Gate drive circuit and method of operating the same
A gate drive circuit includes a lower limit clamping circuit, an upper limit clamping circuit, and an averaging circuit. The lower limit clamping circuit clamps the input node of a transistor at a minimum voltage with respect to the common node of the transistor, while the upper limit clamping circuit clamps the input node of the transistor at a maximum voltage with respect to the common node of the transistor and the averaging circuit sets the average voltage of the input node with respect to the common node over a specified period of time. The transistor including a common node, an output node and an input node receives the input signal. Controlling the upper limit, lower limit and average value in conjunction with fast transitions between the lower and upper limits controls the duty cycle of the input signal.
1. A gate drive circuit comprising:
a drive signal input;
a lower limit clamping circuit coupled to an input node and a common node of a transistor including an output node, the input node coupled to the drive signal input that receives an input signal at a duty cycle to be applied between the input node and the common node, the lower limit clamping circuit clamping the input node of the transistor at a minimum voltage with respect to the common node of the transistor, the lower limit clamping circuit comprises a first diode coupled between a first source and the input node;
an upper limit clamping circuit coupled to the input node and the common node of the transistor, the upper limit clamping circuit clamping the input node of the transistor at a maximum voltage with respect to the common node, the upper limit clamping circuit comprises a second diode coupled between a second source and the input node; and
an averaging circuit coupled to the input node and the common node of the transistor, the averaging circuit providing a direct current bias at the input node of the transistor to set an average voltage of the input signal received at the input node with respect to the common node.
2. The gate drive circuit of claim 1 , wherein the input signal comprises a sinusoidal signal, and the gate drive circuit comprises a portion of an amplifier.
3. The gate drive circuit of claim 1 , wherein the transistor comprises a gallium Nitride (GaN) high electron mobility transistor (HEMT) device, and wherein the input node comprises a gate of the GaN HEMT device.
4. The gate drive circuit of claim 1 , wherein the gate drive circuit comprises a portion of another circuit, at least one of the first source or the second source is used to power the portion of the another circuit.
5. A gate drive circuit comprising:
a drive signal input;
a lower limit clamping circuit coupled to an input node and a common node of a transistor including an output node, the input node coupled to the drive signal input that receives an input signal at a duty cycle to be applied between the input node and the common node, the lower limit clamping circuit clamping the input node of the transistor at a minimum voltage with respect to the common node of the transistor;
an upper limit clamping circuit coupled to the input node and the common node of the transistor, the upper limit clamping circuit clamping the input node of the transistor at a maximum voltage with respect to the common node;
an averaging circuit providing a direct current bias at the input node of the transistor to set an average voltage of the input signal received at the input node with respect to the common node; and
a transformer coupled between the input node of the transistor and the drive signal input, the transformer to isolate a bias of the input signal from the direct current bias provided by the averaging circuit.
6. The gate drive circuit of claim 1 , further comprising a resistor coupled between the averaging circuit and the input node of the transistor, the resistor dampening an amplitude of the input signal provided to the input node of the transistor.
7. The gate drive circuit of claim 1 , further comprising a capacitor coupled between the averaging circuit and the input node of the transistor, the capacitor bypassing an alternating-current (AC) component of the input signal provided to the input node of the transistor.
8. A plurality of the gate drive circuits of claim 1 configured in an amplifier, the drive signal inputs of each gate drive circuit coupled to the input signal through a drive distribution and input matching network, the output node of each transistor coupled to a load through an output matching and power combining network.
9. The gate drive circuit of claim 1 , wherein the averaging circuit comprises a third direct current source to apply a direct current (DC) bias to the input signal to adjust a zero volt crossing point of the input signal.
10. A gate driving method comprising:
receiving an input signal at a frequency and providing an amplified output signal by at least one transistor having an input node, a common node and an output node;
clamping the input node of the transistor at a minimum voltage with respect to the common node of the transistor using a lower limit clamping circuit coupled to the input node and the common node of the transistor, the lower limit clamping circuit comprises a first diode coupled between a first source and the input node;
clamping the input node of the transistor at a maximum voltage with respect to the common node of the transistor using an upper limit clamping circuit coupled to the input node and common node of the transistor, the upper limit clamping circuit comprises a second diode coupled between a second source and the input node; and
providing a direct current bias at the input node of the transistor.
11. The gate driving method of claim 10 , further comprising driving the input signal with a sinusoidal signal.
12. The gate driving method of claim 10 , further comprising isolating a bias of the input signal from the direct current bias using a transformer coupled between the input node of the transistor and the input signal.
13. The gate driving method of claim 10 , further comprising dampening an amplitude of the input signal provided to the input node of the transistor using a resistor coupled in series with the input node of the transistor.
14. The gate driving method of claim 13 , further comprising bypassing an alternating-current (AC) component of the input signal provided to the input node of the transistor using a capacitor coupled in parallel with the resistor.
15. An electrical circuit comprising:
an amplifier comprising:
a lower limit clamping circuit comprising a first direct current (DC) source coupled to a first diode, the first diode coupled to an input node of a transistor including an input node, a common node and an output node, the input node to receive an input signal at a frequency and provide an amplified output signal at the output node, the lower limit clamping circuit clamping the input node of the transistor at a minimum voltage with respect to the common node of the transistor;
an upper limit clamping circuit comprising a second DC source coupled to a second diode, the second diode coupled to the input node of the transistor, the upper limit clamping circuit clamping the input node of the transistor at a maximum voltage with respect to the common node of the transistor; and
an averaging circuit comprising a third DC source coupled to the input node of the transistor, the averaging circuit providing a direct current bias at the input node of the transistor.
16. The electrical circuit of claim 15 , wherein the transistor comprises a gallium Nitride (GaN) high electron mobility transistor (HEMT) device, and wherein the input node comprises a gate of the GaN HEMT device.
17. The electrical circuit of claim 15 , wherein the amplifier further comprises a transformer coupled between the input node of the transistor and the input signal, the transformer to isolate a bias of the input signal from the direct current bias provided by the averaging circuit.
18. The electrical circuit of claim 15 , wherein the amplifier further comprises a resistor coupled between the averaging circuit and the input node of the transistor, the resistor dampening an amplitude of the input signal provided to the input node of the transistor.
19. The electrical circuit of claim 15 , wherein the amplifier further comprises a capacitor coupled between the averaging circuit and the input node of the transistor, the capacitor bypassing an AC component of the input signal provided to the input node of the transistor.
20. The gate drive circuit of claim 3 wherein the minimum voltage and the maximum voltage are set to operate the GaN HEMT device without meeting a gate to source breakdown voltage of the GaN HEMT device, and the direct current bias at the input node of the transistor to set the average voltage of the input signal received at the input node to control the duty cycle.
21. The electrical circuit of claim 16 wherein the minimum voltage and the maximum voltage are set to operate the GaN HEMT device without meeting a gate to source breakdown voltage of the GaN HEMT device.
22. The gate drive circuit of claim 5 , wherein the lower limit clamping circuit comprises a first diode coupled between a first direct current (DC) source and the input node, and the upper limit clamping circuit comprises a second diode coupled between a second direct current (DC) source and the input node.