Spectrometry system with decreased light path
A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.
1. A spectrometer configured to measure a spectrum of a sample comprising:
an illuminator comprising:
a primary radiation emitter to emit primary radiation within a first wavelength range;
a secondary radiation emitter configured to absorb the primary radiation and to emit secondary radiation within a second wavelength range different from the first wavelength range;
a spectral detector; and
one or more filters between the sample and the spectral detector, wherein the one or more filters comprise one or more coatings and are configured to transmit the secondary radiation to the spectral detector, and wherein the spectral detector is configured to resolve wavelengths of the secondary radiation for measuring the spectrum of the sample.
2. The spectrometer of claim 1 , wherein the first wavelength range is within a visible range and the second wavelength range is within an infrared range.
3. The spectrometer of claim 2 , wherein the secondary radiation emitter comprises near infra-red phosphor.
4. The spectrometer of claim 1 , further comprising an additional filter configured to block radiation in the first wavelength range.
5. The spectrometer of claim 1 , wherein each of the plurality of filters of the filter array is configured to transmit a range of wavelengths different from other filters of the plurality of filters.
6. The spectrometer of claim 5 , wherein the range of wavelengths of the plurality of filters is included in the second wavelength range of the secondary radiation emitter.
7. The spectrometer of claim 5 , wherein the plurality of filters comprises a plurality of interference filters, the plurality of interference filters are arranged with a plurality of lenses to determine spectra of each of a plurality of regions of the spectral detector.
8. The spectrometer of claim 5 , wherein transmission spectra of the plurality of filters in the filter array vary with angle of incidence.
9. The spectrometer of claim 1 , wherein the primary radiation emitter comprises one or more of a light emitting diode or a laser diode and wherein the secondary radiation emitter comprises one or more of a phosphor plate and a phosphor material.
10. The spectrometer of claim 1 , further comprising a thermal sensor configured to measuring a temperature of the sample.
11. The spectrometer of claim 1 , further comprising:
a lens array comprising a plurality of lenses, each lens of the lens array corresponding to a different region of the spectral detector.
12. The spectrometer of claim 11 , wherein the spectrometer comprises a handheld spectrometer and wherein the illuminator, the spectral detector and the filter array are arranged to be held with a hand of a user.
13. The spectrometer of claim 1 , wherein the spectral detector comprises a plurality of pixels and wherein the portion of the secondary radiation received at different pixels of the plurality of pixels corresponds to different wavelengths of the secondary radiation.
14. The spectrometer of claim 1 , wherein the one or more filters are configured to transmit a portion of the secondary radiation to the spectral detector, and wherein the spectral detector is configured to resolve wavelengths of the portion of the secondary radiation based on positions of incidence upon the spectral detector of the portion of the secondary radiation.
15. The spectrometer of claim 1 , wherein the spectral detector is configured to resolve wavelengths of the secondary radiation based on positions of incidence of the secondary radiation upon the spectral detector.