Sampling device including mechanical force feedback mechanism

1. A sampling device for collecting a sample from a target surface, the sampling device comprising:

a handle;

a body extending from said handle;

a sampling head opposite said handle; and

a mechanical force feedback mechanism configured to change an orientation of said body in relation to said handle when force is applied to the target surface by said sampling device, wherein the mechanical force feedback mechanism is defined by a rotational junction connecting the body to the handle, wherein the rotational junction comprises a cavity defined in an interior of one of the handle and the body, an arm extending from the other of the handle and the body and into the cavity, and a biasing member extending between the arm and an interior wall defining the cavity, and wherein the arm rotates in relation to the interior wall when force is applied to the target surface by said sampling device.

2. The sampling device according to claim 1 , wherein said rotational junction comprises a pin about which said body rotates in relation to said handle when force is applied to the target surface by said sampling device.

3. The sampling device according to claim 1 , wherein said mechanical force feedback mechanism prevents further rotation of said body in relation to said handle when a threshold amount of force to the target surface is applied by said sampling device.

4. The sampling device according to claim 1 , wherein said mechanical force feedback mechanism operatively couples said handle to said body.

5. The sampling device according to claim 1 , wherein said sampling head comprises a trap holder configured to support a sample trap and a frame that secures said sample trap to the support surface.

6. The sampling device according to claim 5 , wherein said sample trap is detachable from said trap holder.

7. The sampling device according claim 1 , further comprising a force indicator configured to provide a sound upon application of a threshold amount of force on the target surface by said sampling device.

8. The sampling device according to claim 1 , wherein said sampling device transitions into a threshold configuration when a threshold amount of force is applied to the target surface.

9. The sampling device according to claim 8 , wherein the sampling device includes an over-force indicator that indicates when a predetermined amount of force that is greater than the threshold amount of force has been applied.

10. The sampling device according to claim 1 , wherein said biasing member is a spring configured to remain in an at rest configuration when no force is applied to the target surface by said sampling device.

11. The sampling device according to claim 10 , wherein said spring comprises at least one of a leaf spring, an extension spring, a torsion spring, a compression spring, a disc spring, an air spring, a gas spring, a flat spring, an elastomeric spring, or a constant force spring.

12. The sampling device according to claim 9 , wherein the predetermined amount of force is within a range of about three to about five pounds of force.

13. The sampling device according to claim 1 , further comprising a force indicator configured to visually indicate when a threshold amount of force is applied to the target surface by said sampling device.

14. The sampling device according to claim 1 , further configured to provide tactile feedback to indicate that a threshold amount of force is applied to the target surface by said sampling device.

15. A method of using a mechanical force feedback sampling device, said method comprising:

grasping a handle of a sampling device;

applying a force against a target surface using the sampling device;

increasing the applied force to a threshold amount of force such that a mechanical force feedback mechanism induces a change in the orientation of the sampling device; and

collecting a sample, wherein the mechanical force feedback mechanism is configured to change an orientation of said body in relation to the handle when force is applied to the target surface by the sampling device, wherein the mechanical force feedback mechanism is defined by a rotational junction connecting the body to the handle, wherein the rotational junction comprises a cavity defined in an interior of one of the handle and the body, an arm extending from the other of the handle and the body and into the cavity, and a biasing member extending between the arm and an interior wall defining the cavity, and wherein the arm rotates in relation to the interior wall when force is applied to the target surface by the sampling device.

16. The method according to claim 15 , wherein collecting a sample comprises collecting a sample using a sample trap, said method further comprising: inserting the sample trap into an analysis device for analysis of the sample.

17. The method according to claim 15 , wherein increasing the applied force to a threshold amount of force comprises increasing the applied force to at least about a half pound of force.

18. A sampling device for collecting a sample from a target surface, said sampling device comprising:

a handle;

a body comprising an end, wherein the body is coupled to the handle;

a sampling head opposite said handle, said sampling head comprising a support surface configured to support a sampling trap; and

a mechanical force feedback mechanism configured to indicate when a threshold amount of force is applied to the target surface by the sampling device, wherein the mechanical force feedback mechanism is configured to change an orientation of the body in relation to the handle when force is applied to the target surface by the sampling device, wherein the mechanical force feedback mechanism is defined by a rotational junction connecting the body to the handle, wherein the rotational junction comprises a cavity defined in an interior of one of the handle and the body, an arm extending from the other of the handle and the body and into the cavity, and a biasing member extending between the arm and an interior wall defining the cavity, and wherein the arm rotates in relation to the interior wall when force is applied to the target surface by the sampling device.