on the pickup image;

calculate an evaluation parameter using the color unevenness inspection image and the luminance unevenness inspection image; and

perform unevenness inspection using the calculated evaluation parameter, wherein

the evaluation parameter is calculated based on unevenness visibility of both color and luminance.

15. An unevenness inspection apparatus comprising:

circuitry configured to:

modify a chroma value of a pixel in a pickup image to adjust a gain of the pickup image associated with the pixel;

generate a color unevenness inspection image based on the pickup image and the adjusted gain;

generate a luminance unevenness inspection image based on the pickup image;

generate a color unevenness evaluation parameter based on the color unevenness inspection image;

generate a luminance unevenness evaluation parameter based on the luminance unevenness inspection image;

calculate weight coefficients for weighted addition in consideration of unevenness visibility for both color and luminance;

calculate an evaluation parameter by performing the weighted addition of the color unevenness evaluation parameter and the luminance unevenness evaluation parameter; and

perform unevenness inspection using the calculated evaluation parameter.